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  Author (down) Title Year Publication Volume Times cited Additional Links Links
De Keukeleere, K.; Cayado, P.; Meledin, A.; Vallès, F.; De Roo, J.; Rijckaert, H.; Pollefeyt, G.; Bruneel, E.; Palau, A.; Coll, M.; Ricart, S.; Van Tendeloo, G.; Puig, T.; Obradors, X.; Van Driessche, I. Superconducting YBa2Cu3O7-δNanocomposites Using Preformed ZrO2Nanocrystals: Growth Mechanisms and Vortex Pinning Properties 2016 Advanced Electronic Materials 2 26 UA library record; WoS full record; WoS citing articles url doi
de Hosson, J.T.M.; Van Tendeloo, G. Metals and alloys 1997 UA library record
de Hosson, J.T.M.; Van Tendeloo, G. Superconducting ceramics 1997 UA library record
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon 2003 Physica: B : condensed matter T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK 340 4 UA library record; WoS full record; WoS citing articles doi
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C. Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy 2004 Journal of the electrochemical society 151 13 UA library record; WoS full record; WoS citing articles pdf doi
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy 2002 UA library record; WoS full record;
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers 1999 Microelectronic engineering 45 UA library record; WoS full record doi
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon 1999 The review of scientific instruments 70 5 UA library record; WoS full record; WoS citing articles doi
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM 2001 Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308 3 UA library record; WoS full record; WoS citing articles pdf doi
de Fontaine, D.; Asta, M.; Ceder, G.; McCormack, R.; Van Tendeloo, G. On the asymmetric next-nearest-neighbor ising model of oxygen ordering in YBa2Cu3Oz 1992 Europhysics letters 19 33 UA library record; WoS full record; WoS citing articles pdf doi
De Dobbelaere, C.; Lourdes Calzada, M.; Bretos, I.; Jimenez, R.; Ricote, J.; Hadermann, J.; Hardy, A.; Van Bael, M.K. Gaining new insight into low-temperature aqueous photochemical solution deposited ferroelectric PbTiO3 films 2016 Materials chemistry and physics 174 4 UA library record; WoS full record; WoS citing articles doi
De Decker, J.; Folens, K.; De Clercq, J.; Meledina, M.; Van Tendeloo, G.; Du Laing, G.; Van Der Voort, P. Ship-in-a-bottle CMPO in MIL-101(Cr) for selective uranium recovery from aqueous streams through adsorption 2017 Journal of hazardous materials 335 35 UA library record; WoS full record; WoS citing articles pdf url doi
de Clippel, F.; Harkiolakis, A.; Vosch, T.; Ke, X.; Giebeler, L.; Oswald, S.; Houthoofd, K.; Jammaer, J.; Van Tendeloo, G.; Martens, J.A.; Jacobs, P.A.; Baron, G.V.; Sels, B.F.; Denayer, J.F.M. Graphitic nanocrystals inside the pores of mesoporous silica : synthesis, characterization and an adsorption study 2011 Microporous and mesoporous materials: zeolites, clays, carbons and related materials 144 15 UA library record; WoS full record; WoS citing articles pdf doi
de Clippel, F.; Harkiolakis, A.; Ke, X.; Vosch, T.; Van Tendeloo, G.; Baron, G.V.; Jacobs, P.A.; Denayer, J.F.M.; Sels, B.F. Molecular sieve properties of mesoporous silica with intraporous nanocarbon 2010 Chemical communications 46 21 UA library record; WoS full record; WoS citing articles pdf doi
De Beule, C.; Saniz, R.; Partoens, B. Crystalline topological states at a topological insulator junction 2019 The journal of physics and chemistry of solids 128 UA library record; WoS full record pdf doi
De Backer, A.; Zhang, Z.; van den Bos, K.H.W.; Bladt, E.; Sánchez‐Iglesias, A.; Liz‐Marzán, L.M.; Nellist, P.D.; Bals, S.; Van Aert, S. Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy 2022 Small methods 5 UA library record; WoS full record; WoS citing articles url doi
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images 2016 Ultramicroscopy 171 43 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images 2017 Journal of physics : conference series T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK 902 1 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Van Aert, S.; van Dyck, D. High precision measurements of atom column positions using model-based exit wave reconstruction 2011 Ultramicroscopy 111 8 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L. Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm 2022 N P J Computational Materials 8 UA library record; WoS full record; WoS citing articles url doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; Jones, L.; Lobato, I.; Altantzis, T.; Goris, B.; Nellist, P.D.; Bals, S.; Van Aert, S. Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities 2017 Nanoscale 9 33 UA library record; WoS full record; WoS citing articles url doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Atom counting 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Efficient fitting algorithm 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. General conclusions and future perspectives 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Introduction 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Optimal experiment design for nanoparticle atom counting from ADF STEM images 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Statistical parameter estimation theory : principles and simulation studies 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. Optimal experimental design for nano-particle atom-counting from high-resolution STEM images 2015 Ultramicroscopy 151 24 UA library record; WoS full record; WoS citing articles pdf url doi
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