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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Huq, M.Z.; Celis, J.P.; Meneve, J.; Stals, L.; Schryvers, D. |
Oscillating sliding wear of mono- and multilayer ceramic coatings in air |
1999 |
Surface and coatings technology |
113 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
1999 |
Journal of the American Society for Mass Spectrometry |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
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Helm, M.; Hilber, W.; Strasser, G.; de Meester, R.; Peeters, F.M.; Wacker, A. |
Simultaneous investigation of vertical transport and intersubband absorption in a superlattice: continuum Wannier-Strak ladders and next-nearest neighbor tunneling |
1999 |
Physica: B : condensed matter |
272 |
1 |
UA library record; WoS full record; WoS citing articles |
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Peeters, F.M.; Reijniers, J.; Badalian, S.M.; Vasilopoulos, P. |
Snake orbits in hybrid semiconductor/ferromagnetic devices |
1999 |
Microelectronic engineering |
47 |
6 |
UA library record; WoS full record; WoS citing articles |
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Vittiglio, G.; Janssens, K.; Adams, F.; Oost, A. |
Localised and non-destructive analysis of metallic artefacts from ancient Egypt by means of a compact μ-XRF instrument |
1999 |
Spectrochimica acta: part B : atomic spectroscopy |
54 |
|
UA library record; WoS full record; WoS citing articles |
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Ro, C.-U.; Hoornaert, S.; Van Grieken, R. |
Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis |
1999 |
Analytica chimica acta |
389 |
|
UA library record; WoS full record; WoS citing articles |
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Spolnik, Z.M.; Claes, M.; Van Grieken, R. |
Determination of trace elements in organic matrices by grazing-emission X-ray fluorescence spectrometry |
1999 |
Analytica chimica acta |
401 |
|
UA library record; WoS full record; WoS citing articles |
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Bernard, P.; Eisma, D.; Van Grieken, R. |
Electron microprobe analysis of suspended matter in the Angola Basin |
1999 |
Journal of sea research |
41 |
|
UA library record; WoS full record; WoS citing articles |
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Gysels, K.; Van Grieken, R. |
Field evaluation of a wind tunnel-impactor system for sampling ambient aerosols |
1999 |
Journal of aerosol science |
30 |
|
UA library record; WoS full record; WoS citing articles |
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Camuffo, D.; Brimblecombe, P.; Van Grieken, R.; Busse, H.-J.; Sturaro, G.; Valentino, A.; Bernardi, A.; Blades, N.; Shooter, D.; de Bock, L.; Gysels, K.; Wieser, M.; Kim, O. |
Indoor air quality at the Correr Museum, Venice, Italy |
1999 |
The science of the total environment |
236 |
|
UA library record; WoS full record; WoS citing articles |
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Sánchez-Moral, S.; Soler, V.; Cañaveras, J.C.; Sanz-Rubio, E.; Van Grieken, R.; Gysels, K. |
Inorganic deterioration affecting the Altamira Cave, N Spain: quantitative approach to wall-corrosion (solutional etching) processes induced by visitors |
1999 |
The science of the total environment |
243/244 |
|
UA library record; WoS full record; WoS citing articles |
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Dekov, V.M.; van Put, A.; Eisma, D.; Van Grieken, R. |
Single particle analysis of suspended matter in the Makasar Strait and Flores Sea with particular reference to tin-bearing particles |
1999 |
Journal of sea research |
41 |
|
UA library record; WoS full record; WoS citing articles |
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Jambers, W.; Dekov, V.; Van Grieken, R. |
Single particle characterisation of inorganic and organic North Sea suspension |
1999 |
Marine chemistry |
67 |
|
UA library record; WoS full record; WoS citing articles |
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de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. |
Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon |
1999 |
The review of scientific instruments |
70 |
5 |
UA library record; WoS full record; WoS citing articles |
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de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
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Pokatilov, E.P.; Fomin, V.M.; Balaban, S.N.; Gladilin, V.N.; Klimin, S.N.; Devreese, J.T.; Magnus, W.; Schoenmaker, W.; Collaert, N.; van Rossum, M.; de Meyer, K. |
Distribution of fields and charge carriers in cylindrical nanosize silicon-based metal-oxide-semiconductor structures |
1999 |
Journal Of Applied Physics |
85 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bogaerts, A. |
The glow discharge: an exciting plasma |
1999 |
Journal of analytical atomic spectrometry |
14 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
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Baelus, B.J.; Peeters, F.M. |
Hall potentiometer in the ballistic regime |
1999 |
Applied physics letters |
74 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schäffer, C. |
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs |
1999 |
Journal of applied physics |
85 |
6 |
UA library record; WoS full record; WoS citing articles |
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Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. |
Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays |
1999 |
Applied physics letters |
75 |
481 |
UA library record; WoS full record; WoS citing articles |
|
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Ahenach, J.; Cool, P.; Vansant, E.F.; Lebedev, O.; van Landuyt, J. |
Influence of water on the pillaring of montmorillonite with aminopropyltriethoxysilane |
1999 |
Physical chemistry, chemical physics |
1 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
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Peeters, F.M.; Schweigert, V.A.; Deo, P.S. |
Mesoscopic superconducting disks: fluxoids in a box |
1999 |
Microelectronic engineering |
47 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W. |
Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge |
1999 |
Journal of applied physics |
86 |
18 |
UA library record; WoS full record; WoS citing articles |
|
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Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Tafuri, F.; Granozio, F.M.; Di Chiara, A.; Bender, H. |
A potential method to correlate electrical properties and microstructure of a unique high-Tc superconducting Josephson junction |
1999 |
Applied physics letters |
74 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bogaerts, A.; Gijbels, R. |
Role of Ar2+ and Ar+2 ions in a direct current argon glow discharge: a numerical description |
1999 |
Journal of applied physics |
86 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
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Farvacque, J.L.; Bougrioua, Z.; Moerman, I.; Van Tendeloo, G.; Lebedev, O. |
Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE |
1999 |
Physica: B : condensed matter
T2 – 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA |
273-4 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1999 |
Journal of analytical atomic spectrometry |
14 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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Colomer, J.-F.; Bister, G.; Willems, I.; Konya, Z.; Fonseca, A.; Van Tendeloo, G.; Nagy, J.B. |
Synthesis of single wall carbon nanotubes by catalytic decomposition of hydrocarbons |
1999 |
Chemical communications |
|
110 |
UA library record; WoS full record; WoS citing articles |
|
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Fröba, M.; Köhn, R.; Bouffaud, G.; Richard, O.; Van Tendeloo, G. |
_Fe2O3 nanoparticles with mesoporous MCM-48 silica: in situ formation and characterisation |
1999 |
Chemistry of materials |
11 |
202 |
UA library record; WoS full record; WoS citing articles |
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Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
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