|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Denoyer, E.; Van Grieken, R.; Adams, F.; Ntausch, D.F.S. |
Laser microprobe mass spectrometry : 1 : basic principles and performance characteristics |
1982 |
Analytical chemistry |
54 |
|
UA library record |
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1990 |
Analytical chemistry |
62 |
|
UA library record |
|
|
Wouters, L.C.; Van Grieken, R.E.; Linton, R.W.; Bauer, C.F. |
Discrimination between coprecipitated and adsorbed lead on individual calcite particles using laser microprobe mass analysis |
1988 |
Analytical chemistry |
60 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1988 |
Analytical chemistry |
60 |
|
UA library record |
|
|
Van Dyck, P.M.; Török, S.B.; Van Grieken, R.E. |
Enhancement effect in X-ray fluorescence analysis of environmental samples of medium thickness |
1986 |
Analytical chemistry |
58 |
|
UA library record; WoS full record; WoS citing articles |
|
|
de Gendt, S.; Van Grieken, R.E.; Ohorodnik, S.K.; Harrison, W.W. |
Parameter evaluation for the analysis of oxide-based samples with radio ferquency glow discharge mass spectrometry |
1995 |
Analytical chemistry |
67 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Vertes, A.; Irinyi, G.; Gijbels, R. |
Hydrodynamic model of matrix-assisted laser desorption mass spectrometry |
1993 |
Analytical chemistry |
65 |
100 |
UA library record; WoS full record; WoS citing articles |
|
|
van Straaten, M.; Gijbels, R.; Vertes, A. |
Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell |
1992 |
Analytical chemistry |
64 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. |
X-ray spectrometry |
2000 |
Analytical chemistry |
72 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. |
Novel thin film lift-off process for in situ TEM tensile characterization |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. |
The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements |
2015 |
Microscopy and microanalysis |
21 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Grieten, E.; Caen, J.; Schryvers, D. |
Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. |
Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy |
2014 |
Microscopy and microanalysis |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. |
Annular dark-field transmission electron microscopy for low contrast materials |
2013 |
Microscopy and microanalysis |
19 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. |
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study |
2011 |
Microscopy and microanalysis |
17 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
van der Linden, V.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Balace, S.; Vekemans, B.; Vincze, L.; Janssens, K. |
PXRF, \mu-XRF, vacuum \mu-XRF, and EPMA analysis of Email Champlevé objects present in Belgian museums |
2011 |
Microscopy and microanalysis |
17 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts |
2010 |
Microscopy and microanalysis |
16 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. |
EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure |
2009 |
Microscopy and microanalysis |
15 |
55 |
UA library record; WoS full record; WoS citing articles |
|
|
Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. |
Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation |
2007 |
Microscopy and microanalysis |
13 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
|
|
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. |
EELS investigations of different niobium oxide phases |
2006 |
Microscopy and microanalysis |
12 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
Bals, S.; Radmilovic, V.; Kisielowski, C. |
TEM annular objective apertures fabricated by FIB |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
|
|
van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Janssens de Bisthoven, L.; Rochette, A.-J.; Verheyen, E.; Akpona, T.J.-D.; Verbist, B.; Vanderhaegen, K.; Naturinda, Z.; Van Passel, S.; Berihun, D.; Munishi, L.; Hugé, J. |
Conserving African biosphere reserves : a workshop on the valuation of ecosystem services in Man and the Biosphere Reserves |
2019 |
Oryx |
53 |
|
UA library record |
|
|
Savchenko, D.V.; Serdan, A.A.; Morozov, V.A.; Van Tendeloo, G.; Ionov, S.G. |
Improvement of the oxidation stability and the mechanical properties of flexible graphite foil by boron oxide impregnation |
2012 |
New carbon materials |
27 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Afanasov, I.M.; Lebedev, O.I.; Kolozhvary, B.A.; Smirnov, A.V.,; Van Tendeloo, G. |
Nickel/carbon composite materials based on expanded graphite |
2011 |
New carbon materials |
26 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Afanasov, I.M.; Van Tendeloo, G.; Mateev, A.T. |
Production and structure of exfoliated graphite/coke composites modified by ZrO2 nanoparticles |
2010 |
New carbon materials |
25 |
|
UA library record; WoS full record; WoS citing articles |
|