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  Author Title Year Publication Volume Times cited Additional Links Links (down)
Schattschneider, P.; Löffler, S.; Stöger-Pollach, M.; Verbeeck, J. Is magnetic chiral dichroism feasible with electron vortices? 2014 Ultramicroscopy 136 64 UA library record; WoS full record; WoS citing articles pdf url doi
Heidari, H.; van den Broek, W.; Bals, S. Quantitative electron tomography : the effect of the three-dimensional point spread function 2013 Ultramicroscopy 135 6 UA library record; WoS full record; WoS citing articles pdf url doi
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record pdf url doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Goris, B.; Roelandts, T.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. Advanced reconstruction algorithms for electron tomography : from comparison to combination 2013 Ultramicroscopy 127 63 UA library record; WoS full record; WoS citing articles pdf url doi
Schattschneider, P.; Verbeeck, J. Theory of free electron vortices 2011 Ultramicroscopy 111 57 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Van Aert, S.; van Dyck, D. High precision measurements of atom column positions using model-based exit wave reconstruction 2011 Ultramicroscopy 111 8 UA library record; WoS full record; WoS citing articles pdf url doi
Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. An alternative approach for \zeta-factor measurement using pure element nanoparticles 2016 Ultramicroscopy 164 19 UA library record; WoS full record; WoS citing articles pdf url doi
Stefan Löffler; Matthieu Bugnet; Nicolas Gauquelin; Sorin Lazar; Elias Assmann; Karsten Held; Gianluigi A. Botton; Peter Schattschneider Real-space mapping of electronic orbitals 2017 Ultramicroscopy 177 UA library record pdf doi
Lobato, I.; Van Aert, S.; Verbeeck, J. Progress and new advances in simulating electron microscopy datasets using MULTEM 2016 Ultramicroscopy 168 43 UA library record; WoS full record; WoS citing articles pdf doi
Kirilenko, D.A.; Brunkov, P.N. Measuring the height-to-height correlation function of corrugation in suspended graphene 2016 Ultramicroscopy 165 3 pdf doi
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Lubk, A.; Javon, E.; Cherkashin, N.; Reboh, S.; Gatel, C.; Hytch, M. Dynamic scattering theory for dark-field electron holography of 3D strain fields 2014 Ultramicroscopy 136 18 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? 2013 Ultramicroscopy 134 31 UA library record; WoS full record; WoS citing articles pdf doi
Lichtert, S.; Verbeeck, J. Statistical consequences of applying a PCA noise filter on EELS spectrum images 2013 Ultramicroscopy 125 54 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Béché, A.; van den Broek, W. A holographic method to measure the source size broadening in STEM 2012 Ultramicroscopy 120 29 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Schattschneider, P.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Hell, J.; Verbeeck, J. Sub-nanometer free electrons with topological charge 2012 Ultramicroscopy 115 24 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Tian, H.; Béché, A. A new way of producing electron vortex probes for STEM 2012 Ultramicroscopy 113 62 UA library record; WoS full record; WoS citing articles pdf doi
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
Gorji, S.; Kashiwar, A.; Mantha, L.S.; Kruk, R.; Witte, R.; Marek, P.; Hahn, H.; Kübel, C.; Scherer, T. Nanowire facilitated transfer of sensitive TEM samples in a FIB 2020 Ultramicroscopy 219 UA library record doi
Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. Scanning transmission electron microscopy under controlled low-pressure atmospheres 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles pdf doi
Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. Efficient first principles simulation of electron scattering factors for transmission electron microscopy 2019 Ultramicroscopy 197 3 UA library record; WoS full record; WoS citing articles doi
Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. High dose efficiency atomic resolution imaging via electron ptychography 2019 Ultramicroscopy 196 1 UA library record; WoS full record; WoS citing articles doi
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation 2018 Ultramicroscopy 184 7 UA library record; WoS full record; WoS citing articles pdf doi
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. Bandgap measurement of high refractive index materials by off-axis EELS 2017 Ultramicroscopy 182 3 UA library record; WoS full record; WoS citing articles pdf doi
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