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Locating light and heavy atomic column positions with picometer precision using ISTEM”. van den Bos KHW, Krause FF, Béché, A, Verbeeck J, Rosenauer A, Van Aert S, Ultramicroscopy 172, 75 (2016). http://doi.org/10.1016/j.ultramic.2016.10.003
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In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals”. Geuchies JJ, van Overbeek C, Evers WH, Goris B, de Backer A, Gantapara AP, Rabouw FT, Hilhorst J, Peters JL, Konovalov O, Petukhov AV, Dijkstra M, Siebbeles LDA, van Aert S, Bals S, Vanmaekelbergh D, Nature materials 15, 1248 (2016). http://doi.org/10.1038/nmat4746
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Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM”. Jones L, Martinez GT, Béché, A, Van Aert S, Nellist PD, Microscopy and microanalysis 20, 126 (2014). http://doi.org/10.1017/S1431927614002359
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The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data”. Van Aert S, Bals S, Chang LY, den Dekker AJ, Kirkland AI, Van Dyck D, Van Tendeloo G Springer, Berlin, page 97 (2008).
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High resolution electron microscopy from imaging towards measuring”. Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3. Ieee, page 2081 (2001).
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Atom-counting in High Resolution Electron Microscopy: TEM or STEM –, that's the question”. Gonnissen J, De Backer A, den Dekker AJ, Sijbers J, Van Aert S, Ultramicroscopy 174, 112 (2016). http://doi.org/10.1016/j.ultramic.2016.10.011
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Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure”. Alania M, Altantzis T, De Backer A, Lobato I, Bals S, Van Aert S, Ultramicroscopy 177, 36 (2016). http://doi.org/10.1016/j.ultramic.2016.11.002
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Controlled growth of hexagonal gold nanostructures during thermally induced self-assembling on Ge(001) surface”. Jany BR, Gauquelin N, Willhammar T, Nikiel M, van den Bos KHW, Janas A, Szajna K, Verbeeck J, Van Aert S, Van Tendeloo G, Krok F, Scientific reports 7, 42420 (2017). http://doi.org/10.1038/srep42420
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Hybrid statistics-simulations based method for atom-counting from ADF STEM images”. De wael A, De Backer A, Jones L, Nellist PD, Van Aert S, Ultramicroscopy 177, 69 (2017). http://doi.org/10.1016/j.ultramic.2017.01.010
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Highly Emissive Divalent-Ion-Doped Colloidal CsPb1–xMxBr3Perovskite Nanocrystals through Cation Exchange”. van der Stam W, Geuchies JJ, Altantzis T, van den Bos KHW, Meeldijk JD, Van Aert S, Bals S, Vanmaekelbergh D, de Mello Donega C, Journal of the American Chemical Society 139, 4087 (2017). http://doi.org/10.1021/jacs.6b13079
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Ligand-Induced Shape Transformation of PbSe Nanocrystals”. Peters JL, van den Bos KHW, Van Aert S, Goris B, Bals S, Vanmaekelbergh D, Chemistry of materials 29, 4122 (2017). http://doi.org/10.1021/acs.chemmater.7b01103
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One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work”. Pullini D, Sgroi M, Mahmoud A, Gauquelin N, Maschio L, Lorenzo-Ferrari AM, Groenen R, Damen C, Rijnders G, van den Bos KHW, Van Aert S, Verbeeck J, ACS applied materials and interfaces 9, 20974 (2017). http://doi.org/10.1021/acsami.7b04089
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How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?”.Alania M, De Backer A, Lobato I, Krause FF, Van Dyck D, Rosenauer A, Van Aert S, Ultramicroscopy 181, 134 (2017). http://doi.org/10.1016/j.ultramic.2016.12.013
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Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques”. Gauquelin N, van den Bos KHW, Béché, A, Krause FF, Lobato I, Lazar S, Rosenauer A, Van Aert S, Verbeeck J, Ultramicroscopy 181, 178 (2017). http://doi.org/10.1016/j.ultramic.2017.06.002
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Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities”. De Backer A, Jones L, Lobato I, Altantzis T, Goris B, Nellist PD, Bals S, Van Aert S, Nanoscale 9, 8791 (2017). http://doi.org/10.1039/C7NR02656K
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Long-Range Domain Structure and Symmetry Engineering by Interfacial Oxygen Octahedral Coupling at Heterostructure Interface”. Liao Z, Green RJ, Gauquelin N, Macke S, Li L, Gonnissen J, Sutarto R, Houwman EP, Zhong Z, Van Aert S, Verbeeck J, Sawatzky GA, Huijben M, Koster G, Rijnders G, Advanced functional materials 26, 6627 (2016). http://doi.org/10.1002/adfm.201602155
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Investigating lattice strain in Au nanodecahedrons”. Goris B, De Beenhouwer J, de Backer A, Zanaga D, Batenburg J, Sanchez-Iglesias A, Liz-Marzan L, Van Aert S, Sijbers J, Van Tendeloo G, Bals S, , 11 (2016). http://doi.org/10.1002/9783527808465.EMC2016.5519
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StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images”. De Backer A, van den Bos KHW, Van den Broek W, Sijbers J, Van Aert S, Journal of physics : conference series T2 –, Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK 902, 012013 (2017). http://doi.org/10.1088/1742-6596/902/1/012013
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Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement”. Alania M, Lobato Hoyos IP, Van Aert S, Ultramicroscopy 184, 188 (2018). http://doi.org/10.1016/J.ULTRAMIC.2017.08.021
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Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy”. Martinez GT, van den Bos KHW, Alania M, Nellist PD, Van Aert S, Ultramicroscopy 187, 84 (2018). http://doi.org/10.1016/j.ultramic.2018.01.005
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Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations”. Schryvers D, Salje EKH, Nishida M, De Backer A, Idrissi H, Van Aert S, Ultramicroscopy 176, 194 (2017). http://doi.org/10.1016/j.ultramic.2016.12.022
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Thickness dependent properties in oxide heterostructures driven by structurally induced metal-oxygen hybridization variations”. Liao Z, Gauquelin N, Green RJ, Macke S, Gonnissen J, Thomas S, Zhong Z, Li L, Si L, Van Aert S, Hansmann P, Held K, Xia J, Verbeeck J, Van Tendeloo G, Sawatzky GA, Koster G, Huijben M, Rijnders G, Advanced functional materials 27, 1606717 (2017). http://doi.org/10.1002/ADFM.201606717
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Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images”. Fatermans J, den Dekker A J, Müller-Caspary K, Lobato I, O’Leary C M, Nellist P D, Van Aert S, Physical review letters 121, 056101 (2018). http://doi.org/10.1103/PhysRevLett.121.056101
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Recent breakthroughs in scanning transmission electron microscopy of small species”. van den Bos KHW, Altantzis T, De Backer A, Van Aert S, Bals S, Advances in Physics: X 3, 1480420 (2018). http://doi.org/10.1080/23746149.2018.1480420
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Understanding the Effect of Iodide Ions on the Morphology of Gold Nanorods”. Amini MN, Altantzis T, Lobato I, Grzelczak M, Sánchez-Iglesias A, Van Aert S, Liz-Marzán LM, Partoens B, Bals S, Neyts EC, Particle and particle systems characterization 35, 1800051 (2018). http://doi.org/10.1002/ppsc.201800051
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Atomic-scale quantification of charge densities in two-dimensional materials”. Müller-Caspary K, Duchamp M, Roesner M, Migunov V, Winkler F, Yang H, Huth M, Ritz R, Simson M, Ihle S, Soltau H, Wehling T, Dunin-Borkowski RE, Van Aert S, Rosenauer A, Physical review B 98, 121408 (2018). http://doi.org/10.1103/PHYSREVB.98.121408
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Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp”. Guzzinati G, Altantzis T, Batuk M, De Backer A, Lumbeeck G, Samaee V, Batuk D, Idrissi H, Hadermann J, Van Aert S, Schryvers D, Verbeeck J, Bals S, Materials 11, 1304 (2018). http://doi.org/10.3390/ma11081304
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Metal–insulator-transition engineering by modulation tilt-control in perovskite nickelates for room temperature optical switching”. Liao Z, Gauquelin N, Green RJ, Müller-Caspary K, Lobato I, Li L, Van Aert S, Verbeeck J, Huijben M, Grisolia MN, Rouco V, El Hage R, Villegas JE, Mercy A, Bibes M, Ghosez P, Sawatzky GA, Rijnders G, Koster G, America 115, 9515 (2018). http://doi.org/10.1073/pnas.1807457115
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The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials”. van den Bos KHW, Janssens L, De Backer A, Nellist PD, Van Aert S, Ultramicroscopy 203, 155 (2019). http://doi.org/10.1016/j.ultramic.2018.12.004
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Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment”. Altantzis T, Lobato I, De Backer A, Béché, A, Zhang Y, Basak S, Porcu M, Xu Q, Sánchez-Iglesias A, Liz-Marzán LM, Van Tendeloo G, Van Aert S, Bals S, Nano letters 19, 477 (2019). http://doi.org/10.1021/acs.nanolett.8b04303
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