| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Osca, J.; Moors, K.; Sorée, B.; Serra, L. |
Fabry-Perot interferometry with gate-tunable 3D topological insulator nanowires |
2021 |
Nanotechnology |
32 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Moors, K.; Contino, A.; Van de Put, M.L.; Vandenberghe, W.G.; Fischetti, M., V; Magnus, W.; Sorée, B. |
Theoretical study of scattering in graphene ribbons in the presence of structural and atomistic edge roughness |
2019 |
Physical review materials |
3 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Adelmann, C.; Sankaran, K.; Dutta, S.; Gupta, A.; Kundu, S.; Jamieson, G.; Moors, K.; Pinna, N.; Ciofi, I.; Van Elshocht, S.; Bommels, J.; Boccardi, G.; Wilson, C.J.; Pourtois, G.; Tokei, Z. |
Alternative Metals: from ab initio Screening to Calibrated Narrow Line Models |
2018 |
Proceedings of the IEEE ... International Interconnect Technology Conference
T2 – IEEE International Interconnect Technology Conference (IITC), JUN 04-07, 2018, Santa Clara, CA |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
|
De Clercq, M.; Moors, K.; Sankaran, K.; Pourtois, G.; Dutta, S.; Adelmann, C.; Magnus, W.; Sorée, B. |
Resistivity scaling model for metals with conduction band anisotropy |
2018 |
Physical review materials |
2 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Sankaran, K.; Moors, K.; Dutta, S.; Adelmann, C.; Tokei, Z.; Pourtois, G. |
Metallic ceramics for low resitivity interconnects : an ab initio insight |
2018 |
Proceedings of the IEEE ... International Interconnect Technology Conference
T2 – IEEE International Interconnect Technology Conference (IITC), JUN 04-07, 2018, Santa Clara, CA |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Dutta, S.; Sankaran, K.; Moors, K.; Pourtois, G.; Van Elshocht, S.; Bommels, J.; Vandervorst, W.; Tokei, Z.; Adelmann, C. |
Thickness dependence of the resistivity of platinum-group metal thin films |
2017 |
Journal of applied physics |
122 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Moors, K.; Sorée, B.; Magnus, W. |
Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering |
2017 |
Microelectronic engineering |
167 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Moors, K.; Sorée, B.; Magnus, W. |
Validity criteria for Fermi's golden rule scattering rates applied to metallic nanowires |
2016 |
Journal of physics : condensed matter |
28 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Moors, K.; Sorée, B.; Magnus, W. |
Modeling surface roughness scattering in metallic nanowires |
2015 |
Journal of applied physics |
118 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Moors, K.; Soree, B.; Tokei, Z.; Magnus, W. |
Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes |
2015 |
On Ultimate Integration On Silicon (eurosoi-ulis) |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Moors, K.; Sorée, B.; Magnus, W. |
Analytic solution of Ando's surface roughness model with finite domain distribution functions |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
|
|
UA library record; WoS full record |
|
|
|
Moors, K.; Sorée, B.; Magnus, W. |
Modeling and tackling resistivity scaling in metal nanowires |
2015 |
International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]
T2 – International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 09-11, 2015, Washington, DC |
|
|
UA library record; WoS full record |
|
|
|
Moors, K.; Sorée, B.; Tokei, Z.; Magnus, W. |
Resistivity scaling and electron relaxation times in metallic nanowires |
2014 |
Journal of applied physics |
116 |
17 |
UA library record; WoS full record; WoS citing articles |
|
