NANOlab Center of Excellence literature database -- Query Results

	NANOlab Center of Excellence literature database Home \| Show All \| Simple Search \| Advanced Search	Login Quick Search: Field: contains: ...
	1–30 of 188 records found matching your query (RSS \| history):

Select All Deselect All

<< 1 2 3 4 5 6 7 >>

List View

Citations

Details

Author	Title	Year	Publication	Volume	Additional Links
Lichte, H.; Dunin-Borkowski, R.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G.	65th birthdays of W. Owen Saxton, David J. Smith and Dirk Van Dyck / PICO 2013 From multislice to big bang	2013			UA library record
Van Aert, S.; Batenburg, J.; Van Tendeloo, S.	Atomen tellen	2011	Nederlands tijdschrift voor natuurkunde (1991)	77	UA library record
Schryvers, D.; Van Aert, S.	High-resolution visualization techniques : structural aspects	2012			UA library record
Van Aert, S.	Meer zien met onzichtbaar licht	2007	Karakter : tijdschrift van wetenschap	18	UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.	The notion of resolution	2008			UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.	The notion of resolution	2007			UA library record
van Dyck, D.; Van Aert, S.; Croitoru, M.D.	Obstacles on the road towards atomic resolution tomography	2005	Microscoy and microanalysis	11	UA library record
Van Aert, S.	Statistical parameter estimation theory : a tool for quantitative electron microscopy	2012			UA library record
Batenburg, J.; Van Aert, S.	Three-dimensional reconstruction of a nanoparticle at atomic resolution	2011	ERCIM news	86	UA library record
Liao, Z.L.; Green, R.J.; Gauquelin, N.; Gonnissen, J.; Van Aert, S.; Verbeeck, J.; et al.	Engineering properties by long range symmetry propagation initiated at perovskite heterostructure interface	2016	Advanced functional materials		UA library record
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D.	Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM	2014	Microscopy and microanalysis	20	UA library record
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D.	High resolution electron microscopy from imaging towards measuring	2001	... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3		UA library record
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S.	Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits?	2015	Journal of physics : conference series	644	UA library record
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G.	The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data	2008			UA library record
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S.	Investigating lattice strain in Au nanodecahedrons	2016			UA library record
Hao, Y.; Velpula, G.; Kaltenegger, M.; Bodlos, W.R.; Vibert, F.; Mali, K.S.; De Feyter, S.; Resel, R.; Geerts, Y.H.; Van Aert, S.; Beljonne, D.; Lazzaroni, R.	From 2D to 3D : bridging self-assembled monolayers to a substrate-induced polymorph in a molecular semiconductor	2022	Chemistry of materials	34	UA library record; WoS full record; WoS citing articles
Friedrich, T.; Yu, C.-P.; Verbeek, J.; Pennycook, T.; Van Aert, S.	Phase retrieval from 4-dimensional electron diffraction datasets	2021	Proceedings T2 – IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network		UA library record; WoS full record; WoS citing articles
Zhang, Z.; Lobato, I.; Brown, H.; Jannis, D.; Verbeeck, J.; Van Aert, S.; Nellist, P.	Generalised oscillator strength for core-shell electron excitation by fast electrons based on Dirac solutions	2023			UA library record
Grünewald, L.; Chezganov, D.; De Meyer, R.; Orekhov, A.; Van Aert, S.; Bogaerts, A.; Bals, S.; Verbeeck, J.	Supplementary Information for “In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope”	2023			UA library record
Cioni, M.; Delle Piane, M.; Polino, D.; Rapetti, D.; Crippa, M.; Arslan Irmak, E.; Pavan, G.M.; Van Aert, S.; Bals, S.	Data for Sampling Real‐Time Atomic Dynamics in Metal Nanoparticles by Combining Experiments, Simulations, and Machine Learning	2024			UA library record
Cioni, M.; Delle Piane, M.; Polino, D.; Rapetti, D.; Crippa, M.; Arslan Irmak, E.; Van Aert, S.; Bals, S.; Pavan, G.M.	Sampling real-time atomic dynamics in metal nanoparticles by combining experiments, simulations, and machine learning	2024	Advanced Science		UA library record; WoS full record
Arisnabarreta, N.; Hao, Y.; Jin, E.; Salame, A.; Muellen, K.; Robert, M.; Lazzaroni, R.; Van Aert, S.; Mali, K.S.; De Feyter, S.	Single-layered imine-linked porphyrin-based two-dimensional covalent organic frameworks targeting CO₂ reduction	2024	Advanced energy materials		UA library record; WoS full record
Ni, S.; Houwman, E.; Gauquelin, N.; Chezganov, D.; Van Aert, S.; Verbeeck, J.; Rijnders, G.; Koster, G.	Stabilizing perovskite Pb(Mg_0.33Nb_0.67)O₃-PbTiO₃ thin films by fast deposition and tensile mismatched growth template	2024	ACS applied materials and interfaces	16	UA library record; WoS full record
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D.	An alternative approach to determine attainable resolution directly from HREM images	2013	Ultramicroscopy	133	UA library record; WoS full record
Van Aert, S.	Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld	2011	Chemie magazine	7	UA library record
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A.	Computational aspects in quantitative EELS	2010	Microscopy and microanalysis	16	UA library record
Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H.	Dedicated TEM on domain boundaries from phase transformations and crystal growth	2013	Phase transitions	86	UA library record; WoS full record; WoS citing articles
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J.	Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis	2003	Institute of physics conference series		UA library record; WoS full record;
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D.	Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction	2005	Microscopy and microanalysis	11	UA library record
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.	Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy	2007	Microscopy and microanalysis	13	UA library record