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Author	Title	Year	Publication	Volume	Times cited	Additional Links
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Statistical parameter estimation theory : principles and simulation studies	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Optimal experiment design for nanoparticle atom counting from ADF STEM images	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Introduction	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S.	Image-quality evaluation and model selection with maximum a posteriori probability	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	General conclusions and future perspectives	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Efficient fitting algorithm	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Atom counting	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S.	Atom column detection	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
Fatermans, J.; Van Aert, S.; den Dekker, A.J.	The maximum a posteriori probability rule for atom column detection from HAADF STEM images	2019	Ultramicroscopy	201	1	UA library record; WoS full record; WoS citing articles
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S.	Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question	2016	Ultramicroscopy	174	2	UA library record; WoS full record; WoS citing articles
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S.	Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design	2016	Ultramicroscopy	170	6	UA library record; WoS full record; WoS citing articles
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G.	Advanced electron crystallography through model-based imaging	2016	IUCrJ	3	30	UA library record; WoS full record; WoS citing articles
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S.	Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images	2014	Applied physics letters	105	12	UA library record; WoS full record; WoS citing articles
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S.	Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits?	2013	Ultramicroscopy	134	31	UA library record; WoS full record; WoS citing articles
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G.	The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data	2008				UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.	The notion of resolution	2008				UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.	The notion of resolution	2007				UA library record
Van Aert, S.; van Dyck, D.; den Dekker, A.J.	Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative	2006	Optics express	14	45	UA library record; WoS full record; WoS citing articles
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D.	Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework	2005	Ultramicroscopy	104	70	UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H.	Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example	2005	Ultramicroscopy	104	37	UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.	Statistical experimental design for quantitative atomic resolution transmission electron microscopy	2004			13	UA library record; WoS full record; WoS citing articles
van Dyck, D.; Van Aert, S.; den Dekker, A.J.	Physical limits on atomic resolution	2004	Microscopy and microanalysis	10	14	UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van Dyck, D.	How to optimize the experimental design of quantitative atomic resolution TEM experiments?	2004	Micron	35	14	UA library record; WoS full record; WoS citing articles
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A.	Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?	2003	Ultramicroscopy	98	26	UA library record; WoS full record; WoS citing articles
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J.	Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis	2003	Institute of physics conference series			UA library record; WoS full record;
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.	High-resolution electron microscopy : from imaging toward measuring	2002	IEEE transactions on instrumentation and measurement	51	13	UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.	High-resolution electron microscopy and electron tomography: resolution versus precision	2002	Journal of structural biology	138	33	UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.	Optimal experimental design of STEM measurement of atom column positions	2002	Ultramicroscopy	90	35	UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D.	High resolution electron microscopy from imaging towards measuring	2001	... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3			UA library record
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P.	Does a monochromator improve the precision in quantitative HRTEM?	2001	Ultramicroscopy	89	22	UA library record; WoS full record; WoS citing articles