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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Cai, H.; Kang, J.; Sahin, H.; Chen, B.; Suslu, A.; Wu, K.; Peeters, F.; Meng, X.; Tongay, S. |
Exciton pumping across type-I gallium chalcogenide heterojunctions |
2016 |
Nanotechnology |
27 |
15 |
UA library record; WoS full record; WoS citing articles |
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Oueslati, S.; Brammertz, G.; Buffiere, M.; ElAnzeery, H.; Touayar, O.; Koeble, C.; Bekaert, J.; Meuris, M.; Poortmans, J. |
Physical and electrical characterization of high-performance Cu2ZnSnSe4 based thin film solar cells |
2015 |
Thin solid films : an international journal on the science and technology of thin and thick films |
582 |
49 |
UA library record; WoS full record; WoS citing articles |
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Vanhellemont, J.; Romano-Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A. |
Point defect reactions in silicon studies in situ by high flux electron irradiation in high voltage transmission electron microscope |
1995 |
Materials science and technology |
11 |
7 |
UA library record; WoS full record; WoS citing articles |
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Woo, S.Y.; Gauquelin, N.; Nguyen, H.P.T.; Mi, Z.; Botton, G.A. |
Interplay of strain and indium incorporation in InGaN/GaN dot-in-a-wire nanostructures by scanning transmission electron microscopy |
2015 |
Nanotechnology |
26 |
19 |
UA library record; WoS full record; WoS citing articles |
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Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. |
The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography |
2011 |
Semiconductor science and technology |
26 |
|
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
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Tomak, A.; Bacaksiz, C.; Mendirek, G.; Sahin, H.; Hur, D.; Gorgun, K.; Senger, R.T.; Birer, O.; Peeters, F.M.; Zareie, H.M. |
Structural changes in a Schiff base molecular assembly initiated by scanning tunneling microscopy tip |
2016 |
Nanotechnology |
27 |
2 |
UA library record; WoS full record; WoS citing articles |
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Van Havenbergh, K.; Turner, S.; Marx, N.; Van Tendeloo, G. |
The mechanical behavior during (de)lithiation of coated silicon nanoparticles as anode material for lithium-ion batteries studied by InSitu transmission electron microscopy |
2016 |
Energy technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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Kiymaz, D.; Yagmurcukardes, M.; Tomak, A.; Sahin, H.; Senger, R.T.; Peeters, F.M.; Zareie, H.M.; Zafer, C. |
Controlled growth mechanism of poly (3-hexylthiophene) nanowires |
2016 |
Nanotechnology |
27 |
24 |
UA library record; WoS full record; WoS citing articles |
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Heyne, M.H.; de Marneffe, J.-F.; Delabie, A.; Caymax, M.; Neyts, E.C.; Radu, I.; Huyghebaert, C.; De Gendt, S. |
Two-dimensional WS2 nanoribbon deposition by conversion of pre-patterned amorphous silicon |
2017 |
Nanotechnology |
28 |
13 |
UA library record; WoS full record; WoS citing articles |
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Petrovic, M.D.; Milovanović, S.P.; Peeters, F.M. |
Scanning gate microscopy of magnetic focusing in graphene devices : quantum versus classical simulation |
2017 |
Nanotechnology |
28 |
7 |
UA library record; WoS full record; WoS citing articles |
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Stafford, B.H.; Sieger, M.; Ottolinger, R.; Meledin, A.; Strickland, N.M.; Wimbush, S.C.; Van Tendeloo, G.; Huehne, R.; Schultz, L. |
Tilted BaHfO3 nanorod artificial pinning centres in REBCO films on inclined substrate deposited-MgO coated conductor templates |
2017 |
Superconductor science and technology |
30 |
6 |
UA library record; WoS full record; WoS citing articles |
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Zebrowski, D.P.; Peeters, F.M.; Szafran, B. |
Driven spin transitions in fluorinated single- and bilayer-graphene quantum dots |
2017 |
Semiconductor science and technology |
32 |
|
UA library record; WoS full record |
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Li, L.L.; Moldovan, D.; Xu, W.; Peeters, F.M. |
Electric-and magnetic-field dependence of the electronic and optical properties of phosphorene quantum dots |
2017 |
Nanotechnology |
28 |
32 |
UA library record; WoS full record; WoS citing articles |
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Jiang, Y.; Mao, J.; Moldovan, D.; Masir, M.R.; Li, G.; Watanabe, K.; Taniguchi, T.; Peeters, F.M.; Andrei, E.Y. |
Tuning a circular p-n junction in graphene from quantum confinement to optical guiding |
2017 |
Nature nanotechnology |
12 |
65 |
UA library record; WoS full record; WoS citing articles |
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Loo, R.; Arimura, H.; Cott, D.; Witters, L.; Pourtois, G.; Schulze, A.; Douhard, B.; Vanherle, W.; Eneman, G.; Richard, O.; Favia, P.; Mitard, J.; Mocuta, D.; Langer, R.; Collaert, N. |
Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures |
2018 |
ECS journal of solid state science and technology |
7 |
5 |
UA library record; WoS full record; WoS citing articles |
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Zhang, R.; Wu, Z.; Li, X.J.; Li, L.L.; Chen, Q.; Li, Y.-M.; Peeters, F.M. |
Fano resonances in bilayer phosphorene nanoring |
2018 |
Nanotechnology |
29 |
4 |
UA library record; WoS full record; WoS citing articles |
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Aierken, Y.; Sevik, C.; Gulseren, O.; Peeters, F.M.; Çakir, D. |
In pursuit of barrierless transition metal dichalcogenides lateral heterojunctions |
2018 |
Nanotechnology |
29 |
4 |
UA library record; WoS full record; WoS citing articles |
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Hu, S.; Gopinadhan, K.; Rakowski, A.; Neek-Amal, M.; Heine, T.; Grigorieva, I.V.; Haigh, S.J.; Peeters, F.M.; Geim, A.K.; Lozada-Hidalgo, M. |
Transport of hydrogen isotopes through interlayer spacing in van der Waals crystals |
2018 |
Nature nanotechnology |
13 |
32 |
UA library record; WoS full record; WoS citing articles |
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Dhayalan, S.K.; Kujala, J.; Slotte, J.; Pourtois, G.; Simoen, E.; Rosseel, E.; Hikavyy, A.; Shimura, Y.; Loo, R.; Vandervorst, W. |
On the evolution of strain and electrical properties in as-grown and annealed Si:P epitaxial films for source-drain stressor applications |
2018 |
ECS journal of solid state science and technology |
7 |
4 |
UA library record; WoS full record; WoS citing articles |
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Dabral, A.; Pourtois, G.; Sankaran, K.; Magnus, W.; Yu, H.; de de Meux, A.J.; Lu, A.K.A.; Clima, S.; Stokbro, K.; Schaekers, M.; Collaert, N.; Horiguchi, N.; Houssa, M. |
Study of the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations |
2018 |
ECS journal of solid state science and technology |
7 |
2 |
UA library record; WoS full record; WoS citing articles |
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Heyne, M.H.; de Marneffe, J.-F.; Radu, I.; Neyts, E.C.; De Gendt, S. |
Thermal recrystallization of short-range ordered WS2 films |
2018 |
Journal of vacuum science and technology: A: vacuum surfaces and films |
36 |
2 |
UA library record; WoS full record; WoS citing articles |
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Pahlke, P.; Sieger, M.; Ottolinger, R.; Lao, M.; Eisterer, M.; Meledin, A.; Van Tendeloo, G.; Haenisch, J.; Holzapfel, B.; Schultz, L.; Nielsch, K.; Huehne, R. |
Influence of artificial pinning centers on structural and superconducting properties of thick YBCO films on ABAD-YSZ templates |
2018 |
Superconductor science and technology |
31 |
9 |
UA library record; WoS full record; WoS citing articles |
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Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals |
1996 |
The journal of imaging science and technology |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
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Jacques, P.; Verbist, K.; Lapin, J.; Ryelandt, L.; Van Tendeloo, G.; Delannay, F. |
Critical assessment of the process of growth of a YBa2Cu3O7-\delta layer on Y2BaCuO5 |
1996 |
Superconductor science and technology |
9 |
1 |
UA library record; WoS full record; WoS citing articles |
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Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R.; Naessens, G.; Duvigneaud, P.H.; Verbist, K.; Van Tendeloo, G. |
Structural properties of Zn-substituted epitaxial YBa2Cu3O7-\delta thin films |
1996 |
Superconductor science and technology |
9 |
7 |
UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Low- or high-angle Ar ion-beam etching to create ramp-type Josephson junctions |
1996 |
Superconductor science and technology |
9 |
10 |
UA library record; WoS full record; WoS citing articles |
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van Cleempoel, A.; Gijbels, R.; Zhu, D.; Claeys, M.; Richter, H.; Fonseca, A. |
Quantitative determination of C60 and C70 in soot extracts by high performance liquid chromatography and mass spectrometric characterization |
1996 |
Fullerene science and technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views |
1997 |
The journal of imaging science and technology |
41 |
1 |
UA library record; WoS full record; WoS citing articles |
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Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, S. |
Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications |
1997 |
Superconductor science and technology |
10 |
2 |
UA library record; WoS full record; WoS citing articles |
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