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	Author	Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M.
	Title	Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer			Type	A1 Journal article
	Year	2002	Publication	X-ray spectrometry	Abbreviated Journal	X-Ray Spectrom
	Volume	31	Issue	1	Pages	87-91
	Keywords	A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000173653400016	Publication Date	2002-10-06
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0049-8246	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	1.298	Times cited	12	Open Access
	Notes				Approved	Most recent IF: 1.298; 2002 IF: 1.574
	Call Number	UA @ admin @ c:irua:36670			Serial	5529
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