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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
|
UA library record |
|
|
|
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. |
EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure |
2009 |
Microscopy and microanalysis |
15 |
55 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. |
Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire |
2009 |
Microscopy and microanalysis |
15 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
|
UA library record |
|
|
|
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts |
2010 |
Microscopy and microanalysis |
16 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. |
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study |
2011 |
Microscopy and microanalysis |
17 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
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Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
|
|
|
van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. |
Annular dark-field transmission electron microscopy for low contrast materials |
2013 |
Microscopy and microanalysis |
19 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. |
Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy |
2014 |
Microscopy and microanalysis |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieten, E.; Caen, J.; Schryvers, D. |
Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record; WoS full record; WoS citing articles |
|
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|
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. |
Towards quantitative EDX results in 3 dimensions |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
|
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. |
Wet-STEM tomography : principles, potentialities and limitations |
2014 |
Microscopy and microanalysis |
20 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
|
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. |
The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements |
2015 |
Microscopy and microanalysis |
21 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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|
Penders, A.; Konstantinovic, M.J.; Bosch, R.W.; Schryvers, D. |
Crack initiation in tapered high Si stainless steel specimens : stress threshold analyses |
2020 |
Corrosion Engineering Science And Technology |
|
1 |
UA library record; WoS full record; WoS citing articles |
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Missen, O.P.; Mills, S.J.; Canossa, S.; Hadermann, J.; Nenert, G.; Weil, M.; Libowitzky, E.; Housley, R.M.; Artner, W.; Kampf, A.R.; Rumsey, M.S.; Spratt, J.; Momma, K.; Dunstan, M.A. |
Polytypism in mcalpineite : a study of natural and synthetic Cu₃TeO₆ |
2022 |
Acta Crystallographica. Section B: Structural Science, Crystal Engineering and Materials (Online) |
78 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Cui, W.; Hu, Z.-Y.; Unocic, R.R.; Van Tendeloo, G.; Sang, X. |
Atomic defects, functional groups and properties in MXenes |
2021 |
Chinese Chemical Letters |
32 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Papageorgiou, D.G.; Filippousi, M.; Pavlidou, E.; Chrissafis, K.; Van Tendeloo, G.; Bikiaris, D. |
Effect of clay modification on structureproperty relationships and thermal degradation kinetics of \beta-polypropylene/clay composite materials |
2015 |
Journal of thermal analysis and calorimetry |
122 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Altantzis, T.; Zanaga, D.; Bals, S. |
Advanced electron tomography of nanoparticle assemblies |
2017 |
Europhysics letters |
119 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. |
Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties |
2018 |
Europhysics letters |
122 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Shanenko, A.A.; Croitoru, M.D.; Peeters, F.M. |
Quantum-size effects on T-c in superconducting nanofilms |
2006 |
Europhysics letters |
76 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Das, P.; Koblischka, M.R.; Turner, S.; Van Tendeloo, G.; Wolf, T.; Jirsa, M.; Hartmann, U. |
Direct observation of nanometer-scale pinning sites in (Nd0.33Eu0.20Gd0.47)Ba2Cu3O7-\delta single crystals |
2008 |
Europhysics letters |
83 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Boxem, R.; Verbeeck, J.; Partoens, B. |
Spin effects in electron vortex states |
2013 |
Europhysics letters |
102 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Samal, D.; Tan, H.; Takamura, Y.; Siemons, W.; Verbeeck, J.; Van Tendeloo, G.; Arenholz, E.; Jenkins, C.A.; Rijnders, G.; Koster, G. |
Direct structural and spectroscopic investigation of ultrathin films of tetragonal CuO: Six-fold coordinated copper |
2014 |
Europhysics letters |
105 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
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Antipov, E.V.; Khasanova, N.R.; Pshirkov, J.S.; Putilin, S.N.; Bougerol, C.; Lebedev, O.I.; Van Tendeloo, G.; Baranov, A.N.; Park, Y.W. |
The superconducting bismuth-based mixed oxides |
2002 |
Current applied physics
T2 – QTSM and QFS 02 Symposium, MAY 08-10, 2002, SEOUL, SOUTH KOREA |
2 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
2017 |
Micron |
94 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C. |
Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing |
2018 |
Micron |
115 |
9 |
UA library record; WoS full record; WoS citing articles |
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