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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Atom column detection 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Image-quality evaluation and model selection with maximum a posteriori probability 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Atom counting 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Efficient fitting algorithm 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. General conclusions and future perspectives 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Introduction 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Optimal experiment design for nanoparticle atom counting from ADF STEM images 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Statistical parameter estimation theory : principles and simulation studies 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record pdf doi
Fatermans, J.; Van Aert, S.; den Dekker, A.J. The maximum a posteriori probability rule for atom column detection from HAADF STEM images 2019 Ultramicroscopy 201 1 UA library record; WoS full record; WoS citing articles url doi
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question 2016 Ultramicroscopy 174 2 UA library record; WoS full record; WoS citing articles url doi
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design 2016 Ultramicroscopy 170 6 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles pdf url doi
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images 2014 Applied physics letters 105 12 UA library record; WoS full record; WoS citing articles pdf url doi
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? 2013 Ultramicroscopy 134 31 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2008 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2007 UA library record
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles url doi
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. Statistical experimental design for quantitative atomic resolution transmission electron microscopy 2004 13 UA library record; WoS full record; WoS citing articles doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D. How to optimize the experimental design of quantitative atomic resolution TEM experiments? 2004 Micron 35 14 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis 2003 Institute of physics conference series UA library record; WoS full record;
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
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