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  Author Title Year Publication (up) Volume Times cited Additional Links Links
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
Niermann, T.; Verbeeck, J.; Lehmann, M. Creating arrays of electron vortices 2014 Ultramicroscopy 136 9 UA library record; WoS full record; WoS citing articles pdf doi
Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography 2006 Ultramicroscopy 106 50 UA library record; WoS full record; WoS citing articles doi
Hadermann, J.; Abakumov, A.M.; Tsirlin, A.A.; Filonenko, V.P.; Gonnissen, J.; Tan, H.; Verbeeck, J.; Gemmi, M.; Antipov, E.V.; Rosner, H. Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25 2010 Ultramicroscopy 110 24 UA library record; WoS full record; WoS citing articles pdf doi
Lubk, A.; Javon, E.; Cherkashin, N.; Reboh, S.; Gatel, C.; Hytch, M. Dynamic scattering theory for dark-field electron holography of 3D strain fields 2014 Ultramicroscopy 136 18 UA library record; WoS full record; WoS citing articles pdf doi
Javon, E.; Lubk; Cours, R.; Reboh, S.; Cherkashin, N.; Houdellier, F.; Gatel, C.; Hytch, M.J. Dynamical effects in strain measurements by dark-field electron holography 2014 Ultramicroscopy 147 10 UA library record; WoS full record; WoS citing articles doi
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images 2006 Ultramicroscopy 106 18 UA library record; WoS full record; WoS citing articles pdf doi
Bladt, E.; Pelt, D.M.; Bals, S.; Batenburg, K.J. Electron tomography based on highly limited data using a neural network reconstruction technique 2015 Ultramicroscopy 158 25 UA library record; WoS full record; WoS citing articles pdf url doi
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy 2008 Ultramicroscopy 108 25 UA library record; WoS full record; WoS citing articles doi
Krause, F.F.; Ahl, J.P.; Tytko, D.; Choi, P.P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D.; Hertkorn, J.; Engl, K.; Rosenauer, A. Homogeneity and composition of AlInGaN : a multiprobe nanostructure study 2015 Ultramicroscopy 156 11 UA library record; WoS full record; WoS citing articles pdf url doi
Schattschneider, P.; Löffler, S.; Stöger-Pollach, M.; Verbeeck, J. Is magnetic chiral dichroism feasible with electron vortices? 2014 Ultramicroscopy 136 64 UA library record; WoS full record; WoS citing articles pdf url doi
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. Measurement of specimen thickness by phase change determination in TEM 2008 Ultramicroscopy 108 2 UA library record; WoS full record; WoS citing articles doi
Van Eyndhoven, G.; Kurttepeli, M.; van Oers, C.J.; Cool, P.; Bals, S.; Batenburg, K.J.; Sijbers, J. Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials 2015 Ultramicroscopy 148 7 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. Prospects for versatile phase manipulation in the TEM : beyond aberration correction 2015 Ultramicroscopy 151 19 UA library record; WoS full record; WoS citing articles pdf url doi
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy 2006 Ultramicroscopy 106 83 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J.; Mauchamp, V.; Jaouen, M. Real space maps of magnetic moments on the atomic scale: theory and feasibility 2010 Ultramicroscopy 110 10 UA library record; WoS full record; WoS citing articles pdf doi
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. Structures and phase transitions in C60 and C70 fullerites 1993 Ultramicroscopy 51 17 UA library record; WoS full record; WoS citing articles doi
Schattschneider, P.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Hell, J.; Verbeeck, J. Sub-nanometer free electrons with topological charge 2012 Ultramicroscopy 115 24 UA library record; WoS full record; WoS citing articles pdf doi
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
Goris, B.; Meledina, M.; Turner, S.; Zhong, Z.; Batenburg, K.J.; Bals, S. Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomography 2016 Ultramicroscopy 171 13 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy 2018 Ultramicroscopy 187 4 UA library record; WoS full record; WoS citing articles pdf url doi
Alania, M.; Altantzis, T.; De Backer, A.; Lobato, I.; Bals, S.; Van Aert, S. Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure 2016 Ultramicroscopy 177 13 UA library record; WoS full record; WoS citing articles pdf url doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. Bandgap measurement of high refractive index materials by off-axis EELS 2017 Ultramicroscopy 182 3 UA library record; WoS full record; WoS citing articles pdf doi
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. Optimization of NBED simulations for disc-detection measurements 2017 Ultramicroscopy 181 6 UA library record; WoS full record; WoS citing articles pdf doi
Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement 2018 Ultramicroscopy 184 UA library record; WoS full record; WoS citing articles pdf url doi
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation 2018 Ultramicroscopy 184 7 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations 2017 Ultramicroscopy 176 1 UA library record; WoS full record; WoS citing articles pdf url doi
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