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  Author Title Year Publication Volume (up) Times cited Additional Links Links
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis 2003 Institute of physics conference series UA library record; WoS full record;
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles url doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer 2019 UA library record doi
Mueller, K.; Krause, F.F.; Béché, A.; Schowalter, M.; Galioit, V.; Loeffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P.; Rosenauer, A. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction 2014 Nature communications 5 197 UA library record; WoS full record; WoS citing articles pdf url doi
Mahr, C.; Müller-Caspary, K.; Graf, M.; Lackmann, A.; Grieb, T.; Schowalter, M.; Krause, F.F.; Mehrtens, T.; Wittstock, A.; Weissmueller, J.; Rosenauer, A. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold 2018 Materials research letters 6 4 UA library record; WoS full record; WoS citing articles doi
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record url doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Density-functional theory calculations of the electron energy-loss near-edge structure of Li-intercalated graphite 2009 Carbon 47 12 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images 2014 Micron 63 25 UA library record; WoS full record; WoS citing articles pdf url doi
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. Computation and parametrization of the temperature dependence of Debye-Waller factors for group IV, III-V and II-VI semiconductors 2009 Acta crystallographica: section A: foundations of crystallography 65 51 UA library record; WoS full record; WoS citing articles doi
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structure 2009 Acta crystallographica: section A: foundations of crystallography 65 23 UA library record; WoS full record; WoS citing articles doi
Rosenauer, A.; Schowalter, M.; Glas, F.; Lamoen, D. First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs 2005 Physical Review B 72 42 UA library record; WoS full record; WoS citing articles doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Temperature effect on the 002 structure factor of ternary Ga1-xInxAs crystals 2007 Physical review : B : condensed matter and materials physics 76 3 UA library record; WoS full record; WoS citing articles doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Size effects and strain state of Ga1-xInxAs/GaAs multiple quantum wells: Monte Carlo study 2008 Physical review : B : condensed matter and materials physics 78 5 UA library record; WoS full record; WoS citing articles url doi
Schowalter, M.; Lamoen, D.; Kruse, P.; Gerthsen, D.; Rosenauer, A. First-principles calculations of the mean inner Coulomb potential for sphalerite type II.VI semiconductors 2004 Applied Physics Letters 85 16 UA library record; WoS full record; WoS citing articles doi
Piscopiello, E.; Rosenauer, A.; Passaseo, A.; Montoya Rossi, E.H.; Van Tendeloo, G. Segregation in InxGa1-xAs/GaAs Stranski-Krastanow layers grown by metal-organic chemical vapour deposition 2005 Philosophical magazine 85 11 UA library record; WoS full record; WoS citing articles pdf doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Applied Physics Letters 86 5 UA library record; WoS full record; WoS citing articles doi
Rossi, E.H.M.; Van Tendeloo, G.; Rosenauer, A. Influence of strain, specimen orientation and background estimation on composition evaluation of InAs/GaAs by TEM 2007 Philosophical magazine 87 1 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. Procedure to count atoms with trustworthy single-atom sensitivity 2013 Physical review : B : condensed matter and materials physics 87 106 UA library record; WoS full record; WoS citing articles url doi
Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kruse, P.; Gerthsen, D. Ab initio computation of the mean inner Coulomb potential of wurtzite-type semiconductors and gold 2006 Applied Physics Letters 88 8 UA library record; WoS full record; WoS citing articles doi
Carmesin, C.; Schowalter, M.; Lorke, M.; Mourad, D.; Grieb, T.; Müller-Caspary, K.; Yacob, M.; Reithmaier, J.P.; Benyoucef, M.; Rosenauer, A.; Jahnke, F. Interplay of morphology, composition, and optical properties of InP-based quantum dots emitting at the 1.55 \mum telecom wavelength 2017 Physical review B 96 3 UA library record; WoS full record; WoS citing articles url doi
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. Atomic-scale quantification of charge densities in two-dimensional materials 2018 Physical review B 98 10 UA library record; WoS full record; WoS citing articles url doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Bond length variation in Ga1-xInxAs crystals from the Tersoff potential 2007 Journal of applied physics 101 19 UA library record; WoS full record; WoS citing articles doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga1-xInxAs/GaAs quantum wells 2009 Journal of applied physics 105 UA library record; WoS full record pdf doi
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images 2014 Applied physics letters 105 12 UA library record; WoS full record; WoS citing articles pdf url doi
Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography 2006 Ultramicroscopy 106 50 UA library record; WoS full record; WoS citing articles doi
Rosenauer, A.; Schowalter, M.; Glas, F.; Lamoen, D. First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs 2005 107 UA library record; WoS full record;
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record; pdf
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy 2008 Ultramicroscopy 108 25 UA library record; WoS full record; WoS citing articles doi
Verbeeck, J.; Sc hattschneider, P.; Rosenauer, A. Image simulation of high resolution energy filtered TEM images 2009 Ultramicroscopy 109 36 UA library record; WoS full record; WoS citing articles pdf doi
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