| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Atom counting |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
| de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Efficient fitting algorithm |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
| de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
General conclusions and future perspectives |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
| Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Image-quality evaluation and model selection with maximum a posteriori probability |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
| de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Introduction |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
| de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
| de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Statistical parameter estimation theory : principles and simulation studies |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
| Arslan Irmak, E.; Liu, P.; Bals, S.; Van Aert, S. |
3D Atomic Structure of Supported Metallic Nanoparticles Estimated from 2D ADF STEM Images: A Combination of Atom – Counting and a Local Minima Search Algorithm |
2021 |
Small methods |
|
12 |
UA library record; WoS full record; WoS citing articles |
| Zheng, Y.-R.; Vernieres, J.; Wang, Z.; Zhang, K.; Hochfilzer, D.; Krempl, K.; Liao, T.-W.; Presel, F.; Altantzis, T.; Fatermans, J.; Scott, S.B.; Secher, N.M.; Moon, C.; Liu, P.; Bals, S.; Van Aert, S.; Cao, A.; Anand, M.; Nørskov, J.K.; Kibsgaard, J.; Chorkendorff, I. |
Monitoring oxygen production on mass-selected iridium–tantalum oxide electrocatalysts |
2021 |
Nature Energy |
|
95 |
UA library record; WoS full record; WoS citing articles |
| De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L. |
Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm |
2022 |
N P J Computational Materials |
8 |
|
UA library record; WoS full record; WoS citing articles |
| Lobato, I.; Friedrich, T.; Van Aert, S. |
Deep convolutional neural networks to restore single-shot electron microscopy images |
2024 |
N P J Computational Materials |
10 |
|
UA library record; WoS full record |
| van Dyck, D.; Van Aert, S.; Croitoru, M. |
Atomic resolution electron tomography: a dream? |
2006 |
International journal of materials research |
97 |
6 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H. |
Dedicated TEM on domain boundaries from phase transformations and crystal growth |
2013 |
Phase transitions |
86 |
|
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. |
Functional twin boundaries |
2013 |
Phase transitions |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
| Lu, J.; Martinez, G.T.; Van Aert, S.; Schryvers, D. |
Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy |
2014 |
Physica status solidi: B: basic research |
251 |
2 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
|
UA library record |
| van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
| van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
|
UA library record |
| Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
| Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
| Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
2004 |
Micron |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Goris, B.; Altantzis, T.; Heidari, H.; Van Aert, S.; Van Tendeloo, G. |
Seeing and measuring in 3D with electrons |
2014 |
Comptes rendus : physique |
15 |
15 |
UA library record; WoS full record; WoS citing articles |
| Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
| De wael, A.; De Backer, A.; Van Aert, S. |
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations |
2020 |
Ultramicroscopy |
219 |
|
UA library record; WoS full record; WoS citing articles |
| Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. |
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution |
2022 |
Ultramicroscopy |
233 |
|
UA library record; WoS full record; WoS citing articles |
| Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. |
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors |
2022 |
Ultramicroscopy |
242 |
|
UA library record; WoS full record; WoS citing articles |
