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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links  |
Links |
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Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. |
Investigation of the electron distribution functions in low pressure electron cyclotron resonance discharges |
1999 |
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UA library record; WoS full record; |
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van Vaeck, L.; Adriaens, A.; Gijbels, R. |
Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation |
1999 |
Mass spectrometry reviews |
18 |
112 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Perret, J.; Fompeyrine, J.; Loquet, J.-P.; Van Tendeloo, G. |
Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Nihoul, G.; Leroux, C.; Cesari, C.; Van Tendeloo, G. |
Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.-U. |
HREM investigation of La1-xCaxMnO3- thin films |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Verbist, K.; Tafuri, F.; Miletto Granozio, F.; di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45° twist grain boundaries in YBa2Cu3O7- |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. |
Characterization of MO derived nanostructured titania powders |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Lebedev, O.I.; Van Tendeloo, G.; Abakumov, A.M.; Shpanchenko, R.V.; Rozova, M.G.; Antipov, E.V. |
Structure of Y123 and Y247 fluorinated phases by HREM |
1998 |
Electron microscopy: vol. 3 |
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UA library record; WoS full record; |
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Van Tendeloo, G.; Richard, O.; Schuddinck, W.; Hervieu, M. |
Fine structure of CMR perovskites by HREM and CBEM |
1998 |
Electron microscopy: vol. 1 |
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UA library record; WoS full record; |
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Salje, E.K.H.; Buckley, A.; Van Tendeloo, G.; Ishibashi, Y.; Nord, G.L. |
Needle twins and right-angled twins in minerals: comparison between experiment and theory |
1998 |
The American mineralogist |
83 |
43 |
UA library record; WoS full record; WoS citing articles |
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Joutsensaari, J.; Kauppinen, E.I.; Bernaerts, D.; Van Tendeloo, G. |
Crystal growth studies during aerosol synthesis of nanostructured fullerene particles |
1998 |
Materials Research Society symposium proceedings |
520 |
1 |
UA library record; WoS full record; WoS citing articles |
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Ahonen, P.P.; Kauppinen, E.I.; Deschanvres, J.L.; Joubert, J.C.; Van Tendeloo, G. |
Preparation of nanocrystalline titania powder by aerosol pyrolysis of titanium alkoxide |
1998 |
Materials Research Society symposium proceedings |
520 |
2 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Perret, J.; Fompeyrine, J.; Van Tendeloo, G.; Loquet, J.-P. |
Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE |
1998 |
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UA library record; WoS full record; |
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van Landuyt, J.; Van Tendeloo, G. |
HREM for characterisation of nanoscale microstructures |
1998 |
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UA library record |
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de Meester, R.H.J.; Peeters, F.M. |
Non monotonic behavior of the energy levels of quantum wells with a large mass mismatch in the presence of an in-plane magnetic field |
1999 |
Journal of physics : condensed matter |
11 |
3 |
UA library record; WoS full record; WoS citing articles |
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Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
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UA library record |
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Lamoen, D.; March, N.H. |
Gradient expansion and beyond for stress tensor and tangential pressure deficit through a planar liquid-vapour interface |
2000 |
Physics And Chemistry Of Liquids |
38 |
1 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A. |
Glow discharge mass spectrometry, methods |
2000 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Modeling of radio-frequency and direct current glow discharges in argon |
2000 |
Journal of technical physics |
41 |
|
UA library record |
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Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
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UA library record |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
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UA library record; WoS full record; |
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Nikolaev, A.V.; Michel, K.H.; Copley, J.R.D. |
Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides |
1999 |
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UA library record |
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Helm, M.; Hilber, W.; Strasser, G.; de Meester, R.; Peeters, F.M. |
Minibands and Wannier-Strak ladders in semiconductor superlattices studied by infrared spectroscopy |
1999 |
Brazilian journal of physics |
29 |
6 |
UA library record; WoS full record; WoS citing articles |
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Riva, C.; Peeters, F.M.; Varga, K. |
Excitons and charged excitons in quantum wells |
2000 |
Physica status solidi: A: applied research |
178 |
12 |
UA library record; WoS full record; WoS citing articles |
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van Roy, W.; van Vaeck, L.; Gijbels, R. |
Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis |
1992 |
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UA library record |
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Misko, V.R.; Fomin, V.M.; Devreese, J.T.; Moshchalkov, V.V. |
On the Ginzburg-Landau analysis of a mixed s-dx2-y2-wave superconducting mesoscopic square |
2000 |
Solid State Communications |
114 |
2 |
UA library record; WoS full record; WoS citing articles |
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Xu, W.; Peeters, F.M.; Devreese, J.T. |
Warm-electron transport in a two-dimensional semiconductor |
1992 |
Semiconductor science and technology |
7 |
3 |
UA library record; WoS full record; WoS citing articles |
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Hadermann, J.; Abakumov, A.M.; Van Tendeloo, G.; Shpanchenko, R.V.; Oleinikov, P.N.; Antipov, E.V. |
Anion ordering in fluorinated La2CuO4 |
1999 |
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UA library record; WoS full record; |
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Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
On the mechanism of {111}-defect formation in silicon studies by in situ electrin irradiation in a high resolution electron microscope |
1998 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
77 |
23 |
UA library record; WoS full record; WoS citing articles |
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