| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Pourbabak, S.; Orekhov, A.; Schryvers, D. |
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires |
2020 |
Microscopy Research And Technique |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Bertoni, G.; Verbeeck, J.; Brosens, F. |
Fitting the momentum dependent loss function in EELS |
2011 |
Microscopy research and technique |
74 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zelaya, E.; Schryvers, D. |
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite |
2011 |
Microscopy research and technique |
74 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S. |
Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
Microscopy research and technique |
42 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J. |
Transmission electron microscopy studies of (111) twinned silver halide microcrystals |
1998 |
Microscopy research and technique |
42 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Babu, T.G.N.; Greaves, C.; Hervieu, M.; Michel, C.; Raveau, B. |
Structural investigations of recently discovered high Tc superconductors |
1995 |
Microscopy research and technique |
30 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. |
Internal calibration technique for HREM studies of nanoscale particles |
1993 |
Microscopy research and technique
T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM |
25 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. |
The study of partially ordered 11/20 alloys by HREM |
1993 |
Microscopy research and technique |
25 |
|
UA library record; WoS full record |
|
