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Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
Links |
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Berezhnoi, S.; Kaganovich, I.; Bogaerts, A.; Gijbels, R. |
Modelling of radio frequency capacitively coupled plasma at intermediate pressures |
1999 |
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UA library record; WoS full record; |
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Slanina, Z.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
On the quasi-random entropy of linear species |
1993 |
Theochem: applications of theoretical chemistry to organic, inorganic and biological problems |
99 |
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UA library record; WoS full record; |
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de Bleecker, K.; Herrebout, D.; Bogaerts, A.; Gijbels, R.; Descamps, P. |
One-dimensional modelling of a capacitively coupled rf plasma in silane/helium, including small concentrations of O2 and N2 |
2003 |
Journal of physics: D: applied physics |
36 |
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UA library record; WoS full record; WoS citing articles |
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
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UA library record; WoS full record; |
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Baguer, N.; Bogaerts, A.; Gijbels, R. |
A self-consistent mathematical model of a hollow cathode glow discharge |
1999 |
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UA library record; WoS full record; |
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Herrebout, D.; Bogaerts, A.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
Simulation of plasma processes in plasma assisted CVD reactors |
1999 |
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UA library record; WoS full record; |
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Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
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UA library record; WoS full record; |
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Oleshko, V.; Kindratenko, V.; Gijbels, R.; van Espen, P.; Jacob, W. |
Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis |
1996 |
Mikrochimica acta: supplementum |
13 |
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UA library record; WoS full record; |
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Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. |
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1997 |
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UA library record; WoS full record; |
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Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
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UA library record; WoS full record; |
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van Cleempoel, A.; Gijbels, R.; van den Heuvel, H.; Claeys, M. |
Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry |
1997 |
Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 |
4 |
1 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W. |
Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides |
1998 |
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1 |
UA library record; WoS full record; WoS citing articles |
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Adriaens, A.; Van 't dack, L.; Adams, F.; Gijbels, R. |
A mass spectrometric study of the dissolution behavior of sanidine |
1995 |
Microchimica acta |
120 |
1 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
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1 |
UA library record; WoS full record; WoS citing articles |
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Van 't dack, L.; Gijbels, R.; Walker, C.T. |
Modern developments and applications in microbeam analysis: proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6-10, 2007 |
2008 |
Microchimica acta |
161 |
1 |
UA library record; WoS full record; WoS citing articles |
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Vandelannoote, R.; Blommaert, W.; Van 't dack, L.; Gijbels, R.; van Grieken, R. |
Statistical grouping and controlling factors of dissolved trace elements in a surface water system |
1983 |
Environmental technology letters |
4 |
1 |
UA library record |
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Pentcheva, E.N.; Veldeman, E.; Van 't dack, L.; Gijbels, R. |
Trace element geochemistry of the system rock-thermal water – suspended matter – deposits in a granitic environment |
1992 |
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1 |
UA library record; WoS full record; WoS citing articles |
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Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
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de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
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Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R. |
Comment on 'Integral cross sections for electron impact excitation of electronic states of N2' |
2002 |
Journal of physics: B : atomic and molecular physics |
35 |
2 |
UA library record; WoS full record; WoS citing articles |
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Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. |
Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders |
1991 |
Fres J. Anal. Chem. |
341 |
2 |
UA library record; WoS full record; WoS citing articles |
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Robben, J.; Dufour, D.; Gijbels, R. |
Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer |
2001 |
Fresenius' journal of analytical chemistry |
370 |
2 |
UA library record; WoS full record; WoS citing articles |
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Kalitzova, M.; Vlakhov, E.; Marinov, Y.; Gesheva, K.; Ignatova, V.A.; Lebedev, O.; Muntele, C.; Gijbels, R. |
Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex> |
2004 |
Vacuum: the international journal and abstracting service for vacuum science and technology |
76 |
2 |
UA library record; WoS full record; WoS citing articles |
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Pentcheva, E.N.; Van 't dack, L.; Gijbels, R. |
Influence of recent volcanism on the geochemical behaviour of trace elements and gases in deep granitic hydrothermal systems, southwest Bulgaria |
1995 |
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2 |
UA library record; WoS full record; WoS citing articles |
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Yan, M.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J. |
Local and fast relaxation phenomena after laser-induced photodetachment in a strongly electronegative rf discharge |
2002 |
Physical review : E : statistical, nonlinear, and soft matter physics |
65 |
2 |
UA library record; WoS full record; WoS citing articles |
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Blommaert, W.; Vandelannoote, R.; Sadurski, A.; Van 't dack, L.; Gijbels, R. |
Trace-element geochemistry of thermal water percolating through a karstic environment in the region of Saint Ghislain (Belgium) |
1983 |
Journal of volcanology and geothermal research |
19 |
2 |
UA library record; WoS full record; WoS citing articles |
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van Cleempoel, A.; Joutsensaari, J.; Kauppinen, E.; Gijbels, R.; Claeys, M. |
Aerosol synthesis and characterization of ultrafine fullerene particles |
1998 |
Fullerene science and technology |
6 |
3 |
UA library record; WoS full record; WoS citing articles |
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Luyten, W.; Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Férauge, C.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. |
Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy |
1993 |
Physica status solidi: A: applied research |
140 |
3 |
UA library record; WoS full record; WoS citing articles |
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