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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Misko, V.R.; Fomin, V.M.; Devreese, J.T. |
Strong enhancement of superconductivity in a nanosized Pb bridge |
2001 |
Physical Review B |
64 |
28 |
UA library record; WoS full record; WoS citing articles |
|
|
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Voss, A.; Wei, H.Y.; Zhang, Y.; Turner, S.; Ceccone, G.; Reithmaier, J.P.; Stengl, M.; Popov, C. |
Strong attachment of circadian pacemaker neurons on modified ultrananocrystalline diamond surfaces |
2016 |
Materials science and engineering: part C: biomimetic materials |
64 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Samae, V.; Cordier, P.; Demouchy, S.; Bollinger, C.; Gasc, J.; Koizumi, S.; Mussi, A.; Schryvers, D.; Idrissi, H. |
Stress-induced amorphization triggers deformation in the lithospheric mantle |
2021 |
Nature |
591 |
|
UA library record; WoS full record; WoS citing articles |
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Vanhumbeeck, J.-F.; Tian, H.; Schryvers, D.; Proost, J. |
Stress-assisted crystallisation in anodic titania |
2011 |
Corrosion science |
53 |
11 |
UA library record; WoS full record; WoS citing articles |
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Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. |
Stress analysis with convergent beam electron diffraction around NMOS transistors |
2001 |
|
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UA library record; WoS full record; |
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Zhang, F.; Inokoshi, M.; Batuk, M.; Hadermann, J.; Naert, I.; Van Meerbeek, B.; Vleugels, J. |
Strength, toughness and aging stability of highly-translucent Y-TZP ceramics for dental restorations |
2016 |
Dental Materials |
32 |
|
UA library record; WoS full record; WoS citing articles |
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Zhang, F.; Inokoshi, M.; Batuk, M.; Hadermann, J.; Naert, I.; Van Meerbeek, B.; Vleugels, J. |
Strength, toughness and aging stability of highly-translucent Y-TZP ceramics for dental restorations |
2016 |
Dental materials |
32 |
47 |
UA library record; WoS full record |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
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UA library record |
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Chen, B.; Gauquelin, N.; Jannis, D.; Cunha, D.M.; Halisdemir, U.; Piamonteze, C.; Lee, J.H.; Belhadi, J.; Eltes, F.; Abel, S.; Jovanovic, Z.; Spreitzer, M.; Fompeyrine, J.; Verbeeck, J.; Bibes, M.; Huijben, M.; Rijnders, G.; Koster, G. |
Strain-engineered metal-to-insulator transition and orbital polarization in nickelate superlattices integrated on silicon |
2020 |
Advanced Materials |
|
18 |
UA library record; WoS full record; WoS citing articles |
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Santiso, J.; Pardo, J.A.; Solis, C.; Garcia, G.; Figueras, A.; Rossell, M.D.; Van Tendeloo, G. |
Strain relaxation and oxygen superstructure modulation in epitaxial Sr4Fe6O13\pm\delta films |
2005 |
Applied physics letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
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Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. |
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique |
2019 |
Semiconductor science and technology |
|
8 |
UA library record; WoS full record; WoS citing articles |
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Prabhakara, V. |
Strain measurement for semiconductor applications with Raman spectroscopy and Transmission electron microscopy |
2021 |
|
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UA library record |
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Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
|
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Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy |
2012 |
Applied Physics Letters |
100 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Willems, B.; Nistor, L.; Ghica, C.; Van Tendeloo, G. |
Strain mapping around dislocations in diamond and cBN |
2005 |
Physica status solidi: A: applied research |
202 |
4 |
UA library record; WoS full record; WoS citing articles |
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Nord, M.; Semisalova, A.; Kákay, A.; Hlawacek, G.; MacLaren, I.; Liersch, V.; Volkov, O.M.; Makarov, D.; Paterson, G.W.; Potzger, K.; Lindner, J.; Fassbender, J.; McGrouther, D.; Bali, R. |
Strain Anisotropy and Magnetic Domains in Embedded Nanomagnets |
2019 |
Small |
|
2 |
UA library record; WoS full record; WoS citing articles |
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Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. |
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence |
2018 |
Ultramicroscopy |
190 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Hoek, M.; Coneri, F.; Poccia, N.; Renshaw Wang, X.; Ke, X.; Van Tendeloo, G.; Hilgenkamp, H. |
Strain accommodation through facet matching in La1.85Sr0.15CuO4/Nd1.85Ce0.15CuO4 ramp-edge junctions |
2015 |
APL materials |
3 |
4 |
UA library record; WoS full record; WoS citing articles |
|
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Grzelczak, M.; Sánchez-Iglesias, A.; Heidari Mezerji, H.; Bals, S.; Pérez-Juste, J.; Liz-Marzán, L.M. |
Steric hindrance induces crosslike self-assembly of gold nanodumbbells |
2012 |
Nano letters |
12 |
85 |
UA library record; WoS full record; WoS citing articles |
|
|
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Egoavil, R. |
STEM investigation of complex oxides at the atomic scale |
2014 |
|
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UA library record |
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De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2017 |
Journal of physics : conference series
T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK |
902 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2016 |
Ultramicroscopy |
171 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Statistical parameter estimation theory : principles and simulation studies |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
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Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
|
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UA library record |
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van Dyck, D.; Croitoru, M.D. |
Statistical method for thickness measurement of amorphous objects |
2007 |
Applied physics letters |
90 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
2004 |
|
|
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. |
Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction |
2005 |
Microscopy and microanalysis |
11 |
|
UA library record |
|
|
|
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. |
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range |
2006 |
Physical review letters |
96 |
69 |
UA library record; WoS full record; WoS citing articles |
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