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Atomic scale dynamics of ultrasmall germanium clusters”. Bals S, Van Aert S, Romero CP, Lauwaet K, Van Bael MJ, Schoeters B, Partoens B, Yuecelen E, Lievens P, Van Tendeloo G, Nature communications 3, 897 (2012). http://doi.org/10.1038/ncomms1887
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Preventing cation intermixing enables 50% quantum yield in sub-15 nm short-wave infrared-emitting rare-earth based core-shell nanocrystals”. Arteaga Cardona F, Jain N, Popescu R, Busko D, Madirov E, Arús BA, Gerthsen D, De Backer A, Bals S, Bruns OT, Chmyrov A, Van Aert S, Richards BS, Hudry D, Nature communications 14, 4462 (2023). http://doi.org/10.1038/s41467-023-40031-4
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Three-dimensional atomic imaging of crystalline nanoparticles”. Van Aert S, Batenburg KJ, Rossell MD, Erni R, Van Tendeloo G, Nature 470, 374 (2011). http://doi.org/10.1038/nature09741
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Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities”. De Backer A, Jones L, Lobato I, Altantzis T, Goris B, Nellist PD, Bals S, Van Aert S, Nanoscale 9, 8791 (2017). http://doi.org/10.1039/C7NR02656K
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Three-dimensional atomic structure of supported Au nanoparticles at high temperature”. Liu P, Arslan Irmak E, De Backer A, De wael A, Lobato I, Béché, A, Van Aert S, Bals S, Nanoscale 13 (2021). http://doi.org/10.1039/D0NR08664A
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Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites”. Fatermans J, Romolini G, Altantzis T, Hofkens J, Roeffaers MBJ, Bals S, Van Aert S, Nanoscale (2022). http://doi.org/10.1039/D2NR01819E
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Measuring lattice strain in three dimensions through electron microscopy”. Goris B, de Beenhouwer J, de Backer A, Zanaga D, Batenburg KJ, Sánchez-Iglesias A, Liz-Marzán LM, Van Aert S, Bals S, Sijbers J, Van Tendeloo G, Nano letters 15, 6996 (2015). http://doi.org/10.1021/acs.nanolett.5b03008
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Three-dimensional atomic imaging of colloidal core-shell nanocrystals”. Bals S, Casavola M, van Huis MA, Van Aert S, Batenburg KJ, Van Tendeloo G, Vanmaekelbergh D, Nano letters 11, 3420 (2011). http://doi.org/10.1021/nl201826e
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Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals”. Goris B, de Backer A, Van Aert S, Gómez-Graña S, Liz-Marzán LM, Van Tendeloo G, Bals S, Nano letters 13, 4236 (2013). http://doi.org/10.1021/nl401945b
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Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment”. Altantzis T, Lobato I, De Backer A, Béché, A, Zhang Y, Basak S, Porcu M, Xu Q, Sánchez-Iglesias A, Liz-Marzán LM, Van Tendeloo G, Van Aert S, Bals S, Nano letters 19, 477 (2019). http://doi.org/10.1021/acs.nanolett.8b04303
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Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm”. De Backer A, Van Aert S, Faes C, Arslan Irmak E, Nellist PD, Jones L, N P J Computational Materials 8, 216 (2022). http://doi.org/10.1038/s41524-022-00900-w
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Deep convolutional neural networks to restore single-shot electron microscopy images”. Lobato I, Friedrich T, Van Aert S, N P J Computational Materials 10, 10 (2024). http://doi.org/10.1038/s41524-023-01188-0
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Atomic resolution electron tomography”. Bals S, Goris B, de Backer A, Van Aert S, Van Tendeloo G, MRS bulletin 41, 525 (2016). http://doi.org/10.1557/mrs.2016.138
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Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Computational aspects in quantitative EELS”. Verbeeck J, Van Aert S, Zhang L, Haiyan T, Schattschneider P, Rosenauer A, Microscopy and microanalysis 16, 240 (2010). http://doi.org/10.1017/S143192761005511X
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Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency”. van den Broek W, Van Aert S, van Dyck D, Microscopy and microanalysis 18, 336 (2012). http://doi.org/10.1017/S1431927611012633
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Physical limits on atomic resolution”. van Dyck D, Van Aert S, den Dekker AJ, Microscopy and microanalysis 10, 153 (2004). http://doi.org/10.1017/S143192760404036X
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Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
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Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664
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Ultra-high resolution electron tomography for materials science : a roadmap”. Batenburg KJ, Bals S, Van Aert S, Roelandts T, Sijbers J, Microscopy and microanalysis 17, 934 (2011). http://doi.org/10.1017/S143192761100554X
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Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM”. Jones L, Martinez GT, Béché, A, Van Aert S, Nellist PD, Microscopy and microanalysis 20, 126 (2014). http://doi.org/10.1017/S1431927614002359
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Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM”. Yu C-P, Friedrich T, Jannis D, Van Aert S, Verbeeck J, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622000617
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Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM”. De wael A, De Backer A, Yu C-P, Sentürk DG, Lobato I, Faes C, Van Aert S, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622012284
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Phase object reconstruction for 4D-STEM using deep learning”. Friedrich T, Yu C-P, Verbeeck J, Van Aert S, Microscopy and microanalysis 29, 395 (2023). http://doi.org/10.1093/MICMIC/OZAC002
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The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images”. Martinez GT, de Backer A, Rosenauer A, Verbeeck J, Van Aert S, Micron 63, 57 (2014). http://doi.org/10.1016/j.micron.2013.12.009
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How to optimize the experimental design of quantitative atomic resolution TEM experiments?”.Van Aert S, den Dekker AJ, van Dyck D, Micron 35, 425 (2004). http://doi.org/10.1016/j.micron.2004.01.007
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Model-based electron microscopy : from images toward precise numbers for unknown structure parameters”. Van Aert S, van den Broek W, Goos P, van Dyck D, Micron 43, 509 (2012). http://doi.org/10.1016/j.micron.2011.10.019
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Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals”. Jain N, Hao Y, Parekh U, Kaltenegger M, Pedrazo-Tardajos A, Lazzaroni R, Resel R, Geerts YH, Bals S, Van Aert S, Micron 169, 103444 (2023). http://doi.org/10.1016/j.micron.2023.103444
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Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques”. Schryvers D, Shi H, Martinez GT, Van Aert S, Frenzel J, Van Humbeeck J, Materials science forum T2 –, 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA 738/739, 65 (2013). http://doi.org/10.4028/www.scientific.net/MSF.738-739.65
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