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  Author Title Year Publication Volume Times cited Additional Links Links
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles url doi
Molina, L.; Tan, H.; Biermans, E.; Batenburg, K.J.; Verbeeck, J.; Bals, S.; Van Tendeloo, G. Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors 2011 Superconductor science and technology 24 31 UA library record; WoS full record; WoS citing articles pdf doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves: part 1: theory and simulations 2010 Ultramicroscopy 110 25 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves : part 2 : a practical example 2012 Ultramicroscopy 116 8 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. Do you believe that atoms stay in place when you observe them in HREM? 2015 Micron 68 11 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. Dynamical electron diffraction in substitutionally disordered column structures 1995 Ultramicroscopy 60 14 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. Electron channelling based crystallography 2007 Ultramicroscopy 107 32 UA library record; WoS full record; WoS citing articles doi
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. Electron diffraction effects of conical, helically wound, graphite whiskers 1993 Ultramicroscopy 49 14 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Icem 13 UA library record; WoS full record;
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Physica status solidi: A 143 7 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D.; Briers, J.; Bao, Y.; Geise, H.J. An electron microscopic study of highly oriented undoped and FeCl3-doped poly (p-phenylenevinylene) 1996 Macromolecules 29 10 UA library record; WoS full record; WoS citing articles pdf doi
Goris, B.; van den Broek, W.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. Electron tomography based on a total variation minimization reconstruction technique 2012 Ultramicroscopy 113 171 UA library record; WoS full record; WoS citing articles pdf doi
Bladt, E.; Pelt, D.M.; Bals, S.; Batenburg, K.J. Electron tomography based on highly limited data using a neural network reconstruction technique 2015 Ultramicroscopy 158 25 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; van Dyck, D.; Van Tendeloo, G. Energy-filtered transmission electron microscopy: an overview 2004 Spectrochimica acta: part B : atomic spectroscopy 59 37 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? 2013 Ultramicroscopy 134 31 UA library record; WoS full record; WoS citing articles pdf doi
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. Experiments on inelastic electron holography 2006 Ultramicroscopy 106 28 UA library record; WoS full record; WoS citing articles doi
Goris, B.; Bals, S.; van den Broek, W.; Verbeeck, J.; Van Tendeloo, G. Exploring different inelastic projection mechanisms for electron tomography 2011 Ultramicroscopy 111 21 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles doi
de Backer, A.; Van Aert, S.; van Dyck, D. High precision measurements of atom column positions using model-based exit wave reconstruction 2011 Ultramicroscopy 111 8 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles doi
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D. How to optimize the experimental design of quantitative atomic resolution TEM experiments? 2004 Micron 35 14 UA library record; WoS full record; WoS citing articles pdf doi
Xu, Q.; Zandbergen, H.W.; van Dyck, D. Imaging from atomic structure to electronic structure 2012 Micron 43 UA library record; WoS full record pdf doi
Lobato, I.; van Dyck, D. Improved multislice calculations for including higher-order Laue zones effects 2012 Ultramicroscopy 119 6 UA library record; WoS full record; WoS citing articles doi
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. Inelastic electron holography as a variant of the Feynman thought experiment 2007 Ultramicroscopy 107 13 UA library record; WoS full record; WoS citing articles pdf doi
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