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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Obradors, X.; Puig, T.; Pomar, A.; Sandiumenge, F.; Piñol, S.; Mestres, N.; Castaño, O.; Coll, M.; Cavallaro, A.; Palau, A.; Gázquez, J.; González, J.C.; Gutiérrez, J.; Romá, N.; Ricart, S.; Moretó, J.M.; Rossell, M.D.; Van Tendeloo, G. |
Chemical solution deposition: a path towards low cost coated conductors |
2004 |
Superconductor science and technology |
17 |
107 |
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. |
Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study |
2004 |
Applied surface science |
231/232 |
4 |
UA library record; WoS full record; WoS citing articles |
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Fredrickx, P.; Helary, D.; Schryvers, D.; Darque-Ceretti, E. |
A TEM study of nanoparticles in lustre glazes |
2004 |
Applied physics A : materials science & processing |
79 |
16 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Gijbels, R. |
A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques |
2004 |
Applied surface science |
231/232 |
7 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition |
2004 |
Applied surface science |
231/232 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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Tirry, W.; Schryvers, D. |
High resolution TEM study of Ni4Ti3 precipitates in austenitic Ni51Ti49 |
2004 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
378 |
19 |
UA library record; WoS full record; WoS citing articles |
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Santamarta, R.; Schryvers, D. |
Structure of multi-grain spherical particles in an amorphous Ti50Ni25Cu25 melt-spun ribbon |
2004 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
378 |
5 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Potapov, P.; Santamarta, R.; Tirry, W. |
Applications of advanced transmission electron microscopic techniques to Ni-Ti based shape memory materials |
2004 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
378 |
6 |
UA library record; WoS full record; WoS citing articles |
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Lebedev, O.I.; Van Tendeloo, G.; Collart, O.; Cool, P.; Vansant, E.F. |
Structure and microstructure of nanoscale mesoporous silica spheres |
2004 |
Solid state sciences |
6 |
42 |
UA library record; WoS full record; WoS citing articles |
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Deutsch, F.; Stranger, M.; Kaplinskii, A.E.; Samek, L.; Joos, P.; Van Grieken, R. |
Elemental and ionic concentrations in the urban aerosol in Antwerp, Belgium |
2004 |
Journal of environmental science and health: part A: toxic/hazardous substances & environmental engineering |
39 |
|
UA library record; WoS full record; WoS citing articles |
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Lazoryak, B.I.; Morozov, V.A.; Belik, A.A.; Stefanovich, S.Y.; Grebenev, V.V.; Leonidov, I.A.; Mitberg, E.B.; Davydov, S.A.; Lebedev, O.I.; Van Tendeloo, G. |
Ferroelectric phase transition in the whitlockite-type Ca9Fe(PO4)7; crystal structure of the paraelectric phase at 923 K |
2004 |
Solid state sciences |
6 |
41 |
UA library record; WoS full record; WoS citing articles |
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Ravindra, K.; Bencs, L.; Van Grieken, R. |
Platinum group elements in the environment and their health risk |
2004 |
The science of the total environment |
318 |
|
UA library record; WoS full record; WoS citing articles |
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Herrebout, D.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J.; Vanhulsel, A. |
A one-dimensional fluid model for an acetylene rf discharge: a study of the plasma chemistry |
2003 |
IEEE transactions on plasma science |
31 |
26 |
UA library record; WoS full record; WoS citing articles |
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Abakumov, A.M.; Mironov, A.V.; Govorov, V.A.; Lobanov, M.V.; Rozova, M.G.; Antipov, E.V.; Lebedev, O.I.; Van Tendeloo, G. |
Synthesis and structural investigations on the new Sr1.32Mn0.83Cu0.17O3 compound |
2003 |
Solid state sciences |
5 |
8 |
UA library record; WoS full record; WoS citing articles |
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Abakumov, A.M.; Rozova, M.G.; Alekseeva, A.M.; Kovba, M.L.; Antipov, E.V.; Lebedev, O.I.; Van Tendeloo, G. |
Synthesis and structure of Sr2MnGaO5+\delta brownmillerites with variable oxygen content |
2003 |
Solid state sciences |
5 |
12 |
UA library record; WoS full record; WoS citing articles |
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Enjalbert, R.; Galy, J.; Castro, A.; Lidin, S.; Withers, R.; Van Tendeloo, G. |
Order and twining in Sb2W0.75Mo0.25O6 |
2003 |
Solid state sciences |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals |
2003 |
Applied surface science |
203/204 |
7 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks |
2003 |
Applied surface science |
203 |
15 |
UA library record; WoS full record; WoS citing articles |
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van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
The influence of crystal thickness on the image tone |
2003 |
Journal of imaging science |
47 |
|
UA library record; WoS full record; WoS citing articles |
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Potapov, P.L.; Schryvers, D.; Strijckers, H.; van Roost, C. |
Microstructural mechanism of development in photothermographic materials |
2003 |
The journal of imaging science and technology |
47 |
|
UA library record; WoS full record; WoS citing articles |
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Godoi, R.H.M.; Godoi, A.F.L.; Andrade, S.J.; Santiago-Silva, M.; de Hoog, J.; Worobiec, A.; Van Grieken, R. |
Assessment of atmospheric particles emitted from sugar cane burning in Southeast Brazil |
2003 |
Journal od aerosol science |
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UA library record |
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Injuk, J.; Osán, J.; Van Grieken, R.; Tsuji, K. |
Airborne particles in the Miyagi Museum of Art in Sendai, Japan, studied by electron probe X-ray microanalysis and energy dispersive X-ray fluorescence analysis |
2002 |
Analytical sciences : the international journal of the Japan Society for Analytical Chemistry |
18 |
|
UA library record; WoS full record; WoS citing articles |
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Ro, C.-U.; Kim, H.; Oh, K.-Y.; Yea, S.K.; Lee, C.B.; Jang, M.; Van Grieken, R. |
Single-particle characterization of urban aerosol particles collected in three Korean cities using low-Z electron probe x-ray microanalysis |
2002 |
Environmental science and technology |
36 |
|
UA library record; WoS full record; WoS citing articles |
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Yan, M.; Bogaerts, A.; Gijbels, R. |
Evolution of charged particle densities after laser-induced photodetachment in a strongly electronegative RF discharge |
2002 |
IEEE transactions on plasma science |
30 |
|
UA library record; WoS full record |
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Bogaerts, A.; Gijbels, R. |
The ion- and atom-induced secondary electron emission yield: numerical study for the effect of clean and dirty cathode surfaces |
2002 |
Plasma sources science and technology |
11 |
51 |
UA library record; WoS full record; WoS citing articles |
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Lobanov, M.V.; Abakumov, A.M.; Sidorova, A.V.; Rozova, M.G.; D'yachenko, O.G.; Antipov, E.V.; Hadermann, J.; Van Tendeloo, G. |
Synthesis and investigation of novel Mn-based oxyfluoride Sr2Mn2O5-xF1+x |
2002 |
Solid state sciences |
4 |
21 |
UA library record; WoS full record; WoS citing articles |
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Biró, L.P.; Khanh, N.Q.; Vértesy, Z.; Horváth, Z.E.; Osváth, Z.; Koós, A.; Gyulai, J.; Kocsonya, A.; Kónya, Z.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B.; |
Catalyst traces and other impurities in chemically purified carbon nanotubes grown by CVD |
2002 |
Materials science and engineering: part C: biomimetic materials
T2 – EMRS Spring Meeting, JUN 05-08, 2001, STRASBOURG, FRANCE |
19 |
36 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Kolev, I. |
Modeling of magnetron and glow discharges |
2002 |
Le vide: science, technique et applications |
57 |
|
UA library record; WoS full record; WoS citing articles |
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Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. |
The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures |
2001 |
Materials science in semiconductor processing |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. |
Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy |
2001 |
Materials science in semiconductor processing |
4 |
|
UA library record; WoS full record |
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