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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
Electron microscopy of interfaces in new materials |
1991 |
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UA library record |
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Schryvers, D.; Tanner, L.E. |
Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5 |
1992 |
Shape memory materials and phenomena: fundamental aspects and applications |
246 |
5 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Electron microscopy studies of martensite microstructures |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
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Shi, H.; Pourbabak, S.; Van Humbeeck, J.; Schryvers, D. |
Electron microscopy study of Nb-rich nanoprecipitates in NiTiNb and their influence on the martensitic transformation |
2012 |
Scripta materialia |
67 |
29 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
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UA library record; WoS full record; |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 1: precipitation and growth |
1995 |
Acta metallurgica et materialia |
43 |
27 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 2: plate crystallography |
1995 |
Acta metallurgica et materialia |
43 |
11 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Van Landuyt, J. |
Electron microscopy study of twin sequences and branching in NissAl34 3R martensite |
1992 |
ICOMAT |
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Schryvers, D.; van Landuyt, J.T. |
Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite |
1993 |
Proceedings Of The International Conference On Martensitic Transformations (icomat-92) |
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1 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L. |
Electron microscopy study of twinning in the Ni5Al3 bainitic phase |
1994 |
TMS |
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Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. |
Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals |
1994 |
Physica status solidi: A |
143 |
7 |
UA library record; WoS full record; WoS citing articles |
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Tirry, W.; Schryvers, D.; Jorissen, K.; Lamoen, D. |
Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48 |
2006 |
Acta crystallographica: section B: structural science |
62 |
30 |
UA library record; WoS full record; WoS citing articles |
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Dobysheva, L.V.; Potapov, P.L.; Schryvers, D. |
Electron-energy-loss spectra of NiO |
2004 |
Physical review : B : condensed matter and materials physics |
69 |
17 |
UA library record; WoS full record; WoS citing articles |
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Muto, S.; Schryvers, D. |
Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM |
1993 |
MRS Japan: shape memory materials |
18 |
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UA library record |
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Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. |
Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism |
2022 |
ACS applied electronic materials |
4 |
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UA library record; WoS full record; WoS citing articles |
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Schouteden, K.; Amin-Ahmadi, B.; Li, Z.; Muzychenko, D.; Schryvers, D.; Van Haesendonck, C. |
Electronically decoupled stacking fault tetrahedra embedded in Au(111) films |
2016 |
Nature communications |
7 |
7 |
UA library record; WoS full record; WoS citing articles |
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Hamon, A.-L.; Verbeeck, J.; Schryvers, D.; Benedikt, J.; van den Sanden, R.M.C.M. |
ELNES study of carbon K-edge spectra of plasma deposited carbon films |
2004 |
Journal of materials chemistry |
14 |
61 |
UA library record; WoS full record; WoS citing articles |
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Shi, H.; Frenzel, J.; Schryvers, D. |
EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys |
2013 |
Materials science forum |
738/739 |
1 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
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Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
EM study of sensitisation of silver halide grains |
1994 |
Icem |
13 |
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UA library record; WoS full record; |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
EM study of twinning in the Ni5Al3 bainitic phase |
1993 |
Twinning in advanced materials |
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UA library record; WoS full record; |
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Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration |
2009 |
Spectrochimica acta: part B : atomic spectroscopy |
64 |
28 |
UA library record; WoS full record; WoS citing articles |
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Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
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UA library record |
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Jimenez-Mena, N.; Jacques, P.J.; Ding, L.; Gauquelin, N.; Schryvers, D.; Idrissi, H.; Delannay, F.; Simar, A. |
Enhancement of toughness of Al-to-steel Friction Melt Bonded welds via metallic interlayers |
2019 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
740-741 |
4 |
UA library record; WoS full record; WoS citing articles |
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Yandouzi, M.; Toth, L.; Vasudevan, V.; Cannaerts, M.; van Haesendonck, C.; Schryvers, D. |
Epitaxial Ni-Al thin films on NaCl using a Ag buffer layer |
2000 |
Philosophical magazine letters |
80 |
2 |
UA library record; WoS full record; WoS citing articles |
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Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
2004 |
X-ray spectrometry |
33 |
13 |
UA library record; WoS full record; WoS citing articles |
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Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
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Zelaya, E.; Esquivel, M.R.; Schryvers, D. |
Evolution of the phase stability of NiAl under low energy ball milling |
2013 |
Advanced powder technology |
24 |
10 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Experimental studies on precursor phenomena in displacive phase transformations |
1997 |
Properties Of Complex Inorganic Solids |
|
1 |
UA library record; WoS full record; WoS citing articles |
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Tian, H.; Schryvers, D.; Mohanchandra, K.P.; Carman, G.P.; van Humbeeck, J. |
Fabrication and characterization of functionally graded Ni-Ti multilayer thin films |
2009 |
Functional materials letters |
2 |
9 |
UA library record; WoS full record; WoS citing articles |
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