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Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Bogaerts, A.; Wilken, L.; Hoffmann, V.; Gijbels, R.; Wetzig, K. |
Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry |
2002 |
Spectrochimica acta: part B : atomic spectroscopy |
57 |
14 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W. |
Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge |
1999 |
Journal of applied physics |
86 |
18 |
UA library record; WoS full record; WoS citing articles |
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Cai, Z.L.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
Ab initio study of the X2\Sigma+ and A 2\Pi states of the SiN radical |
1996 |
Chemical physics letters |
252 |
28 |
UA library record; WoS full record; WoS citing articles |
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Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R. |
Comment on 'Integral cross sections for electron impact excitation of electronic states of N2' |
2002 |
Journal of physics: B : atomic and molecular physics |
35 |
2 |
UA library record; WoS full record; WoS citing articles |
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Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R.; Leys, C. |
Langmuir probe diagnostic of high pressure plasmas: study by PIC-MC modelling |
2004 |
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UA library record |
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Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R.; Leys, C. |
Particle-in-cell Monte Carlo modeling of Langmuir probes in an Ar plasma |
2005 |
Journal of applied physics |
97 |
18 |
UA library record; WoS full record; WoS citing articles |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
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UA library record; WoS full record; |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization |
2000 |
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UA library record; WoS full record; |
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Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. |
Unveiling the composition of sulphur sensitization specks by their interactions with TAI |
2000 |
Journal Of Imaging Science And Technology |
44 |
16 |
UA library record; WoS full record; WoS citing articles |
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Cidu, R.; Fanfani, L.; Shand, P.; Edmunds, W.M.; Van 't dack, L.; Gijbels, R. |
Gold mobility in waters from temperate regions |
1995 |
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UA library record |
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Cidu, R.; Fanfani, L.; Shand, P.; Edmunds, W.M.; Van 't dack, L.; Gijbels, R. |
Hydrogeochemical exploration for gold in the Osilo area, Sardinia, Italy |
1995 |
Applied geochemistry |
10 |
10 |
UA library record; WoS full record; WoS citing articles |
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Cidu, R.; Fanfani, L.; Shaud, P.; Edmunds, W.M.; Van 't dack, L.; Gijbels, R. |
Determination of gold at the ultratrace level in natural waters |
1994 |
Analytica chimica acta |
296 |
20 |
UA library record; WoS full record; WoS citing articles |
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Claereboudt, J.; Claeys, M.; Geise, H.; Gijbels, R.; Vertes, A. |
Laser microprobe mass spectrometry of quaternary phosphonium salts: direct versus matrix-assisted laser desorption |
1993 |
Journal of the American Society for Mass Spectrometry |
4 |
17 |
UA library record; WoS full record; WoS citing articles |
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Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
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de Bleecker, K.; Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Numerical investigation of particle formation mechanisms in silane discharges |
2004 |
Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics |
69 |
74 |
UA library record; WoS full record; WoS citing articles |
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de Bleecker, K.; Bogaerts, A.; Goedheer, W.; Gijbels, R. |
Investigation of growth mechanisms of clusters in a silane discharge with the use of a fluid model |
2004 |
IEEE transactions on plasma science |
32 |
29 |
UA library record; WoS full record; WoS citing articles |
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de Bleecker, K.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. |
Modelling of formation and transport of nanoparticles in silane discharges |
2004 |
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UA library record |
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de Bleecker, K.; Herrebout, D.; Bogaerts, A.; Gijbels, R.; Descamps, P. |
One-dimensional modelling of a capacitively coupled rf plasma in silane/helium, including small concentrations of O2 and N2 |
2003 |
Journal of physics: D: applied physics |
36 |
|
UA library record; WoS full record; WoS citing articles |
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de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. |
Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) |
2006 |
Applied surface science |
252 |
9 |
UA library record; WoS full record; WoS citing articles |
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de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
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de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
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UA library record |
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de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. |
XPS study of ion induced oxidation of silicon with and without oxygen flooding |
2000 |
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UA library record |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks |
2003 |
Applied surface science |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding |
2000 |
Surface and interface analysis |
29 |
4 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
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UA library record |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
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UA library record; WoS full record; |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces |
2000 |
Journal of the electrochemical society |
147 |
14 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon |
2001 |
Journal of applied physics |
89 |
16 |
UA library record; WoS full record; WoS citing articles |
|
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de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
1998 |
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UA library record |
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Depla, D.; Chen, Z.Y.; Bogaerts, A.; Ignatova, V.; de Gryse, R.; Gijbels, R. |
Modeling of the target surface modification by reactive ion implantation during magnetron sputtering |
2004 |
Journal of vacuum science and technology: A: vacuum surfaces and films |
22 |
13 |
UA library record; WoS full record; WoS citing articles |
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