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	Author	Moors, K.; Soree, B.; Tokei, Z.; Magnus, W.
	Title	Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes			Type	P1 Proceeding
	Year	2015	Publication	On Ultimate Integration On Silicon (eurosoi-ulis)	Abbreviated Journal
	Volume		Issue		Pages	201-204
	Keywords	P1 Proceeding; Condensed Matter Theory (CMT)
	Abstract	We calculate the resistivity contribution of tilted grain boundaries with varying parameters in sub-10nm diameter metallic nanowires. The results have been obtained with the Boltzmann transport equation and Fermi's golden rule, retrieving correct state-dependent relaxation times. The standard approximation schemes for the relaxation times are shown to fail when grain boundary tilt is considered. Grain boundaries tilted under the same angle or randomly tilted induce a resistivity decrease.
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	Corporate Author				Thesis
	Publisher	Ieee	Place of Publication	New york	Editor
	Language		Wos		Publication Date
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	978-1-4799-6911-1	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor		Times cited		Open Access
	Notes				Approved	Most recent IF: NA
	Call Number	UA @ lucian @ c:irua:144776			Serial	4651
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