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  Author Title Year Publication Volume Times cited Additional Links Links
Huq, M.Z.; Celis, J.P.; Meneve, J.; Stals, L.; Schryvers, D. Oscillating sliding wear of mono- and multilayer ceramic coatings in air 1999 Surface and coatings technology 113 10 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals 1999 Journal of the American Society for Mass Spectrometry 10 4 UA library record; WoS full record; WoS citing articles doi
Helm, M.; Hilber, W.; Strasser, G.; de Meester, R.; Peeters, F.M.; Wacker, A. Simultaneous investigation of vertical transport and intersubband absorption in a superlattice: continuum Wannier-Strak ladders and next-nearest neighbor tunneling 1999 Physica: B : condensed matter 272 1 UA library record; WoS full record; WoS citing articles doi
Peeters, F.M.; Reijniers, J.; Badalian, S.M.; Vasilopoulos, P. Snake orbits in hybrid semiconductor/ferromagnetic devices 1999 Microelectronic engineering 47 6 UA library record; WoS full record; WoS citing articles doi
Vittiglio, G.; Janssens, K.; Adams, F.; Oost, A. Localised and non-destructive analysis of metallic artefacts from ancient Egypt by means of a compact μ-XRF instrument 1999 Spectrochimica acta: part B : atomic spectroscopy 54 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Hoornaert, S.; Van Grieken, R. Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis 1999 Analytica chimica acta 389 UA library record; WoS full record; WoS citing articles doi
Spolnik, Z.M.; Claes, M.; Van Grieken, R. Determination of trace elements in organic matrices by grazing-emission X-ray fluorescence spectrometry 1999 Analytica chimica acta 401 UA library record; WoS full record; WoS citing articles doi
Bernard, P.; Eisma, D.; Van Grieken, R. Electron microprobe analysis of suspended matter in the Angola Basin 1999 Journal of sea research 41 UA library record; WoS full record; WoS citing articles doi
Gysels, K.; Van Grieken, R. Field evaluation of a wind tunnel-impactor system for sampling ambient aerosols 1999 Journal of aerosol science 30 UA library record; WoS full record; WoS citing articles doi
Camuffo, D.; Brimblecombe, P.; Van Grieken, R.; Busse, H.-J.; Sturaro, G.; Valentino, A.; Bernardi, A.; Blades, N.; Shooter, D.; de Bock, L.; Gysels, K.; Wieser, M.; Kim, O. Indoor air quality at the Correr Museum, Venice, Italy 1999 The science of the total environment 236 UA library record; WoS full record; WoS citing articles doi
Sánchez-Moral, S.; Soler, V.; Cañaveras, J.C.; Sanz-Rubio, E.; Van Grieken, R.; Gysels, K. Inorganic deterioration affecting the Altamira Cave, N Spain: quantitative approach to wall-corrosion (solutional etching) processes induced by visitors 1999 The science of the total environment 243/244 UA library record; WoS full record; WoS citing articles doi
Dekov, V.M.; van Put, A.; Eisma, D.; Van Grieken, R. Single particle analysis of suspended matter in the Makasar Strait and Flores Sea with particular reference to tin-bearing particles 1999 Journal of sea research 41 UA library record; WoS full record; WoS citing articles doi
Jambers, W.; Dekov, V.; Van Grieken, R. Single particle characterisation of inorganic and organic North Sea suspension 1999 Marine chemistry 67 UA library record; WoS full record; WoS citing articles doi
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon 1999 The review of scientific instruments 70 5 UA library record; WoS full record; WoS citing articles doi
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. Characterization of AgxAuy nano particles by TEM and STEM 1999 Journal of analytical atomic spectrometry 14 2 UA library record; WoS full record; WoS citing articles doi
Pokatilov, E.P.; Fomin, V.M.; Balaban, S.N.; Gladilin, V.N.; Klimin, S.N.; Devreese, J.T.; Magnus, W.; Schoenmaker, W.; Collaert, N.; van Rossum, M.; de Meyer, K. Distribution of fields and charge carriers in cylindrical nanosize silicon-based metal-oxide-semiconductor structures 1999 Journal Of Applied Physics 85 16 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A. The glow discharge: an exciting plasma 1999 Journal of analytical atomic spectrometry 14 29 UA library record; WoS full record; WoS citing articles doi
Baelus, B.J.; Peeters, F.M. Hall potentiometer in the ballistic regime 1999 Applied physics letters 74 13 UA library record; WoS full record; WoS citing articles doi
Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schäffer, C. High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs 1999 Journal of applied physics 85 6 UA library record; WoS full record; WoS citing articles doi
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles pdf doi
Ahenach, J.; Cool, P.; Vansant, E.F.; Lebedev, O.; van Landuyt, J. Influence of water on the pillaring of montmorillonite with aminopropyltriethoxysilane 1999 Physical chemistry, chemical physics 1 10 UA library record; WoS full record; WoS citing articles doi
Peeters, F.M.; Schweigert, V.A.; Deo, P.S. Mesoscopic superconducting disks: fluxoids in a box 1999 Microelectronic engineering 47 1 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W. Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge 1999 Journal of applied physics 86 18 UA library record; WoS full record; WoS citing articles doi
Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Tafuri, F.; Granozio, F.M.; Di Chiara, A.; Bender, H. A potential method to correlate electrical properties and microstructure of a unique high-Tc superconducting Josephson junction 1999 Applied physics letters 74 5 UA library record; WoS full record; WoS citing articles pdf doi
Bogaerts, A.; Gijbels, R. Role of Ar2+ and Ar+2 ions in a direct current argon glow discharge: a numerical description 1999 Journal of applied physics 86 50 UA library record; WoS full record; WoS citing articles doi
Farvacque, J.L.; Bougrioua, Z.; Moerman, I.; Van Tendeloo, G.; Lebedev, O. Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE 1999 Physica: B : condensed matter T2 – 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA 273-4 5 UA library record; WoS full record; WoS citing articles pdf doi
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) 1999 Journal of analytical atomic spectrometry 14 10 UA library record; WoS full record; WoS citing articles doi
Colomer, J.-F.; Bister, G.; Willems, I.; Konya, Z.; Fonseca, A.; Van Tendeloo, G.; Nagy, J.B. Synthesis of single wall carbon nanotubes by catalytic decomposition of hydrocarbons 1999 Chemical communications 110 UA library record; WoS full record; WoS citing articles pdf doi
Fröba, M.; Köhn, R.; Bouffaud, G.; Richard, O.; Van Tendeloo, G. _Fe2O3 nanoparticles with mesoporous MCM-48 silica: in situ formation and characterisation 1999 Chemistry of materials 11 202 UA library record; WoS full record; WoS citing articles pdf doi
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers 1999 Thin solid films : an international journal on the science and technology of thin and thick films 343/344 1 UA library record; WoS full record; WoS citing articles doi
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