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  Author Title Year Publication Volume Times cited Additional Links Links
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. Model-based electron microscopy : from images toward precise numbers for unknown structure parameters 2012 Micron 43 7 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy 2010 Ultramicroscopy 110 16 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. Plasmon holographic experiments: theoretical framework 2005 Ultramicroscopy 102 43 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? 2012 Ultramicroscopy 114 5 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles url doi
van Dyck, D.; Croitoru, M.D. Statistical method for thickness measurement of amorphous objects 2007 Applied physics letters 90 4 UA library record; WoS full record; WoS citing articles pdf url doi
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. Inelastic electron holography as a variant of the Feynman thought experiment 2007 Ultramicroscopy 107 13 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images 2006 Ultramicroscopy 106 18 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record pdf url doi
Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration 2009 Spectrochimica acta: part B : atomic spectroscopy 64 28 UA library record; WoS full record; WoS citing articles pdf doi
Sentosun, K.; Lobato, I.; Bladt, E.; Zhang, Y.; Palenstijn, W.J.; Batenburg, K.J.; Van Dyck, D.; Bals, S. Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography 2017 Particle and particle systems characterization 34 2 UA library record; WoS full record; WoS citing articles pdf url doi
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM 2014 Ultramicroscopy 141 6 UA library record; WoS full record; WoS citing articles pdf url doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles pdf url doi
Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. Ni cluster formation in low temperature annealed Ni50.6Ti49.4 2017 Functional materials letters 10 4 UA library record; WoS full record; WoS citing articles pdf url doi
Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. Advanced electron microscopy for advanced materials 2012 Advanced materials 24 107 UA library record; WoS full record; WoS citing articles pdf url doi
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles url doi
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