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Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. |
Effect of amorphous layers on the interpretation of restored exit waves |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. |
Advanced electron crystallography through model-based imaging |
2016 |
IUCrJ |
3 |
30 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. |
Procedure to count atoms with trustworthy single-atom sensitivity |
2013 |
Physical review : B : condensed matter and materials physics |
87 |
106 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
High-resolution electron microscopy : from imaging toward measuring |
2002 |
IEEE transactions on instrumentation and measurement |
51 |
13 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
2004 |
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13 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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UA library record |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
2004 |
Micron |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
High-resolution electron microscopy and electron tomography: resolution versus precision |
2002 |
Journal of structural biology |
138 |
33 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2008 |
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UA library record |
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Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2007 |
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UA library record |
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Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. |
Electron channelling based crystallography |
2007 |
Ultramicroscopy |
107 |
32 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. |
Functional twin boundaries |
2013 |
Phase transitions |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Salje, E.K.H. |
Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy |
2012 |
Advanced materials |
24 |
150 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; van Dyck, D. |
Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? |
2001 |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
81 |
11 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
2006 |
Optics express |
14 |
45 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
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Van Alphen, S. |
Modelling plasma reactors for sustainable CO2 conversion and N2 fixation |
2023 |
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UA library record |
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Van Alphen, S.; Ahmadi Eshtehardi, H.; O'Modhrain, C.; Bogaerts, J.; Van Poyer, H.; Creel, J.; Delplancke, M.-P.; Snyders, R.; Bogaerts, A. |
Effusion nozzle for energy-efficient NOx production in a rotating gliding arc plasma reactor |
2022 |
Chemical Engineering Journal |
443 |
|
UA library record; WoS full record; WoS citing articles |
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Van Alphen, S.; Hecimovic, A.; Kiefer, C.K.; Fantz, U.; Snyders, R.; Bogaerts, A. |
Modelling post-plasma quenching nozzles for improving the performance of CO2 microwave plasmas |
2023 |
Chemical engineering journal |
462 |
|
UA library record; WoS full record; WoS citing articles |
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Van Alphen, S.; Hecimovic, A.; Kiefer, C.K.; Fantz, U.; Snyders, R.; Bogaerts, A. |
Modelling post-plasma quenching nozzles for improving the performance of CO2 microwave plasmas |
2023 |
Chemical engineering journal |
462 |
|
UA library record; WoS full record; WoS citing articles |
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Van Alphen, S.; Jardali, F.; Creel, J.; Trenchev, G.; Snyders, R.; Bogaerts, A. |
Sustainable gas conversion by gliding arc plasmas: a new modelling approach for reactor design improvement |
2021 |
Sustainable energy & fuels |
5 |
|
UA library record; WoS full record; WoS citing articles |
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Van Alphen, S.; Slaets, J.; Ceulemans, S.; Aghaei, M.; Snyders, R.; Bogaerts, A. |
Effect of N2 on CO2-CH4 conversion in a gliding arc plasmatron: Can this major component in industrial emissions improve the energy efficiency? |
2021 |
Journal Of Co2 Utilization |
54 |
|
UA library record; WoS full record; WoS citing articles |
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Van Alphen, S.; Vermeiren, V.; Butterworth, T.; van den Bekerom, D.C.M.; van Rooij, G.J.; Bogaerts, A. |
Power Pulsing To Maximize Vibrational Excitation Efficiency in N2Microwave Plasma: A Combined Experimental and Computational Study |
2020 |
Journal Of Physical Chemistry C |
124 |
|
UA library record; WoS full record; WoS citing articles |
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van Alsenoy, V.; Bernard, P.; Van Grieken, R. |
Elemental concentrations and heavy metal pollution in sediments and suspended matter from the Belgian North Sea and the Scheldt estuary |
1993 |
The science of the total environment |
133 |
|
UA library record; WoS full record; WoS citing articles |
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