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Author Pourbabak, S.; Orekhov, A.; Schryvers, D. pdf  url
doi  openurl
  Title Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires Type A1 Journal article
  Year (down) 2020 Publication Microscopy Research And Technique Abbreviated Journal Microsc Res Techniq  
  Volume Issue Pages 1-7  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract A method to prepare TEM specimens from metallic microwires and based on conventional twin-jet electropolishing is introduced. The wire is embedded in an opaque epoxy resin medium and the hardened resin is mechanically polished to reveal the wire on both sides. The resin containing wire is then cut into discs of the appropriate size. The obtained embedded wire is electropolished in a conventional twin-jet electropolishing machine until electron transparency in large areas without radiation damage is achieved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000567944200001 Publication Date 2020-09-28  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910x ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.5 Times cited Open Access OpenAccess  
  Notes ; Fonds Wetenschappelijk Onderzoek, Grant/Award Number: G.0366.15N ; Approved Most recent IF: 2.5; 2020 IF: 1.147  
  Call Number UA @ admin @ c:irua:171969 Serial 6642  
Permanent link to this record
 
 
Author Bertoni, G.; Verbeeck, J.; Brosens, F. pdf  doi
openurl 
  Title Fitting the momentum dependent loss function in EELS Type A1 Journal article
  Year (down) 2011 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 74 Issue 3 Pages 212-218  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Theory of quantum systems and complex systems  
  Abstract Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000288095200002 Publication Date 2010-07-06  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.147 Times cited 6 Open Access  
  Notes Fwo; Esteem; Iap; Goa Approved Most recent IF: 1.147; 2011 IF: 1.792  
  Call Number UA @ lucian @ c:irua:88782UA @ admin @ c:irua:88782 Serial 1222  
Permanent link to this record
 
 
Author Zelaya, E.; Schryvers, D. pdf  doi
openurl 
  Title Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite Type A1 Journal article
  Year (down) 2011 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 74 Issue 1 Pages 84-91  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000285976000012 Publication Date 2010-05-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.147 Times cited 2 Open Access  
  Notes Approved Most recent IF: 1.147; 2011 IF: 1.792  
  Call Number UA @ lucian @ c:irua:85994 Serial 2852  
Permanent link to this record
 
 
Author Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. pdf  doi
openurl 
  Title Evaluation of top, angle, and side cleaned FIB samples for TEM analysis Type A1 Journal article
  Year (down) 2007 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 70 Issue 12 Pages 1060-1071  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract ITEM specimens of a LaAlO3/SrTiO3 multilayer are prepared by FIB with internal lift out. Using a Ga+1 beam of 5 kV, a final cleaning step yielding top, top-angle, side, and bottom-angle cleaning is performed. Different cleaning procedures, which can be easily implemented in a dual beam FIB system, are described and compared; all cleaning types produce thin lamellae, useful for HRTEM and HAADF-STEM work up to atomic resolution. However, the top cleaned lamellae are strongly affected by the curtain effect. Top-angle cleaned specimens show an amorphous layer of around 5 nm at the specimen surfaces, due to damage and redeposition. Furthermore, it is observed that the LaAlO3 layers are preferentially destroyed and transformed into amorphous material, during the thinning process.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000251868200008 Publication Date 2007-08-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.147 Times cited 36 Open Access  
  Notes Aip; Fwo Approved Most recent IF: 1.147; 2007 IF: 1.644  
  Call Number UA @ lucian @ c:irua:67282 Serial 1090  
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Author Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S. doi  openurl
  Title Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques Type A1 Journal article
  Year (down) 1998 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 42 Issue 2 Pages 108-122  
  Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000075521300005 Publication Date 2002-09-10  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.147 Times cited 4 Open Access  
  Notes Approved Most recent IF: 1.147; 1998 IF: 0.765  
  Call Number UA @ lucian @ c:irua:24907 Serial 398  
Permanent link to this record
 
 
Author Goessens, C.; Schryvers, D.; van Landuyt, J. doi  openurl
  Title Transmission electron microscopy studies of (111) twinned silver halide microcrystals Type A1 Journal article
  Year (down) 1998 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 42 Issue Pages 85-99  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000075521300003 Publication Date 2002-08-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.147 Times cited 8 Open Access  
  Notes Approved Most recent IF: 1.147; 1998 IF: 0.765  
  Call Number UA @ lucian @ c:irua:29676 Serial 3713  
Permanent link to this record
 
 
Author Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Babu, T.G.N.; Greaves, C.; Hervieu, M.; Michel, C.; Raveau, B. pdf  doi
openurl 
  Title Structural investigations of recently discovered high Tc superconductors Type A1 Journal article
  Year (down) 1995 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 30 Issue Pages 102-122  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos A1995QH52800002 Publication Date 2005-02-23  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.154 Times cited 4 Open Access  
  Notes Approved MATERIALS SCIENCE, MULTIDISCIPLINARY 135/271 Q2 # PHYSICS, APPLIED 70/145 Q2 # PHYSICS, CONDENSED MATTER 40/67 Q3 #  
  Call Number UA @ lucian @ c:irua:13307 Serial 3241  
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Author De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. pdf  doi
openurl 
  Title The study of partially ordered 11/20 alloys by HREM Type A1 Journal article
  Year (down) 1993 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 25 Issue Pages 169-170  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos A1993LB60700007 Publication Date 2005-02-23  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record  
  Impact Factor 1.154 Times cited Open Access  
  Notes Approved PHYSICS, APPLIED 28/145 Q1 #  
  Call Number UA @ lucian @ c:irua:6785 Serial 3331  
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Author Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. pdf  doi
openurl 
  Title Internal calibration technique for HREM studies of nanoscale particles Type A1 Journal article
  Year (down) 1993 Publication Microscopy research and technique T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM Abbreviated Journal Microsc Res Techniq  
  Volume 25 Issue 2 Pages 185-186  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos A1993LB60700015 Publication Date 2005-02-23  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.154 Times cited 1 Open Access  
  Notes Approved no  
  Call Number UA @ lucian @ c:irua:104488 Serial 1700  
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