Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Celik, N.; Čevik, U.; Celik, A.; Koz, B. |
Natural and artificial radioactivity measurements in Eastern Black Sea region of Turkey |
2009 |
Journal of hazardous materials |
162 |
|
UA library record; WoS full record; WoS citing articles |
Damla, N.; Čevik, U.; Kobya, A.I.; Celik, A.; Celik, N.; Van Grieken, R. |
Radiation dose estimation and mass attenuation coefficients of cement samples used in Turkey |
2010 |
Journal of hazardous materials |
176 |
|
UA library record; WoS full record; WoS citing articles |
Alvarado-Alvarado, A.A.; Smets, W.; Irga, P.; Denys, S. |
Engineering green wall botanical biofiltration to abate indoor volatile organic compounds : a review on mechanisms, phyllosphere bioaugmentation, and modeling |
2024 |
Journal of hazardous materials |
465 |
|
UA library record |
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. |
An alternative approach for ζ-factor measurement using pure element nanoparticles |
2016 |
Ultramicroscopy |
164 |
19 |
UA library record; WoS full record; WoS citing articles |
Lobato, I.; Van Aert, S.; Verbeeck, J. |
Progress and new advances in simulating electron microscopy datasets using MULTEM |
2016 |
Ultramicroscopy |
168 |
43 |
UA library record; WoS full record; WoS citing articles |
Béché, A.; Juchtmans, R.; Verbeeck, J. |
Efficient creation of electron vortex beams for high resolution STEM imaging |
2017 |
Ultramicroscopy |
178 |
30 |
UA library record; WoS full record; WoS citing articles |
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
Goris, B.; Meledina, M.; Turner, S.; Zhong, Z.; Batenburg, K.J.; Bals, S. |
Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomography |
2016 |
Ultramicroscopy |
171 |
13 |
UA library record; WoS full record; WoS citing articles |
Kirilenko, D.A.; Brunkov, P.N. |
Measuring the height-to-height correlation function of corrugation in suspended graphene |
2016 |
Ultramicroscopy |
165 |
3 |
|
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design |
2016 |
Ultramicroscopy |
170 |
6 |
UA library record; WoS full record; WoS citing articles |
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2016 |
Ultramicroscopy |
171 |
43 |
UA library record; WoS full record; WoS citing articles |
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. |
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy |
2018 |
Ultramicroscopy |
187 |
4 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. |
Locating light and heavy atomic column positions with picometer precision using ISTEM |
2016 |
Ultramicroscopy |
172 |
8 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |
Alania, M.; Altantzis, T.; De Backer, A.; Lobato, I.; Bals, S.; Van Aert, S. |
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure |
2016 |
Ultramicroscopy |
177 |
13 |
UA library record; WoS full record; WoS citing articles |
Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. |
An alternative approach for \zeta-factor measurement using pure element nanoparticles |
2016 |
Ultramicroscopy |
164 |
19 |
UA library record; WoS full record; WoS citing articles |
Zhong, Z.; Goris, B.; Schoenmakers, R.; Bals, S.; Batenburg, K.J. |
A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEM |
2017 |
Ultramicroscopy |
174 |
26 |
UA library record; WoS full record; WoS citing articles |
Zhuge, X.; Jinnai, H.; Dunin-Borkowski, R.E.; Migunov, V.; Bals, S.; Cool, P.; Bons, A.-J.; Batenburg, K.J. |
Automated discrete electron tomography – Towards routine high-fidelity reconstruction of nanomaterials |
2017 |
Ultramicroscopy |
175 |
22 |
UA library record; WoS full record; WoS citing articles |
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. |
Dark field electron holography for strain measurement |
2011 |
Ultramicroscopy |
111 |
31 |
UA library record; WoS full record; WoS citing articles |
Stefan Löffler; Matthieu Bugnet; Nicolas Gauquelin; Sorin Lazar; Elias Assmann; Karsten Held; Gianluigi A. Botton; Peter Schattschneider |
Real-space mapping of electronic orbitals |
2017 |
Ultramicroscopy |
177 |
|
UA library record |
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. |
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? |
2017 |
Ultramicroscopy |
181 |
3 |
UA library record; WoS full record; WoS citing articles |
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. |
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques |
2017 |
Ultramicroscopy |
181 |
34 |
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Hybrid statistics-simulations based method for atom-counting from ADF STEM images |
2017 |
Ultramicroscopy |
177 |
8 |
UA library record; WoS full record; WoS citing articles |
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
Zhong, Z.; Aveyard, R.; Rieger, B.; Bals, S.; Palenstijn, W.J.; Batenburg, K.J. |
Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions |
2018 |
Ultramicroscopy |
184 |
8 |
UA library record; WoS full record; WoS citing articles |
Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. |
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement |
2018 |
Ultramicroscopy |
184 |
|
UA library record; WoS full record; WoS citing articles |
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |