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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Ghidelli, M.; Orekhov, A.; Bassi, A.L.; Terraneo, G.; Djemia, P.; Abadias, G.; Nord, M.; Béché, A.; Gauquelin, N.; Verbeeck, J.; Raskin, J.-p.; Schryvers, D.; Pardoen, T.; Idrissi, H. |
Novel class of nanostructured metallic glass films with superior and tunable mechanical properties |
2021 |
Acta Materialia |
|
27 |
UA library record; WoS full record; WoS citing articles |
|
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Ding, L.; Raskin, J.-P.; Lumbeeck, G.; Schryvers, D.; Idrissi, H. |
TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates |
2020 |
Materials Characterization |
161 |
|
UA library record; WoS full record; WoS citing articles |
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Idrissi, H.; Ghidelli, M.; Béché, A.; Turner, S.; Gravier, S.; Blandin, J.-J.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. |
Atomic-scale viscoplasticity mechanisms revealed in high ductility metallic glass films |
2019 |
Scientific reports |
9 |
|
UA library record; WoS full record; WoS citing articles |
|
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Ghidelli, M.; Idrissi, H.; Gravier, S.; Blandin, J.-J.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. |
Homogeneous flow and size dependent mechanical behavior in highly ductile Zr 65 Ni 35 metallic glass films |
2017 |
Acta materialia |
131 |
42 |
UA library record; WoS full record; WoS citing articles |
|
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van der Rest, A.; Idrissi, H.; Henry, F.; Favache, A.; Schryvers, D.; Proost, J.; Raskin, J.-P.; Van Overmeere, Q.; Pardoen, T. |
Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films |
2017 |
Acta materialia |
125 |
5 |
UA library record; WoS full record; WoS citing articles |
|
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Pardoen, T.; Colla, M.-S.; Idrissi, H.; Amin-Ahmadi, B.; Wang, B.; Schryvers, D.; Bhaskar, U.K.; Raskin, J.-P. |
A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects |
2016 |
Comptes rendus : physique |
17 |
7 |
UA library record; WoS full record; WoS citing articles |
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Tang, X.; Reckinger, N.; Poncelet, O.; Louette, P.; Urena, F.; Idrissi, H.; Turner, S.; Cabosart, D.; Colomer, J.-F.; Raskin, J.-P.; Hackens, B.; Francis, L.A. |
Damage evaluation in graphene underlying atomic layer deposition dielectrics |
2015 |
Scientific reports |
5 |
18 |
UA library record; WoS full record; WoS citing articles |
|
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Colla, M.-S.; Amin-Ahmadi, B.; Idrissi, H.; Malet, L.; Godet, S.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. |
Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing |
2015 |
Nature communications |
6 |
34 |
UA library record; WoS full record; WoS citing articles |
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Idrissi, H.; Kobler, A.; Amin-Ahmadi, B.; Coulombier, M.; Galceran, M.; Raskin, J.-P.; Godet, S.; Kuebel, C.; Pardoen, T.; Schryvers, D. |
Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing |
2014 |
Applied physics letters |
104 |
24 |
UA library record; WoS full record; WoS citing articles |
|
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Colla, M.-S.; Wang, B.; Idrissi, H.; Schryvers, D.; Raskin, J.-P.; Pardoen, T. |
High strength-ductility of thin nanocrystalline palladium films with nanoscale twins : on-chip testing and grain aggregate model |
2012 |
Acta materialia |
60 |
38 |
UA library record; WoS full record; WoS citing articles |
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Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. |
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study |
2011 |
Microscopy and microanalysis |
17 |
25 |
UA library record; WoS full record; WoS citing articles |
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