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  Author Title (up) Year Publication Volume Times cited Additional Links Links
Van Grieken, R. 2014 Award for best referee of X-Ray Spectrometry 2014 X-ray spectrometry 43 UA library record; WoS full record doi
Markowicz, A.; Storms, H.; Van Grieken, R. A simple absorption correction for electron probe X-ray microanalysis of bulk samples 1986 X-ray spectrometry 15 UA library record; WoS full record; WoS citing articles doi
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. Analysis of X-ray spectra by iterative least squares (AXIL): new developments 1994 X-ray spectrometry 23 UA library record; WoS full record; WoS citing articles doi
Kuczumov, A.; Vekemans, B.; Schalm, O.; Vincze, L.; Dorriné, W.; Gysels, K.; Van Grieken, R. Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation 1999 X-ray spectrometry 28 UA library record; WoS full record; WoS citing articles doi
Godoi, R.H.M.; Potgieter-Vermaak, S.; Godoi, A.F.L.; Stranger, M.; Van Grieken, R. Assessment of aerosol particles within the Rubens' House Museum in Antwerp, Belgium 2008 X-ray spectrometry 37 UA library record; WoS full record; WoS citing articles doi
Van Dyck, P.; Van Grieken, R. Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution 1983 X-ray spectrometry 12 UA library record; WoS full record doi
Vekemans, B.; Janssens, K.; Vincze, L.; Aerts, A.; Adams, F.; Hertogen, J. Automated segmentation of μ-XRF image sets 1997 X-ray spectrometry 26 UA library record; WoS full record; WoS citing articles
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal 1980 X-ray spectrometry 9 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R. Awards for best referees of X-ray Spectrometry 2014 X-ray spectrometry 43 UA library record doi
Proost, K.; Vincze, L.; Janssens, K.; Gao, N.; Bulska, E.; Schreiner, M.; Falkenberg, G. Characterization of a polycapillary lens for use in micro-XANES experiments 2003 X-ray spectrometry 32 50 UA library record; WoS full record; WoS citing articles doi
van der Linden, V.; Schalm, O.; Houbraken, J.; Thomas, M.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Janssens, K. Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries 2010 X-ray spectrometry 39 8 UA library record; WoS full record; WoS citing articles doi
Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M. Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer 2002 X-ray spectrometry 31 12 UA library record; WoS full record; WoS citing articles doi
Cagno, S.; van der Snickt, G.; Legrand, S.; Caen, J.; Patin, M.; Meulebroeck, W.; Dirkx, Y.; Hillen, M.; Steenackers, G.; Rousaki, A.; Vandenabeele, P.; Janssens, K. Comparison of four mobile, non‐invasive diagnostic techniques for differentiating glass types in historical leaded windows : MA‐XRF , UV–Vis–NIR, Raman spectroscopy and IRT 2020 X-Ray Spectrometry UA library record; WoS full record; WoS citing articles url doi
Cabal, A.; Schalm, O.; Eyskens, P.; Willems, P.; Harth, A.; van Espen, P. Comparison of x-ray absorption and emission techniques for the investigation of paintings 2015 X-ray spectrometry 44 UA library record; WoS full record; WoS citing articles pdf doi
Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. Component selection for a compact micro-XRF spectrometer 2001 X-ray spectrometry 30 33 UA library record; WoS full record; WoS citing articles doi
Worobiec, A.; Stefaniak, E.A.; Kiro, S.; Oprya, M.; Bekshaev, A.; Spolnik, Z.; Potgieter-Vermaak, S.S.; Ennan, A.; Van Grieken, R. Comprehensive microanalytical study of welding aerosols with x-ray and Raman based methods 2007 X-ray spectrometry 36 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R.; Markowicz, A.; Veny, P. Current trends in the literature on X-ray emission spectrometry 1991 X-ray spectrometry 20 UA library record; WoS full record; WoS citing articles doi
Labrecque, J.J.; Beusen, J.M.; Van Grieken, R.E. Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis 1986 X-ray spectrometry 15 UA library record; WoS full record; WoS citing articles doi
Araujo, M.F.; van Espen, P.; Van Grieken, R. Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation 1990 X-ray spectrometry 19 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R. Editorial : award for best X-Ray Spectrometry referee during 2011-2012 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Van Grieken, R. Editorial : introducing Dr Markowicz as X-Ray Spectrometry's new associate editor for Europe 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Van Grieken, R. Editorial: Award for best XRS referee during 2007-2008 2008 X-ray spectrometry 37 UA library record; WoS full record doi
Belikov, K.N.; Mikhailova, L.I.; Spolnik, Z.M.; Van Grieken, R. EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials 2006 X-ray spectrometry 35 UA library record; WoS full record; WoS citing articles doi
Injuk, J.; van Malderen, H.; Van Grieken, R.; Swietlicki, E.; Knox, J.M.; Schofield, R. EDXRS study of aerosol composition variations in air masses crossing the North Sea 1993 X-ray spectrometry 22 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Szegedi, S.; Varga, K.; Braun, M.; Osán, J.; Van Grieken, R. Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
Muia, L.M.; Van Grieken, R. Energy-dispersive X-ray fluorescence analysis of geological materials in borax beads using Tertian's binary coefficient approach combined with internal standard addition 1991 X-ray spectrometry 20 UA library record
Civici, N.; Van Grieken, R. Energy-dispersive X-ray fluorescence in geochemical mapping 1997 X-ray spectrometry 26 UA library record; WoS full record; WoS citing articles doi
Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments 2004 X-ray spectrometry 33 13 UA library record; WoS full record; WoS citing articles pdf doi
Markowicz, A.; Storms, H.; Van Grieken, R. Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples 1986 X-ray spectrometry 15 UA library record; WoS full record; WoS citing articles doi
Osán, J.; de Hoog, J.; van Espen, P.; Szalóki, I.; Ro, C.-U.; Van Grieken, R. Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
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