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Author |
Title |
Year |
Publication  |
Volume |
Times cited |
Additional Links |
Links |
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Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. |
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction |
2013 |
Applied physics letters |
103 |
53 |
UA library record; WoS full record; WoS citing articles |
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Zhou, Y.; Ramaneti, R.; Anaya, J.; Korneychuk, S.; Derluyn, J.; Sun, H.; Pomeroy, J.; Verbeeck, J.; Haenen, K.; Kuball, M. |
Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs |
2017 |
Applied physics letters |
111 |
78 |
UA library record; WoS full record; WoS citing articles |
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectroscopic coincidence experiments in transmission electron microscopy |
2019 |
Applied physics letters |
114 |
18 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping |
2019 |
Applied physics letters |
114 |
17 |
UA library record; WoS full record; WoS citing articles |
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Wang, J.; Gauquelin, N.; Huijben, M.; Verbeeck, J.; Rijnders, G.; Koster, G. |
Metal-insulator transition of SrVO 3 ultrathin films embedded in SrVO 3 / SrTiO 3 superlattices |
2020 |
Applied Physics Letters |
117 |
8 |
UA library record; WoS full record; WoS citing articles |
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Gao, C.; Hofer, C.; Jannis, D.; Béché, A.; Verbeeck, J.; Pennycook, T.J. |
Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science |
2022 |
Applied physics letters |
121 |
9 |
UA library record; WoS full record; WoS citing articles |
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. |
Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope |
2021 |
Applied Sciences-Basel |
11 |
9 |
UA library record; WoS full record; WoS citing articles |
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Muret, P.; Nguyen, T.T.A.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J. |
Photoelectric and electrical responses of several erbium silicide/silicon interfaces |
1996 |
Applied surface science
T2 – International Symposium on Si Heterostructures – From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE |
102 |
3 |
UA library record; WoS full record; WoS citing articles |
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Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; |
Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry |
1993 |
Applied surface science
T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE |
63 |
13 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. |
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate |
1996 |
Applied surface science |
102 |
9 |
UA library record; WoS full record; WoS citing articles |
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Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. |
High crystalline quality erbium silicide films on (100) silicon grown in high vacuum |
1996 |
Applied surface science |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
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Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Verbist, K.; Van Tendeloo, G.; Olsson, E. |
The microstructure and interfaces of intermediate layers in sapphire bicrystals |
1997 |
Applied surface science |
119 |
2 |
UA library record; WoS full record; WoS citing articles |
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Vishwakarma, M.; Agrawal, K.; Hadermann, J.; Mehta, B.R. |
Investigating the effect of sulphurization on volatility of compositions in Cu-poor and Sn-rich CZTS thin films |
2020 |
Applied Surface Science |
507 |
4 |
UA library record; WoS full record; WoS citing articles |
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Van Dijck, J.G.; Mampuys, P.; Ching, H.Y.V.; Krishnan, D.; Baert, K.; Hauffman, T.; Verbeeck, J.; Van Doorslaer, S.; Maes, B.U.W.; Dorbec, M.; Buekenhoudt, A.; Meynen, V. |
Synthesis – properties correlation and the unexpected role of the titania support on the Grignard surface modification |
2020 |
Applied Surface Science |
527 |
5 |
UA library record; WoS full record; WoS citing articles |
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Volykhov, A.A.; Frolov, A.S.; Neudachina, V.S.; Vladimirova, N.V.; Gerber, E.; Callaert, C.; Hadermann, J.; Khmelevsky, N.O.; Knop-Gericke, A.; Sanchez-Barriga, J.; Yashina, L.V. |
Impact of ordering on the reactivity of mixed crystals of topological insulators with anion substitution: Bi₂SeTe₂ and Sb₂SeTe₂ |
2021 |
Applied Surface Science |
541 |
|
UA library record; WoS full record; WoS citing articles |
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Li, C.-F.; Chen, L.-D.; Wu, L.; Liu, Y.; Hu, Z.-Y.; Cui, W.-J.; Dong, W.-D.; Liu, X.; Yu, W.-B.; Li, Y.; Van Tendeloo, G.; Su, B.-L. |
Directly revealing the structure-property correlation in Na+-doped cathode materials |
2023 |
Applied surface science |
612 |
|
UA library record; WoS full record; WoS citing articles |
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Benedet, M.; Andrea Rizzi, G.; Gasparotto, A.; Gauquelin, N.; Orekhov, A.; Verbeeck, J.; Maccato, C.; Barreca, D. |
Functionalization of graphitic carbon nitride systems by cobalt and cobalt-iron oxides boosts solar water oxidation performances |
2023 |
Applied surface science |
618 |
11 |
UA library record; WoS full record; WoS citing articles |
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Gorlé, C.; van Beeck, J.; Rambaud, P.; Van Tendeloo, G. |
CFD modelling of small particle dispersion: the influence of the turbulence kinetic energy in the atmospheric boundary layer |
2009 |
Atmospheric environment : an international journal |
43 |
79 |
UA library record; WoS full record; WoS citing articles |
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Nakiboglu, G.; Gorlé, C.; Horvath, I.; van Beeck, J.; Blocken, B. |
Stack gas dispersion measurements with large scale-PIV, aspiration probes and light scattering techniques and comparison with CFD |
2009 |
Atmospheric environment : an international journal |
43 |
15 |
UA library record; WoS full record; WoS citing articles |
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García Sánchez, C.; Van Tendeloo, G.; Gorle, C. |
Quantifying inflow uncertainties in RANS simulations of urban pollutant dispersion |
2017 |
Atmospheric environment : an international journal |
161 |
17 |
UA library record; WoS full record; WoS citing articles |
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Vidick, D.; Ke, X.; Devillers, M.; Poleunis, C.; Delcorte, A.; Moggi, P.; Van Tendeloo, G.; Hermans, S. |
Heterometal nanoparticles from Ru-based molecular clusters covalently anchored onto functionalized carbon nanotubes and nanofibers |
2015 |
Beilstein journal of nanotechnology |
6 |
7 |
UA library record; WoS full record; WoS citing articles |
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Ke, X.; Bittencourt, C.; Bals, S.; Van Tendeloo, G. |
Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM |
2013 |
Beilstein journal of nanotechnology |
4 |
12 |
UA library record; WoS full record; WoS citing articles |
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|
Ke, X.; Bittencourt, C.; Van Tendeloo, G. |
Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials |
2015 |
Beilstein journal of nanotechnology |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
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Mordvinova, N.; Emelin, P.; Vinokurov, A.; Dorofeev, S.; Abakumov, A.; Kuznetsova, T. |
Surface processes during purification of InP quantum dots |
2014 |
Beilstein journal of nanotechnology |
5 |
5 |
UA library record; WoS full record; WoS citing articles |
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Bittencourt, C.; Krüger, P.; Lagos, M.J.; Ke, X.; Van Tendeloo, G.; Ewels, C.; Umek, P.; Guttmann, P. |
Towards atomic resolution in sodium titanate nanotubes using near-edge X-ray-absorption fine-structure spectromicroscopy combined with multichannel multiple-scattering calculations |
2012 |
Beilstein journal of nanotechnology |
3 |
13 |
UA library record; WoS full record; WoS citing articles |
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Bittencourt, C.; Hitchock, A.P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Guttmann, P. |
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge |
2012 |
Beilstein journal of nanotechnology |
3 |
15 |
UA library record; WoS full record; WoS citing articles |
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Shabalovskaya, S.A.; Tian, H.; Anderegg, J.W.; Schryvers, D.U.; Carroll, W.U.; van Humbeeck, J. |
The influence of surface oxides on the distribution and release of nickel from Nitinol wires |
2009 |
Biomaterials |
30 |
102 |
UA library record; WoS full record; WoS citing articles |
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Suffian, I.F.B.M.; Wang, J.T.-W.; Hodgins, N.O.; Klippstein, R.; Garcia-Maya, M.; Brown, P.; Nishimura, Y.; Heidari, H.; Bals, S.; Sosabowski, J.K.; Ogino, C.; Kondo, A.; Al-Jamal, K.T. |
Engineering hepatitis B virus core particles for targeting HER2 receptors in vitro and in vivo |
2017 |
Biomaterials |
120 |
20 |
UA library record; WoS full record; WoS citing articles |
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|
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Parente, A.; Gorlé, C.; van Beeck, J.; Benocci, C. |
A comprehensive modelling approach for the neutral atmospheric boundary layer : consistent inflow conditions, wall function and turbulence model |
2011 |
Boundary-layer meteorology |
140 |
54 |
UA library record; WoS full record; WoS citing articles |
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