toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume Times cited Additional Links Links (up)
Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W. Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge 1999 Journal of applied physics 86 18 UA library record; WoS full record; WoS citing articles doi
Pokatilov, E.P.; Fomin, V.M.; Balaban, S.N.; Gladilin, V.N.; Klimin, S.N.; Devreese, J.T.; Magnus, W.; Schoenmaker, W.; Collaert, N.; van Rossum, M.; de Meyer, K. Distribution of fields and charge carriers in cylindrical nanosize silicon-based metal-oxide-semiconductor structures 1999 Journal Of Applied Physics 85 16 UA library record; WoS full record; WoS citing articles doi
Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schäffer, C. High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs 1999 Journal of applied physics 85 6 UA library record; WoS full record; WoS citing articles doi
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles pdf doi
Baelus, B.J.; Peeters, F.M. Hall potentiometer in the ballistic regime 1999 Applied physics letters 74 13 UA library record; WoS full record; WoS citing articles doi
Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Tafuri, F.; Granozio, F.M.; Di Chiara, A.; Bender, H. A potential method to correlate electrical properties and microstructure of a unique high-Tc superconducting Josephson junction 1999 Applied physics letters 74 5 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon 1999 The review of scientific instruments 70 5 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Sato, T.; Wagatsuma, K.; Claes, M.; Van Grieken, R. Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation 1999 The review of scientific instruments 70 UA library record; WoS full record; WoS citing articles doi
Leroux, C.; Badeche, T.; Nihoul, G.; Richard, O.; Van Tendeloo, G. A homologous series Pb2n+1Nb2n-1O7n-1 studied by electron microscopy 1999 European physical journal: applied physics 7 4 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Nullens, R.; Wagatsuma, K.; Van Grieken, R.E. Elemental x-ray images obtained by grazing-exit electron probe microanalysis (GE-EPMA) 1999 Journal of analytical atomic spectrometry 14 UA library record; WoS full record; WoS citing articles doi
Colomer, J.-F.; Bister, G.; Willems, I.; Konya, Z.; Fonseca, A.; Van Tendeloo, G.; Nagy, J.B. Synthesis of single wall carbon nanotubes by catalytic decomposition of hydrocarbons 1999 Chemical communications 110 UA library record; WoS full record; WoS citing articles pdf doi
Ahenach, J.; Cool, P.; Vansant, E.F.; Lebedev, O.; van Landuyt, J. Influence of water on the pillaring of montmorillonite with aminopropyltriethoxysilane 1999 Physical chemistry, chemical physics 1 10 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A. The glow discharge: an exciting plasma 1999 Journal of analytical atomic spectrometry 14 29 UA library record; WoS full record; WoS citing articles doi
Deraedt, I.; Janssens, K.; Veeckman, J. Compositional distinctions between 16th century “Façon-de-Venise” and Venetian glass vessels, excavated in Antwerp, Belgium 1999 Journal of analytical atomic spectroscopy 14 UA library record; WoS full record; WoS citing articles doi
Vincze, L.; Vekemans, B.; Janssens, K.; Adams, F. Modeling of photon scattering at high X-ray energies : experiment versus simulation 1999 Journal of analytical atomic spectrometry T2 – 15th International Congress on X-Ray Optics and Microanalysis (ICXOM), AUG 24-27, 1998, ANTWERP, BELGIUM 14 UA library record; WoS full record; WoS citing articles pdf doi
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. Characterization of AgxAuy nano particles by TEM and STEM 1999 Journal of analytical atomic spectrometry 14 2 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) 1999 Journal of analytical atomic spectrometry 14 10 UA library record; WoS full record; WoS citing articles doi
Kuczumov, A.; Vekemans, B.; Schalm, O.; Dorriné, W.; Chevallier, P.; Dillmann, P.; Ro, C.-U.; Janssens, K.; Van Grieken, R. Analyses of petrified wood by electron, X-ray and optical microprobes 1999 Journal of analytical atomic spectroscopy 14 UA library record; WoS full record; WoS citing articles doi
Vannier, R.-N.; Théry, O.; Kinowski, C.; Huvé, M.; Van Tendeloo, G.; Suard, E.; Abraham, F. Zr substituted bismuth uranate 1999 Journal of materials chemistry 9 4 UA library record; WoS full record; WoS citing articles pdf doi
Fröba, M.; Köhn, R.; Bouffaud, G.; Richard, O.; Van Tendeloo, G. _Fe2O3 nanoparticles with mesoporous MCM-48 silica: in situ formation and characterisation 1999 Chemistry of materials 11 202 UA library record; WoS full record; WoS citing articles pdf doi
Tsuji, K.; Spolnik, Z.; Wagatsuma, K.; Van Grieken, R.E.; Vis, R.D. Grazing-exit particle-induced X-ray emission analysis with extremely low background 1999 Analytical chemistry 71 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Wagatsuma, K.; Nullens, R.; Van Grieken, R.E. Grazing exit electron probe microanalysis for surface and particle analysis 1999 Analytical chemistry 71 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Osán, J.; Van Grieken, R. Determination of low-Z elements in individual environmental particles using windowless EPMA 1999 Analytical chemistry 71 UA library record; WoS full record; WoS citing articles doi
Bernard, P.; Eisma, D.; Van Grieken, R. Electron microprobe analysis of suspended matter in the Angola Basin 1999 Journal of sea research 41 UA library record; WoS full record; WoS citing articles doi
Dekov, V.M.; van Put, A.; Eisma, D.; Van Grieken, R. Single particle analysis of suspended matter in the Makasar Strait and Flores Sea with particular reference to tin-bearing particles 1999 Journal of sea research 41 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals 1999 Journal of the American Society for Mass Spectrometry 10 4 UA library record; WoS full record; WoS citing articles doi
Nistor, L.; Nistor, S.V.; Dincã, G.; van Landuyt, J.; Schoemaker, D.; Copaciu, V.; Georgeoni, P.; Arnici, N. High resolution electron microscopy and electron spin resonance studies on cubic boron nitride crystals made by high-pressure/high-temperature synthesis 1999 Diamonds an related materials 8 7 UA library record; WoS full record; WoS citing articles doi
Monot, I.; Tancret, F.; Laffez, P.; Van Tendeloo, G.; Desgardin, G. Microstructure and properties of oxygen controlled melt textured NdBaCuO superconductive ceramics 1999 Technology 65 5 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Holland-Moritz, D. Martensitic transformations and microstructures in splat-cooled Ni-Al 1999 Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275 6 UA library record; WoS full record; WoS citing articles doi
Farvacque, J.L.; Bougrioua, Z.; Moerman, I.; Van Tendeloo, G.; Lebedev, O. Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE 1999 Physica: B : condensed matter T2 – 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA 273-4 5 UA library record; WoS full record; WoS citing articles pdf doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: