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Author Xu, Q.; Zandbergen, H.W.; van Dyck, D. pdf  doi
openurl 
  Title Imaging from atomic structure to electronic structure Type A1 Journal article
  Year (down) 2012 Publication Micron Abbreviated Journal Micron  
  Volume 43 Issue 4 Pages 524-531  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract This paper discusses the possibility of retrieving the electron distribution (with highlighted valence electron distribution information) of materials from recorded HREM images. This process can be achieved by solving two inverse problems: reconstruction of the exit wave and reconstruction of the electron distribution from exit waves. The first inverse problem can be solved using a focal series reconstruction method. We show that the second inverse problem can be solved by combining a series of exit waves recorded at different thickness conditions. This process is designed based on an improved understanding of the dynamical scattering process. It also explains the fundamental difficulty of obtaining the valence electron distribution information and the basis of our solution.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Oxford Editor  
  Language Wos 000301702400005 Publication Date 2011-11-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0968-4328; ISBN Additional Links UA library record; WoS full record  
  Impact Factor 1.98 Times cited Open Access  
  Notes Fwo Approved Most recent IF: 1.98; 2012 IF: 1.876  
  Call Number UA @ lucian @ c:irua:93634 Serial 1553  
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