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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J. |
Reliability of copper dual damascene influenced by pre-clean |
2002 |
Analysis Of Integrated Circuits |
|
5 |
UA library record; WoS full record; WoS citing articles |
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Van de Put, M.; Thewissen, M.; Magnus, W.; Sorée, B.; Sellier, J.M. |
Spectral force approach to solve the time-dependent Wigner-Liouville equation |
2014 |
2014 International Workshop On Computational Electronics (iwce) |
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UA library record; WoS full record; |
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Dong, H.M.; Qin, H.; Zhang, J.; Peeters, F.M.; Xu, W. |
Terahertz absorption window in bilayer graphene |
2009 |
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UA library record; WoS full record; |
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Verreck, D.; Van de Put, M.L.; Verhulst, A.S.; Sorée, B.; Magnus, W.; Dabral, A.; Thean, A.; Groeseneken, G. |
15-band spectral envelope function formalism applied to broken gap tunnel field-effect transistors |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
|
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UA library record; WoS full record |
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Moors, K.; Sorée, B.; Magnus, W. |
Analytic solution of Ando's surface roughness model with finite domain distribution functions |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
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UA library record; WoS full record |
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Moors, K.; Sorée, B.; Magnus, W. |
Modeling and tackling resistivity scaling in metal nanowires |
2015 |
International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]
T2 – International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 09-11, 2015, Washington, DC |
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UA library record; WoS full record |
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Van de Put, M.L.; Vandenberghe, W.G.; Magnus, W.; Sorée, B.; Fischetti, M.V. |
Modeling of inter-ribbon tunneling in graphene |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
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UA library record; WoS full record |
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Brammertz, G.; Buffiere, M.; Verbist, C.; Bekaert, J.; Batuk, M.; Hadermann, J.; et al. |
Process variability in Cu2ZnSnSe4 solar cell devices: Electrical and structural investigations |
2015 |
The conference record of the IEEE Photovoltaic Specialists Conference
T2 – IEEE 42nd Photovoltaic Specialist Conference (PVSC), JUN 14-19, 2015, New Orleans, LA |
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UA library record; WoS full record |
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Verreck, D.; Verhulst, A.S.; Sorée, B.; Collaert, N.; Mocuta, A.; Thean, A.; Groeseneken, G. |
Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors |
2016 |
Solid-State Device Research (ESSDERC), European Conference
T2 – 46th European Solid-State Device Research Conference (ESSDERC) / 42nd, European Solid-State Circuits Conference (ESSCIRC), SEP 12-15, 2016, Lausanne, SWITZERLAND |
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UA library record; WoS full record |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
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Moors, K.; Soree, B.; Tokei, Z.; Magnus, W. |
Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes |
2015 |
On Ultimate Integration On Silicon (eurosoi-ulis) |
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UA library record; WoS full record; WoS citing articles |
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Verhulst, A.S.; Verreck, D.; Smets, Q.; Kao, K.-H.; Van de Put, M.; Rooyackers, R.; Sorée, B.; Vandooren, A.; De Meyer, K.; Groeseneken, G.; Heyns, M.M.; Mocuta, A.; Collaert, N.; Thean, A.V.-Y. |
Perspective of tunnel-FET for future low-power technology nodes |
2014 |
2014 Ieee International Electron Devices Meeting (iedm) |
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UA library record; WoS full record |
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Liu, Y.; Brelet, Y.; He, Z.; Yu, L.; Mitryukovskiy, S.; Houard, A.; Forestier, B.; Couairon, A.; Mysyrowicz, A. |
Ciliary white light generated during femtosecond laser ablation on transparent dielectrics |
2013 |
2013 Conference On And International Quantum Electronics Conference Lasers And Electro-optics Europe (cleo Europe/iqec) |
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UA library record; WoS full record |
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Verreck, D.; Verhulst, A.S.; Van de Put, M.L.; Sorée, B.; Magnus, W.; Collaert, N.; Mocuta, A.; Groeseneken, G. |
Self-consistent 30-band simulation approach for (non-)uniformly strained confined heterostructure tunnel field-effect transistors |
2017 |
Simulation of Semiconductor Processes and, Devices (SISPAD)AND DEVICES (SISPAD 2017) |
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UA library record; WoS full record |
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Bizindavyi, J.; Verhulst, A.S.; Sorée, B.; Groeseneken, G. |
Impact of calibrated band-tails on the subthreshold swing of pocketed TFETs |
2018 |
Conference digest
T2 – 76th Device Research Conference (DRC), JUN 24-27, 2018, Santa Barbara, CA |
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UA library record; WoS full record |
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van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. |
A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source |
2000 |
European mass spectrometry |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
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Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
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UA library record |
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Adams, F.; Gijbels, R.; Van Grieken, R.; Dachang, Z. |
Inorganic mass spectrometry |
1993 |
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UA library record |
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Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
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UA library record |
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Idrissi, H.; Schryvers, D. |
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization |
2012 |
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UA library record |
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van Vaeck, L.; Gijbels, R. |
Identification des substances inorganiques et organiques en surface des solides par la microsonde laser |
1992 |
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UA library record |
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van Landuyt, J. |
High resolution electron microscopy for materials |
1992 |
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7 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
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UA library record |
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Zhang, H.; Wang, W.; Li, X.; Han, L.; Yan, M.; Zhong, Y.; Tu, X. |
Plasma activation of methane for hydrogen production in a N2 rotating gliding arc warm plasma : a chemical kinetics study |
2018 |
Chemical engineering journal |
345 |
25 |
UA library record; WoS full record; WoS citing articles |
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Razdobarin, A.G.; Mukhin, E.E.; Semenov, V.V.; Tolstyakov, S.Y.; Kochergin, M.M.; Kurskiev, G.S.; Podushnikova, K.A.; Kirilenko, D.A.; Sitnikova, A.A.; Konovalov, V.G.; Solodovchenko, S.I.; Nekhaieva, O.M.; Skorik, O.A.; Bondarenko, V.N.; Voitsenya, V.S.; |
Diagnostic mirrors with transparent protection layer for ITER |
2011 |
Fusion engineering and design |
86 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Schryvers, D.; Cao, S.; Pourbabak; Shi, H.; Lu |
Recent EM investigations on nano-and micro-defect structures in SMAs |
2013 |
Journal of alloys and compounds |
577 |
7 |
UA library record; WoS full record; WoS citing articles |
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de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. |
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM |
2001 |
Physica: B : condensed matter
T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY |
308 |
3 |
UA library record; WoS full record; WoS citing articles |
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Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. |
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays |
2013 |
Ultramicroscopy |
134 |
1 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J. |
Ion beam synthesis of \beta-SiC at 950 degrees C and structural characterization |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam, Processing – Fr |
112 |
9 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks |
2003 |
Applied surface science |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
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