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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Nord, M.; Verbeeck, J. |
Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis |
2019 |
Microscopy And Microanalysis |
25 |
|
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Deshmukh, S.; Sankaran, K.J.; Srinivasu, K.; Korneychuk, S.; Banerjee, D.; Barman, A.; Bhattacharya, G.; Phase, D.M.; Gupta, M.; Verbeeck, J.; Leou, K.C.; Lin, I.N.; Haenen, K.; Roy, S.S. |
Local probing of the enhanced field electron emission of vertically aligned nitrogen-doped diamond nanorods and their plasma illumination properties |
2018 |
Diamond and related materials |
83 |
9 |
UA library record; WoS full record; WoS citing articles |
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Lubk, A.; Vogel, K.; Wolf, D.; Krehl, J.; Röder, F.; Clark, L.; Guzzinati, G.; Verbeeck, J. |
Fundamentals of Focal Series Inline Electron Holography |
2016 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics / Hawkes, P.W. [edit.] |
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UA library record |
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Moshnyaga, V.; Damaschke, B.; Shapoval, O.; Belenchuk, A.; Faupel, J.; Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Mücksch, M.; Tsurkan, V.; Tidecks, R.; Samwer, K. |
Corrigendum: Structural phase transition at the percolation threshold in epitaxial (La0.7Ca0.3MnO3)1-x:(MgO)x nanocomposite films |
2005 |
Nature materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
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Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
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Lu, Y.-G.; Verbeeck, J.; Turner, S.; Hardy, A.; Janssens, S.D.; De Dobbelaere, C.; Wagner, P.; Van Bael, M.K.; Van Tendeloo, G. |
Analytical TEM study of CVD diamond growth on TiO2 sol-gel layers |
2012 |
Diamond and related materials |
23 |
16 |
UA library record; WoS full record; WoS citing articles |
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Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. |
Prospects for versatile phase manipulation in the TEM : beyond aberration correction |
2015 |
Ultramicroscopy |
151 |
19 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Tian, H.; Béché, A. |
A new way of producing electron vortex probes for STEM |
2012 |
Ultramicroscopy |
113 |
62 |
UA library record; WoS full record; WoS citing articles |
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Schattschneider, P.; Löffler, S.; Stöger-Pollach, M.; Verbeeck, J. |
Is magnetic chiral dichroism feasible with electron vortices? |
2014 |
Ultramicroscopy |
136 |
64 |
UA library record; WoS full record; WoS citing articles |
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Janssens, K.; van der Snickt, G.; Vanmeert, F.; Legrand, S.; Nuyts, G.; Alfeld, M.; Monico, L.; Anaf, W.; de Nolf, W.; Vermeulen, M.; Verbeeck, J.; De Wael, K. |
Non-invasive and non-destructive examination of artistic pigments, paints, and paintings by means of X-Ray methods |
2016 |
Topics in Current Chemistry |
374 |
50 |
UA library record; WoS full record; WoS citing articles |
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Psilodimitrakopoulos, S.; Orekhov, A.; Mouchliadis, L.; Jannis, D.; Maragkakis, G.M.; Kourmoulakis, G.; Gauquelin, N.; Kioseoglou, G.; Verbeeck, J.; Stratakis, E. |
Optical versus electron diffraction imaging of Twist-angle in 2D transition metal dichalcogenide bilayers |
2021 |
npj 2D Materials and Applications |
5 |
4 |
UA library record; WoS full record; WoS citing articles |
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Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. |
Exploring possibilities of band gap measurement with off-axis EELS in TEM |
2018 |
Ultramicroscopy |
189 |
7 |
UA library record; WoS full record; WoS citing articles |
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van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. |
Locating light and heavy atomic column positions with picometer precision using ISTEM |
2016 |
Ultramicroscopy |
172 |
8 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Bertoni, G. |
Model-based quantification of EELS spectra: treating the effect of correlated noise |
2008 |
Ultramicroscopy |
108 |
16 |
UA library record; WoS full record; WoS citing articles |
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Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. |
Demonstration of a 2 × 2 programmable phase plate for electrons |
2018 |
Ultramicroscopy |
190 |
73 |
UA library record; WoS full record; WoS citing articles |
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Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
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Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
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Lamas, J.S.; Leroy, W.P.; Lu, Y.-G.; Verbeeck, J.; Van Tendeloo, G.; Depla, D. |
Using the macroscopic scale to predict the nano-scale behavior of YSZ thin films |
2014 |
Surface and coatings technology |
238 |
8 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Béché, A.; van den Broek, W. |
A holographic method to measure the source size broadening in STEM |
2012 |
Ultramicroscopy |
120 |
29 |
UA library record; WoS full record; WoS citing articles |
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Lichtert, S.; Verbeeck, J. |
Statistical consequences of applying a PCA noise filter on EELS spectrum images |
2013 |
Ultramicroscopy |
125 |
54 |
UA library record; WoS full record; WoS citing articles |
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Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. |
Focused electron beam induced deposition as a tool to create electron vortices |
2015 |
Micron |
80 |
21 |
UA library record; WoS full record; WoS citing articles |
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Krause, F.F.; Ahl, J.P.; Tytko, D.; Choi, P.P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D.; Hertkorn, J.; Engl, K.; Rosenauer, A. |
Homogeneity and composition of AlInGaN : a multiprobe nanostructure study |
2015 |
Ultramicroscopy |
156 |
11 |
UA library record; WoS full record; WoS citing articles |
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Van Rompaey, S.; Dachraoui, W.; Turner, S.; Podyacheva, O.Y.; Tan, H.; Verbeeck, J.; Abakumov, A.; Hadermann, J. |
Layered oxygen vacancy ordering in Nb-doped SrCo1-xFexO3-\delta perovskite |
2013 |
Zeitschrift für Kristallographie |
228 |
9 |
UA library record; WoS full record; WoS citing articles |
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Béché, A.; Van Boxem, R.; Van Tendeloo, G.; Verbeeck, J. |
Magnetic monopole field exposed by electrons |
2014 |
Nature physics |
10 |
131 |
UA library record; WoS full record; WoS citing articles |
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Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C. |
Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing |
2018 |
Micron |
115 |
9 |
UA library record; WoS full record; WoS citing articles |
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Tan, H.; Verbeeck, J.; Abakumov, A.; Van Tendeloo, G. |
Oxidation state and chemical shift investigation in transition metal oxides by EELS |
2012 |
Ultramicroscopy |
116 |
413 |
UA library record; WoS full record; WoS citing articles |
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Schattschneider, P.; Schachinger, T.; Verbeeck, J. |
Ein Whirlpool aus Elektronen: Transmissions-Elektronenmikroskopie mit Elektronenwirbeln |
2018 |
Physik in unserer Zeit |
49 |
|
UA library record |
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Schattschneider, P.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Hell, J.; Verbeeck, J. |
Sub-nanometer free electrons with topological charge |
2012 |
Ultramicroscopy |
115 |
24 |
UA library record; WoS full record; WoS citing articles |
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