NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Volume	Times cited	Additional Links
Shpanchenko, R.V.; Nistor, L.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.	Structural studies on new ternary oxides Ba₈Ta₄Ti₃O₂₄ and Ba₁₀Ta_7.04Ti_1.2O₃₀	1995	Journal of solid state chemistry	114	23	UA library record; WoS full record; WoS citing articles
Simoen, E.; Loo, R.; Claeys, C.; de Gryse, O.; Clauws, P.; van Landuyt, J.; Lebedev, O.	Optical spectroscopy of oxygen precipitates in heavily doped p-type silicon	2002	Journal of physics : condensed matter T2 – Conference on Extended Defects in Semiconductors (EDS 2002), JUN 01-06, 2002, BOLOGNA, ITALY	14	3	UA library record; WoS full record; WoS citing articles
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K.	Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation	2001	Institute of physics conference series			UA library record; WoS full record;
Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G.	Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures	2001	Journal of the electrochemical society	148	13	UA library record; WoS full record; WoS citing articles
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G.	Morphology and defects in shallow trench isolation structures	1999	Conference series of the Institute of Physics	164	1	UA library record; WoS full record; WoS citing articles
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G.	The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures	2001	Materials science in semiconductor processing	4	6	UA library record; WoS full record; WoS citing articles
Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P.	Stress analysis with convergent beam electron diffraction around NMOS transistors	2001				UA library record; WoS full record;
Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O.	Defect characterization in high temperature implanted 6H-SiC using TEM	1997	Nuclear instruments and methods in physics research: B	127/128	17	UA library record; WoS full record; WoS citing articles
Takeda, M.; Shinohara, G.; Yamada, H.; Yoshida, S.; van Landuyt, J.; Hashimoto, H.	Precipitation behavior in Cu-Co alloy	1998				UA library record
Takeda, M.; Suzuki, N.; Shinohara, G.; Endo, T.; van Landuyt, J.	TEM study on precipitation behavior in Cu-Co alloys	1998	Physica status solidi: A: applied research	168	18	UA library record; WoS full record; WoS citing articles
Teodorescu, V.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J.	In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines	2001	Journal of applied physics	90	97	UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Mihailescu, I.N.; Dinescu, M.; Chitica, N.; Nistor, L.C.; van Landuyt, J.; Barborica, A.	Laser induced phase transition in iron thin films	1994	Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation	4	2	UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Mihailescu, I.N.; Gyorgy, E.; Luches, A.; Martino, M.; Nistor, L.C.; van Landuyt, J.; Hermann, J.	The study of a crater forming on the surface of a Ti target submitted to multipulse excimer laser irradiation under low pressure N₂	1996	Journal of modern optics	43	11	UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J.	High resolution TEM observation of in situ colloid formation in CaF₂ crystals	1997	Materials science forum	239-241	3	UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J.; Dinescu, M.	TEM study of laser induced phase transition in iron thin films	1994	Materials research bulletin	29	2	UA library record; WoS full record; WoS citing articles
Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J.	Reliability of copper dual damascene influenced by pre-clean	2002	Analysis Of Integrated Circuits		5	UA library record; WoS full record; WoS citing articles
Udoh, K.-I.; El- Araby, A.M.; Tanaka, Y.; Hisatsune, K.; Yasuda, K.; Van Tendeloo, G.; van Landuyt, J.	Structural aspects of AuCu I or AuCu II and a cuboidal black configuration of f.c.c. disordered phase in AuCu-Pt and AuCu-Ag pseudobinary alloys	1995	Materials science and engineering: part A: structural materials: properties, microstructure and processing	203	15	UA library record; WoS full record; WoS citing articles
van Landuyt, J.	High resolution electron microscopy for materials	1992			7	UA library record; WoS full record; WoS citing articles
van Landuyt, J.	Een tempel voor elektronenmicroscopie “kijken naar atomen”	1998	Fonds informatief	38		UA library record
van Landuyt, J.	The evolution of HVEM application in antwerp	1991	Ultramicroscopy T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan	39		UA library record; WoS full record
van Landuyt, J.; Kuypers, S.; van Heurck, C.; Van Tendeloo, G.; Amelinckx, S.	Methods of structural analysis of modulated structures and quasicrystals	1993				UA library record
van Landuyt, J.; van Bockstael, M.H.G.; van Royen, J.	Microscopy of gemmological materials	1997			4	UA library record; WoS full record; WoS citing articles
van Landuyt, J.; Van Tendeloo, G.	Charcaterization by high-resolution transmission electron microscopy	1998				UA library record; WoS full record;
van Landuyt, J.; Van Tendeloo, G.	HREM for characterisation of nanoscale microstructures	1998				UA library record
van Landuyt, J.; Van Tendeloo, G.; Amelinckx, S.; Zhang, X.F.; Zhang, X.B.; Luyten, W.	Crystallography of fullerites and related graphene textures	1994	Materials science forum	150/151		UA library record; WoS full record;
van Landuyt, J.; Vanhellemont, J.	High-resolution electron microscopy for semiconducting materials science	1994				UA library record
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C.	Influence of twinning on the morphology of AgBr and AgCl microcrystals	2001	The journal of imaging science and technology	45		UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R.	Defects and growth mechanisms of AgCl(100) tabular crystals	1998	Journal of crystal growth	187	8	UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R.	Defects in AgCl and AgBr(100) tabular crystals studied by TEM	1998				UA library record
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C.	The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals	2000				UA library record; WoS full record;