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Plasma-based dry reforming of methane in a dielectric barrier discharge reactor: Importance of uniform (sub)micron packings/catalysts to enhance the performance”. Wang J, Zhang K, Mertens M, Bogaerts A, Meynen V, APPLIED CATALYSIS B-ENVIRONMENTAL 337, 122977 (2023). http://doi.org/10.1016/j.apcatb.2023.122977
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Plasma-based dry reforming of methane in a dielectric barrier discharge reactor: Importance of uniform (sub)micron packings/catalysts to enhance the performance”. Wang J, Zhang K, Mertens M, Bogaerts A, Meynen V, APPLIED CATALYSIS B-ENVIRONMENTAL 337, 122977 (2023). http://doi.org/10.1016/j.apcatb.2023.122977
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Charge order, frustration relief, and spin-orbit coupling in U3O8”. Saniz R, Baldinozzi G, Arts I, Lamoen D, Leinders G, Verwerft M, Physical review materials 7, 054410 (2023). http://doi.org/10.1103/PhysRevMaterials.7.054410
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Secondary electron induced current in scanning transmission electron microscopy: an alternative way to visualize the morphology of nanoparticles”. Vlasov E, Skorikov A, Sánchez-Iglesias A, Liz-Marzán LM, Verbeeck J, Bals S, ACS materials letters , 1916 (2023). http://doi.org/10.1021/acsmaterialslett.3c00323
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Does non-thermal plasma modify biopolymers in solution? A chemical and mechanistic study for alginate”. Tampieri F, Espona-Noguera A, Labay C, Ginebra M-P, Yusupov M, Bogaerts A, Canal C, Biomaterials Science (2023). http://doi.org/10.1039/D3BM00212H
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Quantitative 3D Investigation of Nanoparticle Assemblies by Volumetric Segmentation of Electron Tomography Data Sets”. Kavak S, Kadu AA, Claes N, Sánchez-Iglesias A, Liz-Marzán LM, Batenburg KJ, Bals S, The journal of physical chemistry: C : nanomaterials and interfaces 127, 9725 (2023). http://doi.org/10.1021/acs.jpcc.3c02017
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Enhanced NH3Synthesis from Air in a Plasma Tandem-Electrocatalysis System Using Plasma-Engraved N-Doped Defective MoS2”. Zheng J, Zhang H, Lv J, Zhang M, Wan J, Gerrits N, Wu A, Lan B, Wang W, Wang S, Tu X, Bogaerts A, Li X, JACS Au 3, 1328 (2023). http://doi.org/10.1021/jacsau.3c00087
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Unusual structural rearrangement and superconductivity in infinite layer cuprate superlattices”. Samal D, Gauquelin N, Takamura Y, Lobato I, Arenholz E, Van Aert S, Huijben M, Zhong Z, Verbeeck J, Van Tendeloo G, Koster G, Physical review materials 7, 054803 (2023). http://doi.org/10.1103/PhysRevMaterials.7.054803
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Pattern Formation by Electric-Field Quench in a Mott Crystal”. Gauquelin N, Forte F, Jannis D, Fittipaldi R, Autieri C, Cuono G, Granata V, Lettieri M, Noce C, Miletto-Granozio F, Vecchione A, Verbeeck J, Cuoco M, Nano letters (2023). http://doi.org/10.1021/acs.nanolett.3c00574
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Simulation of glow and arc discharges in nitrogen: effects of the cathode emission mechanisms”. Tsonev I, Boothroyd J, Kolev S, Bogaerts A, PLASMA SOURCES SCIENCE &, TECHNOLOGY 32, 054002 (2023). http://doi.org/10.1088/1361-6595/acc96c
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X-ray spectrometry for preventive conservation of cultural heritage”. Van Grieken R, Worobiec A, Pramåna: a journal of physics 72, 191 (2011). http://doi.org/10.1007/S12043-011-0041-3
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
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X-ray spectrometry”. Török SB, Van Grieken RE, Analytical chemistry 64r, 180 (1992)
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X-ray spectrometry”. Török SB, Labar J, Injuk J, Van Grieken RE, Analytical chemistry R68, 467 (1996)
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X-ray spectrometry”. Török S, Labar J, Schmeling M, Van Grieken R, Analytical chemistry 70, 495r (1998)
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X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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X-ray micro-analysis of aluminium in pumpkinseed gills”. Eeckhaoudt S, Jacob W, Witters H, Van Grieken R, European journal of morphology 30, 296 (1992)
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X-ray micro-analysis of aluminium in pumpkinseed gills”. Eeckhaoudt S, Jacob W, Witters H, Van Grieken R, European journal of morphology 31, 42 (1993)
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X-ray analysis of riverbank sediment of the Tisza (Hungary): identification of particles from a mine pollution event”. Osán J, Kurunczi S, Török S, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 57, 413 (2002). http://doi.org/10.1016/S0584-8547(01)00405-0
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The work function of few-layer graphene”. Leenaerts O, Partoens B, Peeters FM, Volodin A, van Haesendonck C, Journal of physics : condensed matter 29, 035003 (2017). http://doi.org/10.1088/0953-8984/29/3/035003
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Wintertime spatio-temporal variation of ultrafine particles in a Belgian city”. Mishra VK, Kumar P, Van Poppel M, Bleux N, Frijns E, Reggente M, Berghmans P, Int Panis L, Samson R, The science of the total environment 431, 307 (2012). http://doi.org/10.1016/J.SCITOTENV.2012.05.054
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Why does not the leaf weight-area allometry of bamboos follow the 3/2-power law?”.Lin S, Shao L, Hui C, Song Y, Reddy GVP, Gielis J, Li F, Ding Y, Wei Q, Shi P, Reddy GVP, Frontiers in plant science 9, 583 (2018). http://doi.org/10.3389/FPLS.2018.00583
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Wet etching of TiN in 1-D and 2-D confined nano-spaces of FinFET transistors”. Vereecke G, De Coster H, Van Alphen S, Carolan P, Bender H, Willems K, Ragnarsson L-A, Van Dorpe P, Horiguchi N, Holsteyns F, Microelectronic engineering 200, 56 (2018). http://doi.org/10.1016/J.MEE.2018.09.004
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Weathering of Leinster granite under ambient atmospheric conditions”. Sweevers E, Peeters A, Van Grieken R, The science of the total environment 167, 73 (1995). http://doi.org/10.1016/0048-9697(95)04571-H
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