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  Author Title Year Publication Volume Times cited Additional Links Links
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. Atom counting from a combination of two ADF STEM images 2024 Ultramicroscopy 255 UA library record; WoS full record pdf url doi
Schryvers, D.; Cao, S.; Tirry, W.; Idrissi, H.; Van Aert, S. Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials 2013 Science and technology of advanced materials 14 6 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. Atomic resolution mapping of phonon excitations in STEM-EELS experiments 2014 Ultramicroscopy 147 22 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record url doi
Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H. Dedicated TEM on domain boundaries from phase transformations and crystal growth 2013 Phase transitions 86 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Salje, E.K.H. Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy 2012 Advanced materials 24 150 UA library record; WoS full record; WoS citing articles pdf doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. Effect of amorphous layers on the interpretation of restored exit waves 2009 Ultramicroscopy 109 10 UA library record; WoS full record; WoS citing articles pdf doi
Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. Electronically coupled complementary interfaces between perovskite band insulators 2006 Nature materials 5 315 UA library record; WoS full record; WoS citing articles pdf doi
Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) 2012 Zeitschrift für Kristallographie 227 4 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. Functional twin boundaries 2013 Phase transitions 86 5 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Van Aert, S.; Van Tendeloo, G. High resolution electron tomography 2013 Current opinion in solid state and materials science 17 24 UA library record; WoS full record; WoS citing articles pdf doi
Morozov, V.A.; Bertha, A.; Meert, K.W.; Van Rompaey, S.; Batuk, D.; Martinez, G.T.; Van Aert, S.; Smet, P.F.; Raskina, M.V.; Poelman, D.; Abakumov, A.M.; Hadermann, J.; Incommensurate modulation and luminescence in the CaGd2(1-x)Eu2x(MoO4)4(1-y)(WO)4y (0\leq x\leq1, 0\leq y\leq1) red phosphors 2013 Chemistry of materials 25 63 UA library record; WoS full record; WoS citing articles doi
Lu, J.; Martinez, G.T.; Van Aert, S.; Schryvers, D. Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy 2014 Physica status solidi: B: basic research 251 2 UA library record; WoS full record; WoS citing articles pdf doi
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Van Aert, S.; Bertoni, G. Model-based quantification of EELS spectra: including the fine structure 2006 Ultramicroscopy 106 38 UA library record; WoS full record; WoS citing articles pdf doi
de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. Optimal experimental design for nano-particle atom-counting from high-resolution STEM images 2015 Ultramicroscopy 151 24 UA library record; WoS full record; WoS citing articles pdf url doi
Boschker, H.; Huijben, M.; Vailinois, A.; Verbeeck, J.; Van Aert, S.; Luysberg, M.; Bals, S.; Van Tendeloo, G.; Houwman, E.P.; Koster, G.; Blank, D.H.A.; Rijnders, G. Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics 2011 Journal of physics: D: applied physics 44 99 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. Procedure to count atoms with trustworthy single-atom sensitivity 2013 Physical review : B : condensed matter and materials physics 87 106 UA library record; WoS full record; WoS citing articles url doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
Bals, S.; Goris, B.; Altantzis, T.; Heidari, H.; Van Aert, S.; Van Tendeloo, G. Seeing and measuring in 3D with electrons 2014 Comptes rendus : physique 15 15 UA library record; WoS full record; WoS citing articles pdf url doi
Jones, L.; Yang, H.; Pennycook, T.J.; Marshall, M.S.J.; Van Aert, S.; Browning, N.D.; Castell, M.R.; Nellist, P.D. Smart Align : a new tool for robust non-rigid registration of scanning microscope data 2015 Advanced Structural and Chemical Imaging 1 131 UA library record; WoS full record; WoS citing articles pdf url doi
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range 2006 Physical review letters 96 69 UA library record; WoS full record; WoS citing articles url doi
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy 2007 Microscopy and microanalysis 13 UA library record pdf doi
Molina-Luna, L.; Duerrschnabel, M.; Turner, S.; Erbe, M.; Martinez, G.T.; Van Aert, S.; Holzapfel, B.; Van Tendeloo, G. Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films 2015 Superconductor science and technology 28 4 UA library record; WoS full record; WoS citing articles pdf doi
Liao, Z.; Huijben, M.; Zhong, Z.; Gauquelin, N.; Macke, S.; Green, R.J.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Held, K.; Sawatzky, G.A.; Koster, G.; Rijnders, G. Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling 2016 Nature materials 15 273 UA library record; WoS full record; WoS citing articles url doi
van den Bos, K.H. W.; De Backer, A.; Martinez, G.T.; Winckelmans, N.; Bals, S.; Nellist, P.D.; Van Aert, S. Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy 2016 Physical review letters 116 46 UA library record; WoS full record; WoS citing articles pdf url doi
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