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Author | Xu, Q.; Zandbergen, H.W.; van Dyck, D. | ||||
Title | Imaging from atomic structure to electronic structure | Type | A1 Journal article | ||
Year | 2012 | Publication | Micron | Abbreviated Journal | Micron |
Volume | 43 | Issue | 4 | Pages | 524-531 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | This paper discusses the possibility of retrieving the electron distribution (with highlighted valence electron distribution information) of materials from recorded HREM images. This process can be achieved by solving two inverse problems: reconstruction of the exit wave and reconstruction of the electron distribution from exit waves. The first inverse problem can be solved using a focal series reconstruction method. We show that the second inverse problem can be solved by combining a series of exit waves recorded at different thickness conditions. This process is designed based on an improved understanding of the dynamical scattering process. It also explains the fundamental difficulty of obtaining the valence electron distribution information and the basis of our solution. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Oxford | Editor | ||
Language | Wos | 000301702400005 | Publication Date | 2011-11-05 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 1.98 | Times cited | Open Access | ||
Notes | Fwo | Approved | Most recent IF: 1.98; 2012 IF: 1.876 | ||
Call Number | UA @ lucian @ c:irua:93634 | Serial | 1553 | ||
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Author | Lobato, I.; van Dyck, D. | ||||
Title | Improved multislice calculations for including higher-order Laue zones effects | Type | A1 Journal article | ||
Year | 2012 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 119 | Issue | Pages | 63-71 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | A new method for including higher-order Laue zones (HOLZs) effects in an efficient way in electron scattering simulations has been developed and tested by detail calculations. The calculated results by the conventional multislice (CMS) method and the improved conventional multislice (ICMS) method using a large dynamical aperture to avoid numerical errors are compared with accurate results. We have found that the zero-order Laue zones (ZOLZs) reflection cannot be properly described only using the projected potential in the whole unit cell; in general, we need to subslice the electrostatic potential inside the unit cell. It is shown that the ICMS method has higher accuracy than the CMS method for the calculation of the ZOLZ, HOLZ and Pseudo-HOLZ reflections. Hence, ICMS method allows to use a larger slice thickness than the CMS method and reduces the calculation time. (C) 2012 Elsevier B.V. All rights reserved. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000308079200011 | Publication Date | 2012-01-14 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 6 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2012 IF: 2.470 | |||
Call Number | UA @ lucian @ c:irua:101902 | Serial | 1567 | ||
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Author | Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. | ||||
Title | Inelastic electron holography as a variant of the Feynman thought experiment | Type | A1 Journal article | ||
Year | 2007 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 107 | Issue | 8 | Pages | 559-567 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Using a combination of electron holography and energy filtering, interference fringes produced after inelastic interaction of electrons with hydrogen molecules are examined. Surprisingly, the coherence of inelastic scattering increases when moving from the surface of a hydrogen-containing bubble to the vacuum. This phenomenon can be understood in terms of the Feynman two-slit thought experiment with a variable ambiguity of the which-way registration. (C) 2006 Elsevier B.V. All rights reserved. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000246937000001 | Publication Date | 2006-12-16 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 13 | Open Access | |
Notes | Fwo G.0147.06 | Approved | Most recent IF: 2.843; 2007 IF: 1.996 | ||
Call Number | UA @ lucian @ c:irua:103588UA @ admin @ c:irua:103588 | Serial | 1605 | ||
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Author | Fanidis, C.; van Dyck, D.; van Landuyt, J. | ||||
Title | Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework | Type | A1 Journal article | ||
Year | 1992 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 41 | Issue | Pages | 55-64 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | A1992HX68100005 | Publication Date | 2002-10-18 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.436 | Times cited | 17 | Open Access | |
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:4092 | Serial | 1608 | ||
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Author | Fanidis, C.; van Dyck, D.; van Landuyt, J. | ||||
Title | Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases | Type | A1 Journal article | ||
Year | 1993 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 48 | Issue | Pages | 133-164 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | A1993KM78800013 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.436 | Times cited | 6 | Open Access | |
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:6782 | Serial | 1609 | ||
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Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. | ||||
Title | Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? | Type | A1 Journal article | ||
Year | 2003 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 98 | Issue | Pages | 27-42 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000186831500003 | Publication Date | 2003-04-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 26 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2003 IF: 1.665 | |||
Call Number | UA @ lucian @ c:irua:47516 | Serial | 1749 | ||
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Author | Van Aert, S.; Chen, J.H.; van Dyck, D. | ||||
Title | Linear versus non-linear structural information limit in high-resolution transmission electron microscopy | Type | A1 Journal article | ||
Year | 2010 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 110 | Issue | 11 | Pages | 1404-1410 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | A widely used performance criterion in high-resolution transmission electron microscopy (HRTEM) is the information limit. It corresponds to the inverse of the maximum spatial object frequency that is linearly transmitted with sufficient intensity from the exit plane of the object to the image plane and is limited due to partial temporal coherence. In practice, the information limit is often measured from a diffractogram or from Young's fringes assuming a weak phase object scattering beyond the inverse of the information limit. However, for an aberration corrected electron microscope, with an information limit in the sub-angstrom range, weak phase objects are no longer applicable since they do not scatter sufficiently in this range. Therefore, one relies on more strongly scattering objects such as crystals of heavy atoms observed along a low index zone axis. In that case, dynamical scattering becomes important such that the non-linear and linear interaction may be equally important. The non-linear interaction may then set the experimental cut-off frequency observed in a diffractogram. The goal of this paper is to quantify both the linear and the non-linear information transfer in terms of closed form analytical expressions. Whereas the cut-off frequency set by the linear transfer can be directly related with the attainable resolution, information from the non-linear transfer can only be extracted using quantitative, model-based methods. In contrast to the historic definition of the information limit depending on microscope parameters only, the expressions derived in this paper explicitly incorporate their dependence on the structure parameters as well. In order to emphasize this dependence and to distinguish from the usual information limit, the expressions derived for the inverse cut-off frequencies will be referred to as the linear and non-linear structural information limit. The present findings confirm the well-known result that partial temporal coherence has different effects on the transfer of the linear and non-linear terms, such that the non-linear imaging contributions are damped less than the linear imaging contributions at high spatial frequencies. This will be important when coherent aberrations such as spherical aberration and defocus are reduced. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000282562100008 | Publication Date | 2010-07-15 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 6 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2010 IF: 2.063 | ||
Call Number | UA @ lucian @ c:irua:83689 | Serial | 1821 | ||
Permanent link to this record | |||||
Author | den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. | ||||
Title | Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework | Type | A1 Journal article | ||
Year | 2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 104 | Issue | 2 | Pages | 83-106 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000230526400001 | Publication Date | 2005-04-09 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 70 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | |||
Call Number | UA @ lucian @ c:irua:57229 | Serial | 1959 | ||
Permanent link to this record | |||||
Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. | ||||
Title | Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example | Type | A1 Journal article | ||
Year | 2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 104 | Issue | 2 | Pages | 107-125 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000230526400002 | Publication Date | 2005-04-08 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 37 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | |||
Call Number | UA @ lucian @ c:irua:57131 | Serial | 1960 | ||
Permanent link to this record | |||||
Author | Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. | ||||
Title | A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM | Type | A1 Journal article | ||
Year | 2014 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 141 | Issue | Pages | 22-31 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The conventional approach to object reconstruction through electron tomography is to reduce the three-dimensional problem to a series of independent two-dimensional slice-by-slice reconstructions. However, at atomic resolution the image of a single atom extends over many such slices and incorporating this image as prior knowledge in tomography or depth sectioning therefore requires a fully three-dimensional treatment. Unfortunately, the size of the three-dimensional projection operator scales highly unfavorably with object size and readily exceeds the available computer memory. In this paper, it is shown that for incoherent image formation the memory requirement can be reduced to the fundamental lower limit of the object size, both for tomography and depth sectioning. Furthermore, it is shown through multislice calculations that high angle annular dark field scanning transmission electron microscopy can be sufficiently incoherent for the reconstruction of single element nanocrystals, but that dynamical diffraction effects can cause classification problems if more than one element is present. (C) 2014 Elsevier B.V. All rights reserved. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000335766600004 | Publication Date | 2014-03-22 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 6 | Open Access | |
Notes | ResearchFoundationFlanders(FWO;G.0393.11; G.0064.10;andG.0374.13); European Union Seventh Frame- workProgramme [FP7/2007-2013]under Grant agreement no. 312483 (ESTEEM2).; esteem2jra2; esteem2jra4 | Approved | Most recent IF: 2.843; 2014 IF: 2.436 | ||
Call Number | UA @ lucian @ c:irua:117650 | Serial | 1992 | ||
Permanent link to this record | |||||
Author | Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. | ||||
Title | A method to determine the local surface profile from reconstructed exit waves | Type | A1 Journal article | ||
Year | 2011 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 111 | Issue | 8 | Pages | 1352-1359 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Reconstructed exit waves are useful to quantify unknown structure parameters such as the position and composition of the atom columns at atomic scale. Existing techniques provide a complex wave in a flat plane which is close to the plane where the electrons leave the atom columns. However, due to local deviation in the flatness of the exit surface, there will be an offset between the plane of reconstruction and the actual exit of a specific atom column. Using the channelling theory, it has been shown that this defocus offset can in principle be determined atom column-by-atom column. As such, the surface roughness could be quantified at atomic scale. However, the outcome strongly depends on the initial plane of reconstruction especially in a crystalline structure. If this plane is further away from the true exit, the waves of the atom columns become delocalized and interfere mutually which strongly complicates the interpretation of the exit wave in terms of the local structure. In this paper, we will study the delocalization with defocus using the channelling theory in a more systematic way. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000300461100049 | Publication Date | 2011-05-03 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 3 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2011 IF: 2.471 | ||
Call Number | UA @ lucian @ c:irua:88941 | Serial | 2017 | ||
Permanent link to this record | |||||
Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
Title | A model based atomic resolution tomographic algorithm | Type | A1 Journal article | ||
Year | 2009 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 109 | Issue | 12 | Pages | 1485-1490 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Tomography with high angular annular dark field scanning transmission electron microscopy at atomic resolution can be greatly improved if one is able to take advantage of prior knowledge. In this paper we present a reconstruction technique that explicitly takes into account the microscope parameters and the atomic nature of the projected object. This results in a more accurate estimate of the atomic positions and in a good resistance to noise. The reconstruction is a maximum likelihood estimator of the object. Moreover, the limits to the precision have been explored, allowing for a prediction of the amount of expected noise in the reconstruction for a certain experimental setup. We believe that the proposed reconstruction technique can be generalized to other tomographic experiments. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000271840200010 | Publication Date | 2009-08-28 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 17 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2009 IF: 2.067 | |||
Call Number | UA @ lucian @ c:irua:78588 | Serial | 2097 | ||
Permanent link to this record | |||||
Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
Title | A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy | Type | A1 Journal article | ||
Year | 2010 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 110 | Issue | 5 | Pages | 548-554 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Depth sectioning in high angular annular dark field scanning transmission electron microscopy is considered a candidate for three-dimensional characterization on the atomic scale. However at present the depth resolution is still far from the atomic level, due to strong limitations in the opening angle of the beam. In this paper we introduce a new, parameter based tomographic reconstruction algorithm that allows to make maximal use of the prior knowledge about the constituent atom types and the microscope settings, so as to retrieve the atomic positions and push the resolution to the atomic level in all three dimensions. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000279065700022 | Publication Date | 2009-09-21 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 16 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2010 IF: 2.063 | ||
Call Number | UA @ lucian @ c:irua:83690 | Serial | 2104 | ||
Permanent link to this record | |||||
Author | Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. | ||||
Title | Modification of the multislice method for calculating coherent STEM images | Type | A1 Journal article | ||
Year | 1995 | Publication | Physica status solidi: A: applied research | Abbreviated Journal | |
Volume | 150 | Issue | Pages | 13-22 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Berlin | Editor | ||
Language | Wos | A1995RQ21500002 | Publication Date | 2007-01-12 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0031-8965;1521-396X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 5 | Open Access | ||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:13292 | Serial | 2159 | ||
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Author | De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. | ||||
Title | On the interpretation of HREM images of partially ordered alloys | Type | A1 Journal article | ||
Year | 1995 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 60 | Issue | 2 | Pages | 265-282 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The ordering for 11/20 alloys has been studied by high-resolution electron microscopy (HREM). The distribution of the intensity maxima in the HREM image have been statistically examined, which provides a profound basis for the image interpretation. Processing of the HREM images allows ''dark-field'' images to be obtained, exhibiting a two-dimensional distribution of those columns which contain the most information in order to interpret the short-range order correlations. Pair correlations and higher cluster correlations between projected columns can be visualised, providing unique information about the ordering as retrieved from an experimental result without any other assumption. The method has been applied to Au4Cr and to Au4Mn to interpret the quenched short-range order state and the transition to long-range order. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | A1995TZ14700008 | Publication Date | 2002-07-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.436 | Times cited | 20 | Open Access | |
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:13014 | Serial | 2438 | ||
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Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. | ||||
Title | Optimal experimental design of STEM measurement of atom column positions | Type | A1 Journal article | ||
Year | 2002 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 90 | Issue | Pages | 273-289 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000174770900004 | Publication Date | 2002-07-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 35 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2002 IF: 1.772 | |||
Call Number | UA @ lucian @ c:irua:47517 | Serial | 2483 | ||
Permanent link to this record | |||||
Author | Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G. | ||||
Title | A peculiar diffraction effect in FCC crystals of C60 | Type | A1 Journal article | ||
Year | 1992 | Publication | Physica status solidi: A: applied research | Abbreviated Journal | |
Volume | 131 | Issue | Pages | 589-604 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Berlin | Editor | ||
Language | Wos | A1992JE20400030 | Publication Date | 2007-01-13 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0031-8965;1521-396X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 13 | Open Access | ||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:4371 | Serial | 2568 | ||
Permanent link to this record | |||||
Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J. | ||||
Title | Physical limits on atomic resolution | Type | A1 Journal article | ||
Year | 2004 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 10 | Issue | Pages | 153-157 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | 000188882100022 | Publication Date | 2004-08-11 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.891 | Times cited | 14 | Open Access | |
Notes | Approved | Most recent IF: 1.891; 2004 IF: 2.389 | |||
Call Number | UA @ lucian @ c:irua:47515 | Serial | 2616 | ||
Permanent link to this record | |||||
Author | Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. | ||||
Title | Plasmon holographic experiments: theoretical framework | Type | A1 Journal article | ||
Year | 2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 102 | Issue | 3 | Pages | 239-255 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | A theoretical framework is described to understand the results of plasmon holography experiments leading to insight in the meaning of the experimental results and pointing out directions for future experiments. The framework is based on the formalism of mutual intensity to describe how coherence is transferred through an optical system. For the inelastic interaction with the object, an expression for the volume. plasmon excitations in a free electron gas is used as a model for the behaviour of aluminium. The formalism leads to a clear graphical intuitive tool for under-standing the experiments. It becomes evident that the measured coherence is solely related to the angular distribution of the plasmon scattering in the case of bulk plasmons. After describing the framework, the special case of coherence outside a spherical particle is treated and the seemingly controversial idea of a plasmon with a limited coherence length obtained front experiments is clarified. (C) 2004 Elsevier B.V. All rights reserved. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000226436600010 | Publication Date | 2004-11-05 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 43 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | ||
Call Number | UA @ lucian @ c:irua:57133UA @ admin @ c:irua:57133 | Serial | 2643 | ||
Permanent link to this record | |||||
Author | Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. | ||||
Title | Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis | Type | A1 Journal article | ||
Year | 2003 | Publication | Institute of physics conference series | Abbreviated Journal | |
Volume | Issue | 180 | Pages | 19-22 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Semiconductor heterostructures are used for the fabrication of optoelectronic devices. Performance of such devices is governed by their chemical morphology. The composition distribution of quantum wells and dots is influenced by kinetic growth processes which are not understood completely at present. To obtain more information about these effects, methods for composition determination with a spatial resolution at a near atomic scale are necessary. In this paper we focus on the present state of the composition evaluation by the lattice fringe analysis (CELFA) technique and explain the basic ideas, optimum imaging conditions, precision and accuracy. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | 0000-00-00 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0-7503-0979-2 | ISBN | Additional Links | UA library record; WoS full record; | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:95118 | Serial | 2710 | ||
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Author | Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. | ||||
Title | Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy | Type | A1 Journal article | ||
Year | 2009 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 109 | Issue | 10 | Pages | 1236-1244 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this theory, a model is required describing the image contrast of the HAADF STEM images. Therefore, a simple, effective incoherent model has been assumed which takes the probe intensity profile into account. The scattered intensities can then be estimated by fitting this model to an experimental HAADF STEM image. These estimates are used as a performance measure to distinguish between different atomic column types and to identify the nature of unknown columns with good accuracy and precision using statistical hypothesis testing. The reliability of the method is supported by means of simulated HAADF STEM images as well as a combination of experimental images and electron energy-loss spectra. It is experimentally shown that statistically meaningful information on the composition of individual columns can be obtained even if the difference in averaged atomic number Z is only 3. Using this method, quantitative mapping at atomic resolution using HAADF STEM images only has become possible without the need of simultaneously recorded electron energy loss spectra. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000270015200004 | Publication Date | 2009-05-28 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 166 | Open Access | |
Notes | Fwo; Esteem 026019 | Approved | Most recent IF: 2.843; 2009 IF: 2.067 | ||
Call Number | UA @ lucian @ c:irua:78585UA @ admin @ c:irua:78585 | Serial | 2748 | ||
Permanent link to this record | |||||
Author | Van Aert, S.; van Dyck, D.; den Dekker, A.J. | ||||
Title | Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative | Type | A1 Journal article | ||
Year | 2006 | Publication | Optics express | Abbreviated Journal | Opt Express |
Volume | 14 | Issue | 9 | Pages | 3830-3839 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000237296200013 | Publication Date | 2006-05-04 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1094-4087; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 3.307 | Times cited | 45 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 3.307; 2006 IF: 4.009 | ||
Call Number | UA @ lucian @ c:irua:58262 | Serial | 2883 | ||
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Author | Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. | ||||
Title | Towards quantitative high resolution electron microscopy? | Type | A1 Journal article | ||
Year | 1995 | Publication | Institute of physics conference series | Abbreviated Journal | |
Volume | 147 | Issue | Pages | 67-72 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The basics of the interpretation of high resolution images showing detail of the order of 0.1 nm are shortly explained here. The use of a field emission source, a CCD camera and an adapted reconstruction method for restoring the projected crystal potential (focus variation method) allows a quantitative interpretation of HREM images. Examples of partially disordered alloys and carbonate ordering in high Tc superconductors are presented. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | London | Editor | ||
Language | Wos | A1995BE67F00014 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0-7503-0357-3; 0951-3248; 0305-2346 | ISBN | Additional Links | UA library record; WoS full record; | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:13015 | Serial | 3688 | ||
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Author | Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. | ||||
Title | Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp | Type | A1 Journal article | ||
Year | 1994 | Publication | MRS bulletin | Abbreviated Journal | Mrs Bull |
Volume | Issue | Pages | 57-59 | ||
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Pittsburgh, Pa | Editor | ||
Language | Wos | A1994PH66300015 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0883-7694 | ISBN | Additional Links | UA library record; WoS full record; | |
Impact Factor | 5.667 | Times cited | Open Access | ||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:9996 | Serial | 3821 | ||
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Author | Tsai, C.-Y.; Chang, Y.-C.; Lobato, I.; Van Dyck, D.; Chen, F.-R. | ||||
Title | Hollow Cone Electron Imaging for Single Particle 3D Reconstruction of Proteins | Type | A1 Journal article | ||
Year | 2016 | Publication | Scientific reports | Abbreviated Journal | Sci Rep-Uk |
Volume | 6 | Issue | 6 | Pages | 27701 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The main bottlenecks for high-resolution biological imaging in electron microscopy are radiation sensitivity and low contrast. The phase contrast at low spatial frequencies can be enhanced by using a large defocus but this strongly reduces the resolution. Recently, phase plates have been developed to enhance the contrast at small defocus but electrical charging remains a problem. Single particle cryo-electron microscopy is mostly used to minimize the radiation damage and to enhance the resolution of the 3D reconstructions but it requires averaging images of a massive number of individual particles. Here we present a new route to achieve the same goals by hollow cone dark field imaging using thermal diffuse scattered electrons giving about a 4 times contrast increase as compared to bright field imaging. We demonstrate the 3D reconstruction of a stained GroEL particle can yield about 13.5 A resolution but using a strongly reduced number of images. | ||||
Address | Department of Engineering and System Science, Tsing-Hua University, HsinChu 300, Taiwan | ||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | English | Wos | 000377670500001 | Publication Date | 2016-06-13 |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 2045-2322 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 4.259 | Times cited | Open Access | ||
Notes | D. Van Dyck acknowledges the financial support from the Fund for Scientific Research – Flanders (FWO) under Project nos. VF04812N and G.0188.08. F. R. Chen would like to thank the support from NSC 101-2221-E-007- 063-MY3 and MOST 104-2321-B-007-004. We are grateful for the use of the Tecnai F20 in the Cryo-EM Core Facility, Department of Academic Affairs and Instrument Service at Academia Sinica. | Approved | Most recent IF: 4.259 | ||
Call Number | c:irua:134038 | Serial | 4087 | ||
Permanent link to this record | |||||
Author | Lobato, I.; Van Dyck, D. | ||||
Title | MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA | Type | A1 Journal article | ||
Year | 2015 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 156 | Issue | 156 | Pages | 9-17 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The main features and the GPU implementation of the MULTEM program are presented and described. This new program performs accurate and fast multislice simulations by including higher order expansion of the multislice solution of the high energy Schrodinger equation, the correct subslicing of the three-dimensional potential and top-bottom surfaces. The program implements different kinds of simulation for CTEM, STEM, ED, PED, CBED, ADF-TEM and ABF-HC with proper treatment of the spatial and temporal incoherences. The multislice approach described here treats the specimen as amorphous material which allows a straightforward implementation of the frozen phonon approximation. The generalized transmission function for each slice is calculated when is needed and then discarded. This allows us to perform large simulations that can include millions of atoms and keep the computer memory requirements to a reasonable level. (C) 2015 Elsevier B.V. All rights reserved. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000361001800003 | Publication Date | 2015-04-28 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 32 | Open Access | |
Notes | Approved | Most recent IF: 2.843; 2015 IF: 2.436 | |||
Call Number | UA @ lucian @ c:irua:127848 | Serial | 4209 | ||
Permanent link to this record | |||||
Author | Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. | ||||
Title | How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? | Type | A1 Journal article | ||
Year | 2017 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 181 | Issue | 181 | Pages | 134-143 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | In this paper, we investigate how precise atoms of a small nanocluster can ultimately be located in three dimensions (3D) from a tilt series of images acquired using annular dark field (ADF) scanning transmission electron microscopy (STEM). Therefore, we derive an expression for the statistical precision with which the 3D atomic position coordinates can be estimated in a quantitative analysis. Evaluating this statistical precision as a function of the microscope settings also allows us to derive the optimal experimental design. In this manner, the optimal angular tilt range, required electron dose, optimal detector angles, and number of projection images can be determined. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000411170800016 | Publication Date | 2016-12-15 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 3 | Open Access | OpenAccess |
Notes | The authors acknowledge financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative. Reference No. 312483-ESTEEM2. The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0374.13N, G.0369.15N, G.0368.15N, and WO.010.16N) and a post-doctoral grant to A. De Backer, and from the DFG under contract No. RO-2057/4-2. | Approved | Most recent IF: 2.843 | ||
Call Number | EMAT @ emat @ c:irua:144432 | Serial | 4618 | ||
Permanent link to this record | |||||
Author | Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. | ||||
Title | Ni cluster formation in low temperature annealed Ni50.6Ti49.4 | Type | A1 Journal article | ||
Year | 2017 | Publication | Functional materials letters | Abbreviated Journal | Funct Mater Lett |
Volume | 10 | Issue | 10 | Pages | 1740005 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Various low temperature treatments of Ni50.6Ti49.4 have shown an unexpected effect on the martensitic start temperature. Periodic diffuse intensity distributions in reciprocal space indicate the formation of short pure Ni strings along the <111> directions in the B2 ordered lattice, precursing the formation of Ni4Ti3 precipitates formed at higher annealing temperatures. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000395164100006 | Publication Date | 2017-01-10 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1793-6047 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.234 | Times cited | 4 | Open Access | Not_Open_Access |
Notes | The authors like to thank the Flemish Science Foundation FWO for financial support under project G.0366.15N “Influence of nano- and microstructural features and defects in fine-grained Ni-Ti on the thermal and mechanical reversibility of the martensitic transformation and the shape memory and superelastic behavior”. We are also very grateful to Prof. Dr. Jan Van Humbeeck for initiating this work, for his continuous support and inspiring discussions. | Approved | Most recent IF: 1.234 | ||
Call Number | EMAT @ emat @ c:irua:142545 | Serial | 4619 | ||
Permanent link to this record | |||||
Author | Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. | ||||
Title | Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution | Type | A1 Journal article | ||
Year | 2022 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 233 | Issue | Pages | 113425 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | We report a study of scattering dynamics in crystals employing momentum-resolved scanning transmission electron microscopy under varying illumination conditions. As we perform successive changes of the probe focus, multiple real-space signals are obtained in dependence of the shape of the incident electron wave. With support from extensive simulations, each signal is shown to be characterised by an optimum focus for which the contrast is maximum and which differs among different signals. For instance, a systematic focus mismatch is found between images formed by high-angle scattering, being sensitive to thickness and chemical composition, and the first moment in diffraction space, being sensitive to electric fields. It follows that a single recording at one specific probe focus is usually insufficient to characterise materials comprehensively. Most importantly, we demonstrate in experiment and simulation that the second moment ( |
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Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000734396800009 | Publication Date | 2021-11-13 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.2 | Times cited | Open Access | OpenAccess | |
Notes | We thank Dr. Florian Winkler for valuable discussions and experimental work at the early stages of this study. This work was supported by the Initiative and Network Fund of the Helmholtz Association (Germany) under contracts VH-NG-1317 and ZT-I-0025. This project furthermore received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (grant agreement No. 770887). | Approved | Most recent IF: 2.2 | ||
Call Number | EMAT @ emat @c:irua:184833 | Serial | 6898 | ||
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Author | Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. | ||||
Title | Advanced electron crystallography through model-based imaging | Type | A1 Journal article | ||
Year | 2016 | Publication | IUCrJ | Abbreviated Journal | Iucrj |
Volume | 3 | Issue | 3 | Pages | 71-83 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab; Engineering Management (ENM) | ||||
Abstract | The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000368590900010 | Publication Date | 2015-11-13 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 2052-2525; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 5.793 | Times cited | 30 | Open Access | OpenAccess |
Notes | The authors gratefully acknowledge the Research Foundation Flanders (FWO, Belgium) for funding and for a PhD grant to ADB. The research leading to these results has received funding from the European Union 7th Framework Program (FP7/20072013) under grant agreement No. 312483 (ESTEEM2). SB and GVT acknowledge the European Research Council under the 7th Framework Program (FP7), ERC grant No. 335078 – COLOURATOMS and ERC grant No. 246791 – COUNTATOMS.; esteem2jra2; ECASSara; (ROMEO:green; preprint:; postprint:can ; pdfversion:can); | Approved | Most recent IF: 5.793 | ||
Call Number | c:irua:129589 c:irua:129589 | Serial | 3965 | ||
Permanent link to this record |