Author |
Title |
Year |
Publication |
Volume |
Times cited ![sorted by Times cited field, descending order (down)](img/sort_desc.gif) |
Additional Links |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
A method to determine the local surface profile from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
3 |
UA library record; WoS full record; WoS citing articles |
Kirilenko, D.A.; Brunkov, P.N. |
Measuring the height-to-height correlation function of corrugation in suspended graphene |
2016 |
Ultramicroscopy |
165 |
3 |
|
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. |
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? |
2017 |
Ultramicroscopy |
181 |
3 |
UA library record; WoS full record; WoS citing articles |
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. |
Efficient first principles simulation of electron scattering factors for transmission electron microscopy |
2019 |
Ultramicroscopy |
197 |
3 |
UA library record; WoS full record; WoS citing articles |
Koo, J.; Dahl, A.B.; Bærentzen, J.A.; Chen, Q.; Bals, S.; Dahl, V.A. |
Shape from projections via differentiable forward projector for computed tomography |
2021 |
Ultramicroscopy |
224 |
3 |
UA library record; WoS full record; WoS citing articles |
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. |
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 |
1994 |
Ultramicroscopy |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |
Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Applying an information transmission approach to extract valence electron information from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
1 |
UA library record; WoS full record; WoS citing articles |
Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. |
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays |
2013 |
Ultramicroscopy |
134 |
1 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Verbeeck, J.; Schryvers, D.; de Backer, S.; Scheunders, P. |
Tomographic spectroscopic imaging; an experimental proof of concept |
2009 |
Ultramicroscopy |
109 |
1 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. |
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations |
2017 |
Ultramicroscopy |
176 |
1 |
UA library record; WoS full record; WoS citing articles |
Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. |
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence |
2018 |
Ultramicroscopy |
190 |
1 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; Van Aert, S.; den Dekker, A.J. |
The maximum a posteriori probability rule for atom column detection from HAADF STEM images |
2019 |
Ultramicroscopy |
201 |
1 |
UA library record; WoS full record; WoS citing articles |
Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. |
High dose efficiency atomic resolution imaging via electron ptychography |
2019 |
Ultramicroscopy |
196 |
1 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. |
An alternative approach to determine attainable resolution directly from HREM images |
2013 |
Ultramicroscopy |
133 |
|
UA library record; WoS full record |
van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
Stefan Löffler; Matthieu Bugnet; Nicolas Gauquelin; Sorin Lazar; Elias Assmann; Karsten Held; Gianluigi A. Botton; Peter Schattschneider |
Real-space mapping of electronic orbitals |
2017 |
Ultramicroscopy |
177 |
|
UA library record |
Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. |
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement |
2018 |
Ultramicroscopy |
184 |
|
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Van Aert, S. |
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations |
2020 |
Ultramicroscopy |
219 |
|
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. |
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt |
2021 |
Ultramicroscopy |
|
|
UA library record; WoS full record; WoS citing articles |
Hofer, C.; Pennycook, T.J. |
Reliable phase quantification in focused probe electron ptychography of thin materials |
2023 |
Ultramicroscopy |
254 |
|
UA library record; WoS full record; WoS citing articles |
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. |
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution |
2022 |
Ultramicroscopy |
233 |
|
UA library record; WoS full record; WoS citing articles |
Hofer, C.; Gao, C.; Chennit, T.; Yuan, B.; Pennycook, T.J. |
Phase offset method of ptychographic contrast reversal correction |
2024 |
Ultramicroscopy |
|
|
UA library record; WoS full record |
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. |
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors |
2022 |
Ultramicroscopy |
242 |
|
UA library record; WoS full record; WoS citing articles |
Lobato, I.; De Backer, A.; Van Aert, S. |
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network |
2023 |
Ultramicroscopy |
251 |
|
UA library record; WoS full record |
Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. |
Atom counting from a combination of two ADF STEM images |
2024 |
Ultramicroscopy |
255 |
|
UA library record; WoS full record; WoS citing articles |
Van den Broek, W.; Jannis, D.; Verbeeck, J. |
Convexity constraints on linear background models for electron energy-loss spectra |
2023 |
Ultramicroscopy |
254 |
|
UA library record |