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Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting”. de Backer A, Martinez GT, MacArthur KE, Jones L, Béché, A, Nellist PD, Van Aert S, Ultramicroscopy 151, 56 (2015). http://doi.org/10.1016/j.ultramic.2014.11.028
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Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM”. Akamine H, Van den Bos KHW, Gauquelin N, Farjami S, Van Aert S, Schryvers D, Nishida M, Journal of alloys and compounds 644, 570 (2015). http://doi.org/10.1016/j.jallcom.2015.04.205
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Smart Align : a new tool for robust non-rigid registration of scanning microscope data”. Jones L, Yang H, Pennycook TJ, Marshall MSJ, Van Aert S, Browning ND, Castell MR, Nellist PD, Advanced Structural and Chemical Imaging 1, 8 (2015). http://doi.org/10.1186/s40679-015-0008-4
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Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
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Measuring lattice strain in three dimensions through electron microscopy”. Goris B, de Beenhouwer J, de Backer A, Zanaga D, Batenburg KJ, Sánchez-Iglesias A, Liz-Marzán LM, Van Aert S, Bals S, Sijbers J, Van Tendeloo G, Nano letters 15, 6996 (2015). http://doi.org/10.1021/acs.nanolett.5b03008
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Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films”. Molina-Luna L, Duerrschnabel M, Turner S, Erbe M, Martinez GT, Van Aert S, Holzapfel B, Van Tendeloo G, Superconductor science and technology 28, 115009 (2015). http://doi.org/10.1088/0953-2048/28/11/115009
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Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?”.De Backer A, De Wael A, Gonnissen J, Martinez GT, Béché, A, MacArthur KE, Jones L, Nellist PD, Van Aert S, Journal of physics : conference series 644Electron Microscopy and Analysis Group Conference (EMAG), JUN 02-JUL 02, 2015, Manchester, ENGLAND, 012034 (2015). http://doi.org/10.1088/1742-6596/644/1/012034
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling”. Liao Z, Huijben M, Zhong Z, Gauquelin N, Macke S, Green RJ, Van Aert S, Verbeeck J, Van Tendeloo G, Held K, Sawatzky GA, Koster G, Rijnders G, Nature materials 15, 425 (2016). http://doi.org/10.1038/nmat4579
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Progress and new advances in simulating electron microscopy datasets using MULTEM”. Lobato I, Van Aert S, Verbeeck J, Ultramicroscopy 168, 17 (2016). http://doi.org/10.1016/j.ultramic.2016.06.003
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Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy”. van den Bos KH W, De Backer A, Martinez GT, Winckelmans N, Bals S, Nellist PD, Van Aert S, Physical review letters 116, 246101 (2016). http://doi.org/10.1103/PhysRevLett.116.246101
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Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM”. Varambhia AM, Jones L, De Backer A, Fauske VT, Van Aert S, Ozkaya D, Nellist PD, Particle and particle systems characterization 33, 438 (2016). http://doi.org/10.1002/ppsc.201600067
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Long-Range Domain Structure and Symmetry Engineering by Interfacial Oxygen Octahedral Coupling at Heterostructure Interface”. Liao Z, Green RJ, Gauquelin N, Macke S, Li L, Gonnissen J, Sutarto R, Houwman EP, Zhong Z, Van Aert S, Verbeeck J, Sawatzky GA, Huijben M, Koster G, Rijnders G, Advanced functional materials 26, 6627 (2016). http://doi.org/10.1002/adfm.201602155
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Atomic resolution electron tomography”. Bals S, Goris B, de Backer A, Van Aert S, Van Tendeloo G, MRS bulletin 41, 525 (2016). http://doi.org/10.1557/mrs.2016.138
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Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design”. Gonnissen J, De Backer A, den Dekker AJ, Sijbers J, Van Aert S, Ultramicroscopy 170, 128 (2016). http://doi.org/10.1016/j.ultramic.2016.07.014
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In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals”. Geuchies JJ, van Overbeek C, Evers WH, Goris B, de Backer A, Gantapara AP, Rabouw FT, Hilhorst J, Peters JL, Konovalov O, Petukhov AV, Dijkstra M, Siebbeles LDA, van Aert S, Bals S, Vanmaekelbergh D, Nature materials 15, 1248 (2016). http://doi.org/10.1038/nmat4746
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StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images”. De Backer A, van den Bos KHW, Van den Broek W, Sijbers J, Van Aert S, Ultramicroscopy 171, 104 (2016). http://doi.org/10.1016/j.ultramic.2016.08.018
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Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges”. Gonnissen J, Batuk D, Nataf GF, Jones L, Abakumov AM, Van Aert S, Schryvers D, Salje EKH, Advanced functional materials 26, 7599 (2016). http://doi.org/10.1002/adfm.201603489
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Locating light and heavy atomic column positions with picometer precision using ISTEM”. van den Bos KHW, Krause FF, Béché, A, Verbeeck J, Rosenauer A, Van Aert S, Ultramicroscopy 172, 75 (2016). http://doi.org/10.1016/j.ultramic.2016.10.003
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Atom-counting in High Resolution Electron Microscopy: TEM or STEM –, that's the question”. Gonnissen J, De Backer A, den Dekker AJ, Sijbers J, Van Aert S, Ultramicroscopy 174, 112 (2016). http://doi.org/10.1016/j.ultramic.2016.10.011
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Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure”. Alania M, Altantzis T, De Backer A, Lobato I, Bals S, Van Aert S, Ultramicroscopy 177, 36 (2016). http://doi.org/10.1016/j.ultramic.2016.11.002
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How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?”.Alania M, De Backer A, Lobato I, Krause FF, Van Dyck D, Rosenauer A, Van Aert S, Ultramicroscopy 181, 134 (2017). http://doi.org/10.1016/j.ultramic.2016.12.013
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Investigating lattice strain in Au nanodecahedrons”. Goris B, De Beenhouwer J, de Backer A, Zanaga D, Batenburg J, Sanchez-Iglesias A, Liz-Marzan L, Van Aert S, Sijbers J, Van Tendeloo G, Bals S, , 11 (2016). http://doi.org/10.1002/9783527808465.EMC2016.5519
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Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations”. Schryvers D, Salje EKH, Nishida M, De Backer A, Idrissi H, Van Aert S, Ultramicroscopy 176, 194 (2017). http://doi.org/10.1016/j.ultramic.2016.12.022
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Hybrid statistics-simulations based method for atom-counting from ADF STEM images”. De wael A, De Backer A, Jones L, Nellist PD, Van Aert S, Ultramicroscopy 177, 69 (2017). http://doi.org/10.1016/j.ultramic.2017.01.010
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Controlled growth of hexagonal gold nanostructures during thermally induced self-assembling on Ge(001) surface”. Jany BR, Gauquelin N, Willhammar T, Nikiel M, van den Bos KHW, Janas A, Szajna K, Verbeeck J, Van Aert S, Van Tendeloo G, Krok F, Scientific reports 7, 42420 (2017). http://doi.org/10.1038/srep42420
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Highly Emissive Divalent-Ion-Doped Colloidal CsPb1–xMxBr3Perovskite Nanocrystals through Cation Exchange”. van der Stam W, Geuchies JJ, Altantzis T, van den Bos KHW, Meeldijk JD, Van Aert S, Bals S, Vanmaekelbergh D, de Mello Donega C, Journal of the American Chemical Society 139, 4087 (2017). http://doi.org/10.1021/jacs.6b13079
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Thickness dependent properties in oxide heterostructures driven by structurally induced metal-oxygen hybridization variations”. Liao Z, Gauquelin N, Green RJ, Macke S, Gonnissen J, Thomas S, Zhong Z, Li L, Si L, Van Aert S, Hansmann P, Held K, Xia J, Verbeeck J, Van Tendeloo G, Sawatzky GA, Koster G, Huijben M, Rijnders G, Advanced functional materials 27, 1606717 (2017). http://doi.org/10.1002/ADFM.201606717
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Ligand-Induced Shape Transformation of PbSe Nanocrystals”. Peters JL, van den Bos KHW, Van Aert S, Goris B, Bals S, Vanmaekelbergh D, Chemistry of materials 29, 4122 (2017). http://doi.org/10.1021/acs.chemmater.7b01103
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One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work”. Pullini D, Sgroi M, Mahmoud A, Gauquelin N, Maschio L, Lorenzo-Ferrari AM, Groenen R, Damen C, Rijnders G, van den Bos KHW, Van Aert S, Verbeeck J, ACS applied materials and interfaces 9, 20974 (2017). http://doi.org/10.1021/acsami.7b04089
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