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Author Araujo, M.F.; van Espen, P.; Van Grieken, R. doi  openurl
  Title Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation Type A1 Journal article
  Year (down) 1990 Publication X-ray spectrometry Abbreviated Journal  
  Volume 19 Issue 1 Pages 29-33  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract A semi-empirical approach is described for determining the mass per unit area of a sample being analysed. The method can be used to estimate the concentration of minor and trace elements in matrices containing a substantial amount of light elements. The procedure utilizes the coherently and incoherently scattered radiation induced in the sample by the filtered continuum radiation of a rhodium x-ray tube. The relationship between the intensity of the scattered radiation per unit mass and the average atomic number of the sample is established via calibration graphs, which can be applied for different x-ray tube voltages and for different primary beam filters. The overall procedure was validated by the analysis of several geological standards, deposited as thin slurries of unknown thickness either on Mylar foil or on Nuclepore filters.  
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  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1990CU24700005 Publication Date 2005-05-28  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:116491 Serial 7787  
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