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Author Lobato, I.; van Dyck, D. doi  openurl
  Title Improved multislice calculations for including higher-order Laue zones effects Type A1 Journal article
  Year 2012 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 119 Issue Pages 63-71  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract A new method for including higher-order Laue zones (HOLZs) effects in an efficient way in electron scattering simulations has been developed and tested by detail calculations. The calculated results by the conventional multislice (CMS) method and the improved conventional multislice (ICMS) method using a large dynamical aperture to avoid numerical errors are compared with accurate results. We have found that the zero-order Laue zones (ZOLZs) reflection cannot be properly described only using the projected potential in the whole unit cell; in general, we need to subslice the electrostatic potential inside the unit cell. It is shown that the ICMS method has higher accuracy than the CMS method for the calculation of the ZOLZ, HOLZ and Pseudo-HOLZ reflections. Hence, ICMS method allows to use a larger slice thickness than the CMS method and reduces the calculation time. (C) 2012 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000308079200011 Publication Date 2012-01-14  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 6 Open Access  
  Notes Approved Most recent IF: 2.843; 2012 IF: 2.470  
  Call Number UA @ lucian @ c:irua:101902 Serial 1567  
Permanent link to this record
 
 
Author Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. pdf  doi
openurl 
  Title Inelastic electron holography as a variant of the Feynman thought experiment Type A1 Journal article
  Year 2007 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 107 Issue 8 Pages 559-567  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Using a combination of electron holography and energy filtering, interference fringes produced after inelastic interaction of electrons with hydrogen molecules are examined. Surprisingly, the coherence of inelastic scattering increases when moving from the surface of a hydrogen-containing bubble to the vacuum. This phenomenon can be understood in terms of the Feynman two-slit thought experiment with a variable ambiguity of the which-way registration. (C) 2006 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000246937000001 Publication Date 2006-12-16  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 13 Open Access  
  Notes Fwo G.0147.06 Approved Most recent IF: 2.843; 2007 IF: 1.996  
  Call Number UA @ lucian @ c:irua:103588UA @ admin @ c:irua:103588 Serial 1605  
Permanent link to this record
 
 
Author Fanidis, C.; van Dyck, D.; van Landuyt, J. doi  openurl
  Title Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework Type A1 Journal article
  Year 1992 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 41 Issue Pages 55-64  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos A1992HX68100005 Publication Date 2002-10-18  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.436 Times cited 17 Open Access  
  Notes Approved no  
  Call Number UA @ lucian @ c:irua:4092 Serial 1608  
Permanent link to this record
 
 
Author Fanidis, C.; van Dyck, D.; van Landuyt, J. openurl 
  Title Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases Type A1 Journal article
  Year 1993 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 48 Issue Pages 133-164  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos A1993KM78800013 Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.436 Times cited 6 Open Access  
  Notes Approved no  
  Call Number UA @ lucian @ c:irua:6782 Serial 1609  
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. doi  openurl
  Title Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Type A1 Journal article
  Year 2003 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 98 Issue Pages 27-42  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000186831500003 Publication Date 2003-04-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 26 Open Access  
  Notes Approved Most recent IF: 2.843; 2003 IF: 1.665  
  Call Number UA @ lucian @ c:irua:47516 Serial 1749  
Permanent link to this record
 
 
Author Van Aert, S.; Chen, J.H.; van Dyck, D. pdf  doi
openurl 
  Title Linear versus non-linear structural information limit in high-resolution transmission electron microscopy Type A1 Journal article
  Year 2010 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 110 Issue 11 Pages 1404-1410  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract A widely used performance criterion in high-resolution transmission electron microscopy (HRTEM) is the information limit. It corresponds to the inverse of the maximum spatial object frequency that is linearly transmitted with sufficient intensity from the exit plane of the object to the image plane and is limited due to partial temporal coherence. In practice, the information limit is often measured from a diffractogram or from Young's fringes assuming a weak phase object scattering beyond the inverse of the information limit. However, for an aberration corrected electron microscope, with an information limit in the sub-angstrom range, weak phase objects are no longer applicable since they do not scatter sufficiently in this range. Therefore, one relies on more strongly scattering objects such as crystals of heavy atoms observed along a low index zone axis. In that case, dynamical scattering becomes important such that the non-linear and linear interaction may be equally important. The non-linear interaction may then set the experimental cut-off frequency observed in a diffractogram. The goal of this paper is to quantify both the linear and the non-linear information transfer in terms of closed form analytical expressions. Whereas the cut-off frequency set by the linear transfer can be directly related with the attainable resolution, information from the non-linear transfer can only be extracted using quantitative, model-based methods. In contrast to the historic definition of the information limit depending on microscope parameters only, the expressions derived in this paper explicitly incorporate their dependence on the structure parameters as well. In order to emphasize this dependence and to distinguish from the usual information limit, the expressions derived for the inverse cut-off frequencies will be referred to as the linear and non-linear structural information limit. The present findings confirm the well-known result that partial temporal coherence has different effects on the transfer of the linear and non-linear terms, such that the non-linear imaging contributions are damped less than the linear imaging contributions at high spatial frequencies. This will be important when coherent aberrations such as spherical aberration and defocus are reduced.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000282562100008 Publication Date 2010-07-15  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 6 Open Access  
  Notes Fwo Approved Most recent IF: 2.843; 2010 IF: 2.063  
  Call Number UA @ lucian @ c:irua:83689 Serial 1821  
Permanent link to this record
 
 
Author den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. pdf  doi
openurl 
  Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework Type A1 Journal article
  Year 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 104 Issue 2 Pages 83-106  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000230526400001 Publication Date 2005-04-09  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 70 Open Access  
  Notes Approved Most recent IF: 2.843; 2005 IF: 2.490  
  Call Number UA @ lucian @ c:irua:57229 Serial 1959  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. pdf  doi
openurl 
  Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example Type A1 Journal article
  Year 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 104 Issue 2 Pages 107-125  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000230526400002 Publication Date 2005-04-08  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 37 Open Access  
  Notes Approved Most recent IF: 2.843; 2005 IF: 2.490  
  Call Number UA @ lucian @ c:irua:57131 Serial 1960  
Permanent link to this record
 
 
Author Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. pdf  doi
openurl 
  Title Measuring porosity at the nanoscale by quantitative electron tomography Type A1 Journal article
  Year 2010 Publication Nano letters Abbreviated Journal Nano Lett  
  Volume 10 Issue 12 Pages 5014-5019  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Quantitative electron tomography is proposed to characterize porous materials at a nanoscale. To achieve reliable three-dimensional (3D) quantitative information, the influence of missing wedge artifacts and segmentation methods is investigated. We are presenting the Discrete Algebraic Reconstruction Algorithm as the most adequate tomography method to measure porosity at the nanoscale. It provides accurate 3D quantitative information, regardless the presence of a missing wedge. As an example, we applied our approach to nanovoids in La2Zr2O7 thin films.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Washington Editor  
  Language Wos 000284990900040 Publication Date 2010-11-22  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1530-6984;1530-6992; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 12.712 Times cited 79 Open Access  
  Notes Esteem 026019 Approved Most recent IF: 12.712; 2010 IF: 12.219  
  Call Number UA @ lucian @ c:irua:87658 Serial 1967  
Permanent link to this record
 
 
Author Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. pdf  url
doi  openurl
  Title A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM Type A1 Journal article
  Year 2014 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 141 Issue Pages 22-31  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract The conventional approach to object reconstruction through electron tomography is to reduce the three-dimensional problem to a series of independent two-dimensional slice-by-slice reconstructions. However, at atomic resolution the image of a single atom extends over many such slices and incorporating this image as prior knowledge in tomography or depth sectioning therefore requires a fully three-dimensional treatment. Unfortunately, the size of the three-dimensional projection operator scales highly unfavorably with object size and readily exceeds the available computer memory. In this paper, it is shown that for incoherent image formation the memory requirement can be reduced to the fundamental lower limit of the object size, both for tomography and depth sectioning. Furthermore, it is shown through multislice calculations that high angle annular dark field scanning transmission electron microscopy can be sufficiently incoherent for the reconstruction of single element nanocrystals, but that dynamical diffraction effects can cause classification problems if more than one element is present. (C) 2014 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000335766600004 Publication Date 2014-03-22  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 6 Open Access  
  Notes ResearchFoundationFlanders(FWO;G.0393.11; G.0064.10;andG.0374.13); European Union Seventh Frame- workProgramme [FP7/2007-2013]under Grant agreement no. 312483 (ESTEEM2).; esteem2jra2; esteem2jra4 Approved Most recent IF: 2.843; 2014 IF: 2.436  
  Call Number UA @ lucian @ c:irua:117650 Serial 1992  
Permanent link to this record
 
 
Author Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. pdf  doi
openurl 
  Title A method to determine the local surface profile from reconstructed exit waves Type A1 Journal article
  Year 2011 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 111 Issue 8 Pages 1352-1359  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Reconstructed exit waves are useful to quantify unknown structure parameters such as the position and composition of the atom columns at atomic scale. Existing techniques provide a complex wave in a flat plane which is close to the plane where the electrons leave the atom columns. However, due to local deviation in the flatness of the exit surface, there will be an offset between the plane of reconstruction and the actual exit of a specific atom column. Using the channelling theory, it has been shown that this defocus offset can in principle be determined atom column-by-atom column. As such, the surface roughness could be quantified at atomic scale. However, the outcome strongly depends on the initial plane of reconstruction especially in a crystalline structure. If this plane is further away from the true exit, the waves of the atom columns become delocalized and interfere mutually which strongly complicates the interpretation of the exit wave in terms of the local structure. In this paper, we will study the delocalization with defocus using the channelling theory in a more systematic way.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000300461100049 Publication Date 2011-05-03  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 3 Open Access  
  Notes Fwo Approved Most recent IF: 2.843; 2011 IF: 2.471  
  Call Number UA @ lucian @ c:irua:88941 Serial 2017  
Permanent link to this record
 
 
Author van den Broek, W.; Van Aert, S.; van Dyck, D. doi  openurl
  Title A model based atomic resolution tomographic algorithm Type A1 Journal article
  Year 2009 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 109 Issue 12 Pages 1485-1490  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Tomography with high angular annular dark field scanning transmission electron microscopy at atomic resolution can be greatly improved if one is able to take advantage of prior knowledge. In this paper we present a reconstruction technique that explicitly takes into account the microscope parameters and the atomic nature of the projected object. This results in a more accurate estimate of the atomic positions and in a good resistance to noise. The reconstruction is a maximum likelihood estimator of the object. Moreover, the limits to the precision have been explored, allowing for a prediction of the amount of expected noise in the reconstruction for a certain experimental setup. We believe that the proposed reconstruction technique can be generalized to other tomographic experiments.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000271840200010 Publication Date 2009-08-28  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 17 Open Access  
  Notes Approved Most recent IF: 2.843; 2009 IF: 2.067  
  Call Number UA @ lucian @ c:irua:78588 Serial 2097  
Permanent link to this record
 
 
Author van den Broek, W.; Van Aert, S.; van Dyck, D. pdf  doi
openurl 
  Title A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy Type A1 Journal article
  Year 2010 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 110 Issue 5 Pages 548-554  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Depth sectioning in high angular annular dark field scanning transmission electron microscopy is considered a candidate for three-dimensional characterization on the atomic scale. However at present the depth resolution is still far from the atomic level, due to strong limitations in the opening angle of the beam. In this paper we introduce a new, parameter based tomographic reconstruction algorithm that allows to make maximal use of the prior knowledge about the constituent atom types and the microscope settings, so as to retrieve the atomic positions and push the resolution to the atomic level in all three dimensions.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000279065700022 Publication Date 2009-09-21  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 16 Open Access  
  Notes Fwo Approved Most recent IF: 2.843; 2010 IF: 2.063  
  Call Number UA @ lucian @ c:irua:83690 Serial 2104  
Permanent link to this record
 
 
Author Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. pdf  doi
openurl 
  Title Modification of the multislice method for calculating coherent STEM images Type A1 Journal article
  Year 1995 Publication Physica status solidi: A: applied research Abbreviated Journal  
  Volume 150 Issue Pages 13-22  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Berlin Editor  
  Language Wos A1995RQ21500002 Publication Date 2007-01-12  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0031-8965;1521-396X; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 5 Open Access  
  Notes Approved no  
  Call Number UA @ lucian @ c:irua:13292 Serial 2159  
Permanent link to this record
 
 
Author De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. pdf  doi
openurl 
  Title On the interpretation of HREM images of partially ordered alloys Type A1 Journal article
  Year 1995 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 60 Issue 2 Pages 265-282  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract The ordering for 11/20 alloys has been studied by high-resolution electron microscopy (HREM). The distribution of the intensity maxima in the HREM image have been statistically examined, which provides a profound basis for the image interpretation. Processing of the HREM images allows ''dark-field'' images to be obtained, exhibiting a two-dimensional distribution of those columns which contain the most information in order to interpret the short-range order correlations. Pair correlations and higher cluster correlations between projected columns can be visualised, providing unique information about the ordering as retrieved from an experimental result without any other assumption. The method has been applied to Au4Cr and to Au4Mn to interpret the quenched short-range order state and the transition to long-range order.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos A1995TZ14700008 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.436 Times cited 20 Open Access  
  Notes Approved no  
  Call Number UA @ lucian @ c:irua:13014 Serial 2438  
Permanent link to this record
 
 
Author Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. pdf  url
doi  openurl
  Title Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images Type A1 Journal article
  Year 2014 Publication Applied physics letters Abbreviated Journal Appl Phys Lett  
  Volume 105 Issue 6 Pages 063116  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images. Since light elements play a key role in many technologically important materials, such as lithium-battery devices or hydrogen storage applications, much effort has been made to optimize the STEM technique in order to detect light elements. Therefore, classical performance criteria, such as contrast or signal-to-noise ratio, are often discussed hereby aiming at improvements of the direct visual interpretability. However, when images are interpreted quantitatively, one needs an alternative criterion, which we derive based on statistical detection theory. Using realistic simulations of technologically important materials, we demonstrate the benefits of the proposed method and compare the results with existing approaches.  
  Address  
  Corporate Author Thesis  
  Publisher American Institute of Physics Place of Publication New York, N.Y. Editor  
  Language Wos 000341188700073 Publication Date 2014-08-14  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0003-6951;1077-3118; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 3.411 Times cited 12 Open Access  
  Notes FWO (G.0393.11; G.0064.10; and G.0374.13); European Union Seventh Framework Programme [FP7/2007-2013] under Grant Agreement No. 312483 (ESTEEM2); esteem2_jra2 Approved Most recent IF: 3.411; 2014 IF: 3.302  
  Call Number UA @ lucian @ c:irua:118333 Serial 2482  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. doi  openurl
  Title Optimal experimental design of STEM measurement of atom column positions Type A1 Journal article
  Year 2002 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 90 Issue Pages 273-289  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000174770900004 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 35 Open Access  
  Notes Approved Most recent IF: 2.843; 2002 IF: 1.772  
  Call Number UA @ lucian @ c:irua:47517 Serial 2483  
Permanent link to this record
 
 
Author Cao, S.; Tirry, W.; van den Broek, W.; Schryvers, D. pdf  doi
openurl 
  Title Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in NiTi Type A1 Journal article
  Year 2009 Publication Journal of microscopy Abbreviated Journal J Microsc-Oxford  
  Volume 233 Issue 1 Pages 61-68  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract The 3D morphology and distribution of lenticular Ni4Ti3 precipitates in the austenitic B2 matrix of a binary Ni51Ti49 alloy has been investigated by a slice-and-view procedure in a dual-beam focused ion beam/scanning electron microscope system. Due to the weak contrast of the precipitates, proper imaging conditions need to be selected first to allow for semi-automated image treatment. Knowledgeable imaging is further needed to ensure that all variants of the precipitates are observed with equal probability, regardless of sample orientation. Finally, a volume ratio of 10.2% for the Ni4Ti3 precipitates could be calculated, summed over all variants, which yields a net composition of Ni50.27Ti49.73 for the matrix, leading to an increase of 125 degrees for the martensitic start temperature. Also, the expected relative orientation of the different variants of the precipitates could be confirmed.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Oxford Editor  
  Language Wos 000262511900008 Publication Date 2009-01-15  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0022-2720;1365-2818; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.692 Times cited 22 Open Access  
  Notes Multimat Fwo; G0465.05 Approved Most recent IF: 1.692; 2009 IF: 1.612  
  Call Number UA @ lucian @ c:irua:76026 Serial 2486  
Permanent link to this record
 
 
Author Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G. pdf  doi
openurl 
  Title A peculiar diffraction effect in FCC crystals of C60 Type A1 Journal article
  Year 1992 Publication Physica status solidi: A: applied research Abbreviated Journal  
  Volume 131 Issue Pages 589-604  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Berlin Editor  
  Language Wos A1992JE20400030 Publication Date 2007-01-13  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0031-8965;1521-396X; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 13 Open Access  
  Notes Approved no  
  Call Number UA @ lucian @ c:irua:4371 Serial 2568  
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; den Dekker, A.J. doi  openurl
  Title Physical limits on atomic resolution Type A1 Journal article
  Year 2004 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal  
  Volume 10 Issue Pages 153-157  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Cambridge, Mass. Editor  
  Language Wos 000188882100022 Publication Date 2004-08-11  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.891 Times cited 14 Open Access  
  Notes Approved Most recent IF: 1.891; 2004 IF: 2.389  
  Call Number UA @ lucian @ c:irua:47515 Serial 2616  
Permanent link to this record
 
 
Author Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. pdf  doi
openurl 
  Title Plasmon holographic experiments: theoretical framework Type A1 Journal article
  Year 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 102 Issue 3 Pages 239-255  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract A theoretical framework is described to understand the results of plasmon holography experiments leading to insight in the meaning of the experimental results and pointing out directions for future experiments. The framework is based on the formalism of mutual intensity to describe how coherence is transferred through an optical system. For the inelastic interaction with the object, an expression for the volume. plasmon excitations in a free electron gas is used as a model for the behaviour of aluminium. The formalism leads to a clear graphical intuitive tool for under-standing the experiments. It becomes evident that the measured coherence is solely related to the angular distribution of the plasmon scattering in the case of bulk plasmons. After describing the framework, the special case of coherence outside a spherical particle is treated and the seemingly controversial idea of a plasmon with a limited coherence length obtained front experiments is clarified. (C) 2004 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000226436600010 Publication Date 2004-11-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 43 Open Access  
  Notes Fwo Approved Most recent IF: 2.843; 2005 IF: 2.490  
  Call Number UA @ lucian @ c:irua:57133UA @ admin @ c:irua:57133 Serial 2643  
Permanent link to this record
 
 
Author Heidari Mezerji, H.; van den Broek, W.; Bals, S. pdf  doi
openurl 
  Title A practical method to determine the effective resolution in incoherent experimental electron tomography Type A1 Journal article
  Year 2011 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 111 Issue 5 Pages 330-336  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract It is not straightforward to determine resolution for a 3D reconstruction when performing an electron tomography experiment. Different contributions such as missing wedge and misalignment add up and often influence the final resolution in an anisotropic manner. The conventional resolution measures can not be used for all of the reconstruction techniques, especially for iterative techniques which are more commonly used for electron tomography in materials science. Here we define a quantitative resolution measure that determines the resolution in three orthogonal directions of the reconstruction. As an application we use this measure to determine the optimum number of simultaneous iterative reconstruction technique (SIRT) iterations to reconstruct the gold nanoparticles, based on a high angle annular dark field STEM (HAADF-STEM) tilt series.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000289396900005 Publication Date 2011-01-24  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 26 Open Access  
  Notes Esteem 026019; Fwo Approved Most recent IF: 2.843; 2011 IF: 2.471  
  Call Number UA @ lucian @ c:irua:87606 Serial 2688  
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Author Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. openurl 
  Title Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis Type A1 Journal article
  Year 2003 Publication Institute of physics conference series Abbreviated Journal  
  Volume Issue 180 Pages 19-22  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Semiconductor heterostructures are used for the fabrication of optoelectronic devices. Performance of such devices is governed by their chemical morphology. The composition distribution of quantum wells and dots is influenced by kinetic growth processes which are not understood completely at present. To obtain more information about these effects, methods for composition determination with a spatial resolution at a near atomic scale are necessary. In this paper we focus on the present state of the composition evaluation by the lattice fringe analysis (CELFA) technique and explain the basic ideas, optimum imaging conditions, precision and accuracy.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0-7503-0979-2 ISBN Additional Links UA library record; WoS full record;  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:95118 Serial 2710  
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Author Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. pdf  doi
openurl 
  Title Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy Type A1 Journal article
  Year 2009 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 109 Issue 10 Pages 1236-1244  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this theory, a model is required describing the image contrast of the HAADF STEM images. Therefore, a simple, effective incoherent model has been assumed which takes the probe intensity profile into account. The scattered intensities can then be estimated by fitting this model to an experimental HAADF STEM image. These estimates are used as a performance measure to distinguish between different atomic column types and to identify the nature of unknown columns with good accuracy and precision using statistical hypothesis testing. The reliability of the method is supported by means of simulated HAADF STEM images as well as a combination of experimental images and electron energy-loss spectra. It is experimentally shown that statistically meaningful information on the composition of individual columns can be obtained even if the difference in averaged atomic number Z is only 3. Using this method, quantitative mapping at atomic resolution using HAADF STEM images only has become possible without the need of simultaneously recorded electron energy loss spectra.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000270015200004 Publication Date 2009-05-28  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 166 Open Access  
  Notes Fwo; Esteem 026019 Approved Most recent IF: 2.843; 2009 IF: 2.067  
  Call Number UA @ lucian @ c:irua:78585UA @ admin @ c:irua:78585 Serial 2748  
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Author Bals, S.; Batenburg, K.J.; Liang, D.; Lebedev, O.; Van Tendeloo, G.; Aerts, A.; Martens, J.A.; Kirschhock, C.E. pdf  doi
openurl 
  Title Quantitative three-dimensional modeling of zeotile through discrete electron tomography Type A1 Journal article
  Year 2009 Publication Journal of the American Chemical Society Abbreviated Journal J Am Chem Soc  
  Volume 131 Issue 13 Pages 4769-4773  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Discrete electron tomography is a new approach for three-dimensional reconstruction of nanoscale objects. The technique exploits prior knowledge of the object to be reconstructed, which results in an improvement of the quality of the reconstructions. Through the combination of conventional transmission electron microscopy and discrete electron tomography with a model-based approach, quantitative structure determination becomes possible. In the present work, this approach is used to unravel the building scheme of Zeotile-4, a silica material with two levels of structural order. The layer sequence of slab-shaped building units could be identified. Successive layers were found to be related by a rotation of 120°, resulting in a hexagonal space group. The Zeotile-4 material is a demonstration of the concept of successive structuring of silica at two levels. At the first level, the colloid chemical properties of Silicalite-1 precursors are exploited to create building units with a slablike geometry. At the second level, the slablike units are tiled using a triblock copolymer to serve as a mesoscale structuring agent.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Washington, D.C. Editor  
  Language Wos 000264806300050 Publication Date 2009-03-16  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0002-7863;1520-5126; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 13.858 Times cited 58 Open Access  
  Notes Fwo; Iap; Esteem 026019 Approved Most recent IF: 13.858; 2009 IF: 8.580  
  Call Number UA @ lucian @ c:irua:76393 Serial 2767  
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Author Bals, S.; Batenburg, J.; Verbeeck, J.; Sijbers, J.; Van Tendeloo, G. pdf  doi
openurl 
  Title Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes Type A1 Journal article
  Year 2007 Publication Nano letters Abbreviated Journal Nano Lett  
  Volume 7 Issue 12 Pages 3669-3674  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract The three-dimensional (3D) structure and chemical composition of bamboo-like carbon nanotubes including the catalyst particles that are. used during their growth are studied by discrete electron tomography in combination with energy-filtered transmission electron microscopy. It is found that cavities are present in the catalyst particles. Furthermore, only a small percentage of the catalyst particles consist of pure Cu, since a large volume fraction of the particles is oxidized to CU(2)0. These volume fractions are determined quantitatively from 3D reconstructions obtained by discrete tomography.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Washington Editor  
  Language Wos 000251581600022 Publication Date 2007-11-14  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1530-6984;1530-6992; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 12.712 Times cited 78 Open Access  
  Notes Fwo; Esteem Approved Most recent IF: 12.712; 2007 IF: 9.627  
  Call Number UA @ lucian @ c:irua:66762UA @ admin @ c:irua:66762 Serial 2768  
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Author Malladi, S.K.; Xu, Q.; van Huis, M.A.; Tichelaar, F.D.; Batenburg, K.J.; Yucelen, E.; Dubiel, B.; Czyrska-Filemonowicz, A.; Zandbergen, H.W. pdf  doi
openurl 
  Title Real-time atomic scale imaging of nanostructural evolution in aluminum alloys Type A1 Journal article
  Year 2014 Publication Nano Letters Abbreviated Journal Nano Lett  
  Volume 14 Issue 1 Pages 384-389  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract We present a new approach to study the three-dimensional compositional and structural evolution of metal alloys during heat treatments such as commonly used for improving overall material properties. It relies on in situ heating in a high-resolution scanning transmission electron microscope (STEM). The approach is demonstrated using a commercial Al alloy AA2024 at 100-240 degrees C, showing in unparalleled detail where and how precipitates nucleate, grow,or dissolve. The observed size evolution of individual precipitates enables a separation between nucleation and growth phenomena, necessary for the development of refined growth models. We conclude that the in situ heating STEM approach opens a route to a much faster determination of the interplay between local compositions, heat treatments, microstructure, and mechanical properties of new alloys.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Washington Editor  
  Language Wos 000329586700061 Publication Date 2013-12-13  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1530-6984;1530-6992; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 12.712 Times cited 12 Open Access  
  Notes Approved Most recent IF: 12.712; 2014 IF: 13.592  
  Call Number UA @ lucian @ c:irua:114789 Serial 2833  
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Author Van Aert, S.; van Dyck, D.; den Dekker, A.J. url  doi
openurl 
  Title Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative Type A1 Journal article
  Year 2006 Publication Optics express Abbreviated Journal Opt Express  
  Volume 14 Issue 9 Pages 3830-3839  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000237296200013 Publication Date 2006-05-04  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1094-4087; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 3.307 Times cited 45 Open Access  
  Notes Fwo Approved Most recent IF: 3.307; 2006 IF: 4.009  
  Call Number UA @ lucian @ c:irua:58262 Serial 2883  
Permanent link to this record
 
 
Author Bals, S.; Casavola, M.; van Huis, M.A.; Van Aert, S.; Batenburg, K.J.; Van Tendeloo, G.; Vanmaekelbergh, D. pdf  url
doi  openurl
  Title Three-dimensional atomic imaging of colloidal core-shell nanocrystals Type A1 Journal article
  Year 2011 Publication Nano letters Abbreviated Journal Nano Lett  
  Volume 11 Issue 8 Pages 3420-3424  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Colloidal coreshell semiconductor nanocrystals form an important class of optoelectronic materials, in which the exciton wave functions can be tailored by the atomic configuration of the core, the interfacial layers, and the shell. Here, we provide a trustful 3D characterization at the atomic scale of a free-standing PbSe(core)CdSe(shell) nanocrystal by combining electron microscopy and discrete tomography. Our results yield unique insights for understanding the process of cation exchange, which is widely employed in the synthesis of coreshell nanocrystals. The study that we present is generally applicable to the broad range of colloidal heteronanocrystals that currently emerge as a new class of materials with technological importance.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Washington Editor  
  Language Wos 000293665600062 Publication Date 2011-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1530-6984;1530-6992; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 12.712 Times cited 121 Open Access  
  Notes Esteem 026019; Fwo Approved Most recent IF: 12.712; 2011 IF: 13.198  
  Call Number UA @ lucian @ c:irua:91263 Serial 3643  
Permanent link to this record
 
 
Author Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. pdf  doi
openurl 
  Title Three-dimensional atomic imaging of crystalline nanoparticles Type A1 Journal article
  Year 2011 Publication Nature Abbreviated Journal Nature  
  Volume 470 Issue 7334 Pages 374-377  
  Keywords (up) A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract Determining the three-dimensional (3D) arrangement of atoms in crystalline nanoparticles is important for nanometre-scale device engineering and also for applications involving nanoparticles, such as optoelectronics or catalysis. A nanoparticles physical and chemical properties are controlled by its exact 3D morphology, structure and composition1. Electron tomography enables the recovery of the shape of a nanoparticle from a series of projection images2, 3, 4. Although atomic-resolution electron microscopy has been feasible for nearly four decades, neither electron tomography nor any other experimental technique has yet demonstrated atomic resolution in three dimensions. Here we report the 3D reconstruction of a complex crystalline nanoparticle at atomic resolution. To achieve this, we combined aberration-corrected scanning transmission electron microscopy5, 6, 7, statistical parameter estimation theory8, 9 and discrete tomography10, 11. Unlike conventional electron tomography, only two images of the targeta silver nanoparticle embedded in an aluminium matrixare sufficient for the reconstruction when combined with available knowledge about the particles crystallographic structure. Additional projections confirm the reliability of the result. The results we present help close the gap between the atomic resolution achievable in two-dimensional electron micrographs and the coarser resolution that has hitherto been obtained by conventional electron tomography.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication London Editor  
  Language Wos 000287409100037 Publication Date 2011-02-02  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0028-0836;1476-4687; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 40.137 Times cited 341 Open Access  
  Notes Esteem 026019 Approved Most recent IF: 40.137; 2011 IF: 36.280  
  Call Number UA @ lucian @ c:irua:86745 Serial 3644  
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