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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Yu, C.-P. |
Novel imaging methods of transmission electron microscopy based on electron beam scattering and modulation |
2023 |
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UA library record |
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Lubk, A.; Vogel, K.; Wolf, D.; Krehl, J.; Röder, F.; Clark, L.; Guzzinati, G.; Verbeeck, J. |
Fundamentals of Focal Series Inline Electron Holography |
2016 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics / Hawkes, P.W. [edit.] |
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UA library record |
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Van Tendeloo, G. |
Art, science and sustainability = Kunst, wetenschap en duurzaamheid |
2016 |
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UA library record |
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Croitoru, M.D.; Shanenko, A.A.; Peeters, F.M. |
Tuning the superconducting properties of nanomaterials |
2009 |
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UA library record; WoS full record |
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Idrissi, H.; Schryvers, D. |
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization |
2012 |
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UA library record |
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Schryvers, D.; Van Aert, S. |
High-resolution visualization techniques : structural aspects |
2012 |
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UA library record |
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Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
2008 |
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UA library record |
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Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
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UA library record |
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Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
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UA library record |
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Schryvers, D.; Tanner, L.E. |
On the phase-like nature of the 7M structure in Ni-Al |
1994 |
Ecomaterials |
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Vlasov, I.I.; Turner, S.; Van Tendeloo, G.; Shiryaev, A.A. |
Recent results on characterization of detonation nanodiamonds |
2012 |
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UA library record |
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Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Atom column detection |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Atom counting |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Efficient fitting algorithm |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
General conclusions and future perspectives |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Image-quality evaluation and model selection with maximum a posteriori probability |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Introduction |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Statistical parameter estimation theory : principles and simulation studies |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
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UA library record |
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Bals, S.; Stes, A.; Celis, V. |
Klassieke toetsing in de praktijk |
2009 |
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UA library record |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
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UA library record |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Handbook of microscopy: applications in materials science, solid-state physics and chemistry |
1997 |
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UA library record |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
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Vávra, O.; Gaži, S.; Golubović, D.S.; Vávra, I.; Dérer, J.; Verbeeck, J.; Van Tendeloo, G.; Moshchalkov, V.V. |
0 and π phase Josephson coupling through an insulating barrier with magnetic impurities |
2006 |
Physical review : B : condensed matter and materials physics |
74 |
27 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. |
Advanced electron microscopy for advanced materials |
2012 |
Advanced materials |
24 |
107 |
UA library record; WoS full record; WoS citing articles |
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Lentijo-Mozo, S.; Tan, R.P.; Garcia-Marcelot, C.; Altantzis, T.; Fazzini, P.F.; Hungria, T.; Cormary, B.; Gallagher, J.R.; Miller, J.T.; Martinez, H.; Schrittwieser, S.; Schotter, J.; Respaud, M.; Bals, S.; Van Tendeloo, G.; Gatel, C.; Soulantica, K. |
Air- and water-resistant noble metal coated ferromagnetic cobalt nanorods |
2015 |
ACS nano |
9 |
25 |
UA library record; WoS full record; WoS citing articles |
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Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. |
An alternative approach to determine attainable resolution directly from HREM images |
2013 |
Ultramicroscopy |
133 |
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UA library record; WoS full record |
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Pfannmöller, M.; Heidari, H.; Nanson, L.; Lozman, O.R.; Chrapa, M.; Offermans, T.; Nisato, G.; Bals, S. |
Quantitative Tomography of Organic Photovoltaic Blends at the Nanoscale |
2015 |
Nano letters |
15 |
26 |
UA library record; WoS full record; WoS citing articles |
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de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. |
Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations |
2013 |
Ultramicroscopy |
134 |
48 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S. |
Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld |
2011 |
Chemie magazine |
7 |
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UA library record |
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