| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Samae, V.; Cordier, P.; Demouchy, S.; Bollinger, C.; Gasc, J.; Koizumi, S.; Mussi, A.; Schryvers, D.; Idrissi, H. |
Stress-induced amorphization triggers deformation in the lithospheric mantle |
2021 |
Nature |
591 |
|
UA library record; WoS full record; WoS citing articles |
| Tirry, W.; Schryvers, D. |
Linking a completely three-dimensional nanostrain to a structural transformation eigenstrain |
2009 |
Nature materials |
8 |
53 |
UA library record; WoS full record; WoS citing articles |
| Colla, M.-S.; Amin-Ahmadi, B.; Idrissi, H.; Malet, L.; Godet, S.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. |
Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing |
2015 |
Nature communications |
6 |
34 |
UA library record; WoS full record; WoS citing articles |
| Schouteden, K.; Amin-Ahmadi, B.; Li, Z.; Muzychenko, D.; Schryvers, D.; Van Haesendonck, C. |
Electronically decoupled stacking fault tetrahedra embedded in Au(111) films |
2016 |
Nature communications |
7 |
7 |
UA library record; WoS full record; WoS citing articles |
| Samaee, V.; Dupraz, M.; Pardoen, T.; VAn Swygenhoven, H.; Schryvers, D.; Idrissi, H. |
Deciphering the interactions between single arm dislocation sources and coherent twin boundary in nickel bi-crystal |
2021 |
Nature Communications |
12 |
|
UA library record; WoS full record; WoS citing articles |
| Yandouzi, M.; Toth, L.; Schryvers, D. |
High resolution transmission electron microscopy study of nanoscale Ni-rich Ni-Al films evaporated onto NaCl and KCl |
1998 |
Nanostructured materials |
10 |
2 |
UA library record; WoS full record; WoS citing articles |
| Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. |
Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp |
1994 |
MRS bulletin |
|
|
UA library record; WoS full record; |
| Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. |
Internal calibration technique for HREM studies of nanoscale particles |
1993 |
Microscopy research and technique
T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM |
25 |
1 |
UA library record; WoS full record; WoS citing articles |
| Zelaya, E.; Schryvers, D. |
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite |
2011 |
Microscopy research and technique |
74 |
2 |
UA library record; WoS full record; WoS citing articles |
| Goessens, C.; Schryvers, D.; van Landuyt, J. |
Transmission electron microscopy studies of (111) twinned silver halide microcrystals |
1998 |
Microscopy research and technique |
42 |
8 |
UA library record; WoS full record; WoS citing articles |
| Pourbabak, S.; Orekhov, A.; Schryvers, D. |
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires |
2020 |
Microscopy Research And Technique |
|
|
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
| Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. |
Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy |
2014 |
Microscopy and microanalysis |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
| Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. |
Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire |
2009 |
Microscopy and microanalysis |
15 |
15 |
UA library record; WoS full record; WoS citing articles |
| Grieten, E.; Caen, J.; Schryvers, D. |
Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record; WoS full record; WoS citing articles |
| Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. |
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study |
2011 |
Microscopy and microanalysis |
17 |
25 |
UA library record; WoS full record; WoS citing articles |
| Heidari, H.; Rivero, G.; Idrissi, H.; Ramachandran, D.; Cakir, S.; Egoavil, R.; Kurttepeli, M.; Crabbé, A.C.; Hauffman, T.; Terryn, H.; Du Prez, F.; Schryvers, D. |
Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy |
2016 |
Microscopy and microanalysis |
22 |
2 |
UA library record; WoS full record; WoS citing articles |
| Yang, Z.; Schryvers, D. |
Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy |
2006 |
Micron |
37 |
10 |
UA library record; WoS full record; WoS citing articles |
| Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
2017 |
Micron |
94 |
11 |
UA library record; WoS full record; WoS citing articles |
| Pittarello, L.; Ji, G.; Yamaguchi, A.; Schryvers, D.; Debaille, V.; Claeys, P. |
From olivine to ringwoodite : a TEM study of a complex process |
2015 |
Meteoritics and Planetary Science |
50 |
8 |
UA library record; WoS full record; WoS citing articles |
| Akamine, H.; Mitsuhara, M.; Nishida, M.; Samaee, V.; Schryvers, D.; Tsukamoto, G.; Kunieda, T.; Fujii, H. |
Precipitation behaviors in Ti-2.3 Wt Pct Cu alloy during isothermal and two-step aging |
2021 |
Metallurgical And Materials Transactions A-Physical Metallurgy And Materials Science |
52 |
|
UA library record; WoS full record |
| Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. |
Some examples of electron microscopy studies of microstructures and phase transitions in solids |
1995 |
Meccanica |
30 |
1 |
UA library record; WoS full record; WoS citing articles |
| Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. |
Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp |
2018 |
Materials |
11 |
15 |
UA library record; WoS full record; WoS citing articles |
| Zelaya, E.; Schryvers, D. |
FCC surface precipitation in Cu-Zn-Al after low angle GA+ ion irradiation |
2010 |
Materials transactions |
51 |
2 |
UA library record; WoS full record; WoS citing articles |
| Santamarta, R.; Schryvers, D. |
Microstructure of a partially crystallised Ti50Ni25Cu25 melt-spun ribbon |
2003 |
Materials transactions |
44 |
23 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Potapov, P.L. |
R-phase structure refinement using electron diffraction data |
2002 |
Materials transactions |
43 |
25 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; de Saegher, B.; van Landuyt, J. |
Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al |
1991 |
Materials research bulletin |
26 |
11 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Ma, Y. |
In-situ TEM study of the Ni5Al3 to B2 + L12 decomposition in Ni65Al35 |
1995 |
Materials letters |
23 |
5 |
UA library record; WoS full record; WoS citing articles |
| Zhou, C.; Ji, G.; Chen, Z.; Wang, M.; Addad, A.; Schryvers, D.; Wang, H. |
Fabrication, interface characterization and modeling of oriented graphite flakes/Si/Al composites for thermal management applications |
2014 |
Materials and design |
63 |
61 |
UA library record; WoS full record; WoS citing articles |
