Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Wang, H.; Cuppens, J.; Biermans, E.; Bals, S.; Fernandez-Ballester, L.; Kvashnina, K.O.; Bras, W.; van Bael, M.J.; Temst, K.; Vantomme, A. |
Tuning of the size and the lattice parameter of ion-beam synthesized Pb nanoparticles embedded in Si |
2012 |
Journal of physics: D: applied physics |
45 |
5 |
UA library record; WoS full record; WoS citing articles |
Monticelli, O.; Musina, Z.; Russo, S.; Bals, S. |
On the use of TEM in the characterization of nanocomposites |
2007 |
Materials letters |
61 |
28 |
UA library record; WoS full record; WoS citing articles |
Avila-Brande, D.; Otero-Díaz, L.C.; Landa-Cánovas, A.R.; Bals, S.; Van Tendeloo, G. |
A new Bi4Mn1/3W2/3O8Cl Sillén-Aurivillius intergrowth: synthesis and structural characterisation by quantitative transmission electron microscopy |
2006 |
European journal of inorganic chemistry |
|
12 |
UA library record; WoS full record; WoS citing articles |
Loreto, S.; Vanrompay, H.; Mertens, M.; Bals, S.; Meynen, V. |
The influence of acids on tuning the pore size of mesoporous TiO2 templated by non-ionic block copolymers |
2018 |
European journal of inorganic chemistry |
2018 |
6 |
UA library record; WoS full record; WoS citing articles |
Jain, N.; Hao, Y.; Parekh, U.; Kaltenegger, M.; Pedrazo-Tardajos, A.; Lazzaroni, R.; Resel, R.; Geerts, Y.H.; Bals, S.; Van Aert, S. |
Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals |
2023 |
Micron |
169 |
1 |
UA library record; WoS full record; WoS citing articles |
Krsmanovic, R.; Bals, S.; Bertoni, G.; Van Tendeloo, G. |
Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics |
2008 |
Optical materials |
30 |
12 |
UA library record; WoS full record; WoS citing articles |
De Backer, A.; Bals, S.; Van Aert, S. |
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection |
2023 |
Ultramicroscopy |
|
3 |
UA library record; WoS full record; WoS citing articles |
De Schutter, B.; Van Stiphout, K.; Santos, N.M.; Bladt, E.; Jordan-Sweet, J.; Bals, S.; Lavoie, C.; Comrie, C.M.; Vantomme, A.; Detavernier, C. |
Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111) |
2016 |
Journal of applied physics |
119 |
14 |
UA library record; WoS full record; WoS citing articles |
Geenen, F.A.; van Stiphout, K.; Nanakoudis, A.; Bals, S.; Vantomme, A.; Jordan-Sweet, J.; Lavoie, C.; Detavernier, C. |
Controlling the formation and stability of ultra-thin nickel silicides : an alloying strategy for preventing agglomeration |
2018 |
Journal of applied physics |
123 |
23 |
UA library record; WoS full record; WoS citing articles |
Bals, S.; Goris, B.; Altantzis, T.; Heidari, H.; Van Aert, S.; Van Tendeloo, G. |
Seeing and measuring in 3D with electrons |
2014 |
Comptes rendus : physique |
15 |
15 |
UA library record; WoS full record; WoS citing articles |
Turner, S.; Tavernier, S.M.F.; Huyberechts, G.; Bals, S.; Batenburg, K.J.; Van Tendeloo, G. |
Assisted spray pyrolysis production and characterisation of ZnO nanoparticles with narrow size distribution |
2010 |
Journal of nanoparticle research |
12 |
27 |
UA library record; WoS full record; WoS citing articles |
Skorikov, A.; Batenburg, K.J.; Bals, S. |
Analysis of 3D elemental distribution in nanomaterials : towards higher throughput and dose efficiency |
2023 |
Journal of microscopy |
289 |
2 |
UA library record; WoS full record; WoS citing articles |
Leroux, O.; Leroux, F.; Bagniewska-Zadworna,.; Knox, J.P.; Claeys, M.; Bals, S.; Viane, R.L.L. |
Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales) |
2011 |
Micron |
42 |
20 |
UA library record; WoS full record; WoS citing articles |
De Meyer, R.; Albrecht, W.; Bals, S. |
Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM |
2021 |
Micron |
144 |
|
UA library record; WoS full record |
Altantzis, T.; Zanaga, D.; Bals, S. |
Advanced electron tomography of nanoparticle assemblies |
2017 |
Europhysics letters |
119 |
8 |
UA library record; WoS full record; WoS citing articles |
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. |
Annular dark-field transmission electron microscopy for low contrast materials |
2013 |
Microscopy and microanalysis |
19 |
5 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. |
Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
|
UA library record |
Bals, S.; Radmilovic, V.; Kisielowski, C. |
TEM annular objective apertures fabricated by FIB |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts |
2010 |
Microscopy and microanalysis |
16 |
42 |
UA library record; WoS full record; WoS citing articles |
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. |
Towards quantitative EDX results in 3 dimensions |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. |
Wet-STEM tomography : principles, potentialities and limitations |
2014 |
Microscopy and microanalysis |
20 |
9 |
UA library record; WoS full record; WoS citing articles |
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
De Schutter, B.; Devulder, W.; Schrauwen, A.; van Stiphout, K.; Perkisas, T.; Bals, S.; Vantomme, A.; Detavernier, C. |
Phase formation in intermixed NiGe thin films : influence of Ge content and low-temperature nucleation of hexagonal nickel germanides |
2014 |
Microelectronic engineering |
120 |
9 |
UA library record; WoS full record; WoS citing articles |
Montoya, E.; Bals, S.; Van Tendeloo, G. |
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam |
2008 |
Journal of microscopy |
231 |
|
UA library record; WoS full record |
Martin, É.; Gossuin, Y.; Bals, S.; Kavak, S.; Vuong, Q.L. |
Monte Carlo simulations of the magnetic behaviour of iron oxide nanoparticle ensembles: taking size dispersion, particle anisotropy, and dipolar interactions into account |
2022 |
European physical journal : B : condensed matter and complex systems |
95 |
|
UA library record; WoS full record |
Bals, S.; Kabius, B.; Haider, M.; Radmilovic, V.; Kisielowski, C. |
Annular dark field imaging in a TEM |
2004 |
Solid state communications |
130 |
43 |
UA library record; WoS full record; WoS citing articles |