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Casting light on the darkening of colors in historical paintings”. da Pieve F, Hogan C, Lamoen D, Verbeeck J, Vanmeert F, Radepont M, Cotte M, Janssens K, Gonze X, Van Tendeloo G, Physical review letters 111, 208302 (2013). http://doi.org/10.1103/PhysRevLett.111.208302
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Perovskite transparent conducting oxides : an ab initio study”. Dabaghmanesh S, Saniz R, Amini MN, Lamoen D, Partoens B, Journal of physics : condensed matter 25, 415503 (2013). http://doi.org/10.1088/0953-8984/25/41/415503
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Local oxygen-vacancy ordering and twinned octahedral tilting pattern in the Bi0.81Pb0.19FeO2.905 cubic perovskite”. Dachraoui W, Hadermann J, Abakumov AM, Tsirlin AA, Batuk D, Glazyrin K, McCammon C, Dubrovinsky L, Van Tendeloo G, Chemistry of materials 24, 1378 (2012). http://doi.org/10.1021/cm300178x
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Short-range layered A-site ordering in double perovskites NaLaBB'O6 (B = Mn, Fe, B' = Nb, Ta)”. Dachraoui W, Yang T, Liu C, Ling G, Hadermann J, Van Tendeloo G, Llobet A, Greenblatt M, Chemistry of materials 23, 2398 (2011). http://doi.org/10.1021/cm200226u
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Ab initio calculation of the energy-loss near-edge structure of some carbon allotropes: comparison with n-diamond”. Dadsetani M, Titantah JT, Lamoen D, Diamond and related materials 19, 73 (2010). http://doi.org/10.1016/j.diamond.2009.11.004
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Enhanced Pomegranate‐Structured SnO2Electrocatalysts for the Electrochemical CO2Reduction to Formate”. Daele KV, Arenas‐Esteban D, Choukroun D, Hoekx S, Rossen A, Daems N, Pant D, Bals S, Breugelmans T, ChemElectroChem (2023). http://doi.org/10.1002/celc.202201024
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Nickel-containing N-doped carbon as effective electrocatalysts for the reduction of CO2 to CO in a continuous-flow electrolyzer”. Daems N, De Mot B, Choukroun D, Van Daele K, Li C, Hubin A, Bals S, Hereijgers J, Breugelmans T, Sustainable energy &, fuels 4, 1296 (2019). http://doi.org/10.1039/C9SE00814D
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Pd-zeolites as heterogeneous catalysts in heck chemistry”. Dams M, Drijkoningen L, Pauwels B, Van Tendeloo G, de Vos DE, Jacobs PA, Journal of catalysis 209, 225 (2002). http://doi.org/10.1006/jcat.2002.3630
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Mixed valent iron oxides with the 0201-1201 intergrowth structure: (Pb1-xTlx)Sr4Fe2O9 (0≤x≤1)”. Daniel P, Barbey L, Groult D, Nguyen N, Van Tendeloo G, Raveau B, European journal of solid state and inorganic chemistry 31, 235 (1994)
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Influence of the morphology on the magneto-transport properties of laser-ablated ultrathin La0.7Ba0.3MnO3 films”. Das A, Gordon I, Wagner P, Cannaerts M, Moshchalkov VV, Bruynseraede Y, Schuddinck W, Van Tendeloo G, Borghs G, Journal of applied physics 90, 1429 (2001). http://doi.org/10.1063/1.1380217
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Direct observation of nanometer-scale pinning sites in (Nd0.33Eu0.20Gd0.47)Ba2Cu3O7-\delta single crystals”. Das P, Koblischka MR, Turner S, Van Tendeloo G, Wolf T, Jirsa M, Hartmann U, Europhysics letters 83, 37005 (2008). http://doi.org/10.1209/0295-5075/83/37005
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Reliable Characterization of Organic &, Pharmaceutical Compounds with High Resolution Monochromated EEL Spectroscopy”. Das PP, Guzzinati G, Coll C, Gomez Perez A, Nicolopoulos S, Estrade S, Peiro F, Verbeeck J, Zompra AA, Galanis AS, Polymers 12, 1434 (2020). http://doi.org/10.3390/polym12071434
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Low-field switching of noncollinear spin texture at La0.7Sr0.3MnO3-SrRuO3interfaces”. Das S, Rata AD, Maznichenko I V, Agrestini IS, Pippel E, Gauquelin N, Verbeeck J, Chen K, Valvidares SM, Vasili HB, Herrero-Martin J, Pellegrin E, Nenkov K, Herklotz A, Ernst A, Mertig I, Hu Z, Doerr K, Physical review B 99, 024416 (2019). http://doi.org/10.1103/PHYSREVB.99.024416
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de Backer A (2015) Quantitative atomic resolution electron microscopy using advanced statistical techniques. Antwerpen
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A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection”. De Backer A, Bals S, Van Aert S, Ultramicroscopy , 113702 (2023). http://doi.org/10.1016/j.ultramic.2023.113702
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Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?”.De Backer A, De Wael A, Gonnissen J, Martinez GT, Béché, A, MacArthur KE, Jones L, Nellist PD, Van Aert S, Journal of physics : conference series 644Electron Microscopy and Analysis Group Conference (EMAG), JUN 02-JUL 02, 2015, Manchester, ENGLAND, 012034 (2015). http://doi.org/10.1088/1742-6596/644/1/012034
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Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits?”.de Backer A, De wael A, Gonnissen J, Martinez GT, Béché, A, MacArthur KE, Jones L, Nellist PD, Van Aert S, Journal of physics : conference series 644, 012034 (2015). http://doi.org/10.1088/1742-6596/644/012034
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Optimal experimental design for nano-particle atom-counting from high-resolution STEM images”. de Backer A, De wael A, Gonnissen J, Van Aert S, Ultramicroscopy 151, 46 (2015). http://doi.org/10.1016/j.ultramic.2014.10.015
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Atom counting”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 91 (2021).
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Efficient fitting algorithm”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 73 (2021).
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General conclusions and future perspectives”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 243 (2021).
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Introduction”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 1 (2021).
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Optimal experiment design for nanoparticle atom counting from ADF STEM images”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 145 (2021).
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Statistical parameter estimation theory : principles and simulation studies”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 29 (2021).
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Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities”. De Backer A, Jones L, Lobato I, Altantzis T, Goris B, Nellist PD, Bals S, Van Aert S, Nanoscale 9, 8791 (2017). http://doi.org/10.1039/C7NR02656K
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Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting”. de Backer A, Martinez GT, MacArthur KE, Jones L, Béché, A, Nellist PD, Van Aert S, Ultramicroscopy 151, 56 (2015). http://doi.org/10.1016/j.ultramic.2014.11.028
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Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations”. de Backer A, Martinez GT, Rosenauer A, Van Aert S, Ultramicroscopy 134, 23 (2013). http://doi.org/10.1016/j.ultramic.2013.05.003
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Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm”. De Backer A, Van Aert S, Faes C, Arslan Irmak E, Nellist PD, Jones L, N P J Computational Materials 8, 216 (2022). http://doi.org/10.1038/s41524-022-00900-w
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High precision measurements of atom column positions using model-based exit wave reconstruction”. de Backer A, Van Aert S, van Dyck D, Ultramicroscopy 111, 1475 (2011). http://doi.org/10.1016/j.ultramic.2011.07.002
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StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images”. De Backer A, van den Bos KHW, Van den Broek W, Sijbers J, Van Aert S, Ultramicroscopy 171, 104 (2016). http://doi.org/10.1016/j.ultramic.2016.08.018
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