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Fluorite-like phases in the BaF2-BiF3-Bi2O3 system-synthesis, conductivity and defect clustering”. Serov TV, Dombrovski EN, Ardashnikova EI, Dolgikh VA, el Omari M, el Omari M, Abaouz A, Senegas J, Chaban NG, Abakumov AM, Van Tendeloo G, Materials research bulletin 40, 821 (2005). http://doi.org/10.1016/j.materresbull.2005.02.007
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Heating of quasiparticles driven by oscillations of the order parameter in short superconducting microbridges”. Vodolazov DY, Peeters FM, Physical review : B : condensed matter and materials physics 83, 224523 (2011). http://doi.org/10.1103/PhysRevB.83.224523
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Hole states in nanocups in a magnetic field”. Čukarić, N, Arsoski V, Tadić, M, Peeters FM, Physical review : B : condensed matter and materials physics 85, 235425 (2012). http://doi.org/10.1103/PhysRevB.85.235425
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A La2−xGdxZr2O7layer deposited by chemical solution: a promising seed layer for the fabrication of high Jcand low cost coated conductors”. Muguerra H, Pescheux A-C, Meledin A, Van Tendeloo G, Soubeyroux J-L, Journal of materials chemistry C : materials for optical and electronic devices 3, 11766 (2015). http://doi.org/10.1039/C5TC03365A
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In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates”. Ghica C, Nistor L, Bender H, Steegen A, Lauwers A, Maex K, van Landuyt J, Journal of materials research 16, 701 (2001). http://doi.org/10.1557/JMR.2001.0121
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Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation”. Ignatova VA, Möller W, Conard T, Vandervorst W, Gijbels R, Applied physics A : materials science &, processing 81, 71 (2005). http://doi.org/10.1007/s00339-005-3239-8
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Microscopic model of surfaces in orientationally disordered ionic crystals : the (001) surface of KCN”. Zieliński P, Michel KH, Physical review : B : condensed matter and materials physics 46, 4806 (1992). http://doi.org/10.1103/PhysRevB.46.4806
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Nonlinear quantum magnetotransport in a strongly correlated two-dimensional electron liquid”. Monarkha YP, Shirahama K, Kono K, Peeters FM, Physical review : B : condensed matter and materials physics 58, 3762 (1998). http://doi.org/10.1103/PhysRevB.58.3762
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Superconducting current and proximity effect in ABA and ABC multilayer graphene Josephson junctions”. Muñoz WA, Covaci L, Peeters FM, Physical review : B : condensed matter and materials physics 88, 214502 (2013). http://doi.org/10.1103/PhysRevB.88.214502
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One-Step Microheterogeneous Formation of Rutile@Anatase Core–Shell Nanostructured Microspheres Discovered by Precise Phase Mapping”. Tarasov A, Hu Z-Y, Meledina M, Trusov G, Goodilin E, Van Tendeloo G, Dobrovolsky Y, The journal of physical chemistry: C : nanomaterials and interfaces 121, 4443 (2017). http://doi.org/10.1021/acs.jpcc.6b12991
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Remote electron plasmon polaron in graphene”. Krstajić, PM, Peeters FM, Physical review : B : condensed matter and materials physics 85, 085436 (2012). http://doi.org/10.1103/PhysRevB.85.085436
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Review of phonon behaviour and microstructural development leading to martensitic transformations in NixAl100-x alloys”. Tanner LE, Shapiro SM, Schryvers D, Noda Y, Shape memory materials and phenomena: fundamental aspects and applications 246, 265 (1992)
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Strain accommodation through facet matching in La1.85Sr0.15CuO4/Nd1.85Ce0.15CuO4 ramp-edge junctions”. Hoek M, Coneri F, Poccia N, Renshaw Wang X, Ke X, Van Tendeloo G, Hilgenkamp H, APL materials 3, 086101 (2015). http://doi.org/10.1063/1.4927796
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Structure of the hexagonal 16l perovskites Ba4Ca0.9Mn3.1O11.3 and Ba4Ca0.5Mn3Cu0.5O12-\delta by high-resolution electron microscopy”. Schuddinck W, Van Tendeloo G, Hervieu M, Floros N, Raveau B, Materials research bulletin 36, 2689 (2001). http://doi.org/10.1016/S0025-5408(01)00744-9
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:Ba2.1Bi0.9(O, F)6.8-\delta: a new ordered anion-excess fluorite”. Prituzhalov VA, Abakumov AM, Ardashnikova EI, Dolgikh VA, Van Tendeloo G, Materials research bulletin 42, 861 (2007). http://doi.org/10.1016/j.materresbull.2006.08.023
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Topological confinement in trilayer graphene”. de Sena SHR, Pereira JM, Peeters FM, Farias GA, Physical review : B : condensed matter and materials physics 89, 035420 (2014). http://doi.org/10.1103/PhysRevB.89.035420
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Zr substituted bismuth uranate”. Vannier R-N, Théry O, Kinowski C, Huvé, M, Van Tendeloo G, Suard E, Abraham F, Journal of materials chemistry 9, 435 (1999). http://doi.org/10.1039/a805829f
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Exceptional layered ordering of cobalt and iron in perovskites”. Lebedev OI, Turner S, Caignaert V, Cherepanov VA, Raveau B, Chemistry of materials 28, 2907 (2016). http://doi.org/10.1021/acs.chemmater.6b01046
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Ni cluster formation in low temperature annealed Ni50.6Ti49.4”. Pourbabak S, Wang X, Van Dyck D, Verlinden B, Schryvers D, Functional materials letters 10, 1740005 (2017). http://doi.org/10.1142/S1793604717400057
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One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work”. Pullini D, Sgroi M, Mahmoud A, Gauquelin N, Maschio L, Lorenzo-Ferrari AM, Groenen R, Damen C, Rijnders G, van den Bos KHW, Van Aert S, Verbeeck J, ACS applied materials and interfaces 9, 20974 (2017). http://doi.org/10.1021/acsami.7b04089
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Gaining new insight into low-temperature aqueous photochemical solution deposited ferroelectric PbTiO3 films”. De Dobbelaere C, Lourdes Calzada M, Bretos I, Jimenez R, Ricote J, Hadermann J, Hardy A, Van Bael MK, Materials chemistry and physics 174, 28 (2016). http://doi.org/10.1016/J.MATCHEMPHYS.2016.02.047
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The conversion mechanism of amorphous silicon to stoichiometric WS2”. Heyne MH, de Marneffe J-F, Nuytten T, Meersschaut J, Conard T, Caymax M, Radu I, Delabie A, Neyts EC, De Gendt S, Journal of materials chemistry C : materials for optical and electronic devices 6, 4122 (2018). http://doi.org/10.1039/C8TC00760H
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Measurement of local crystal lattice strain variations in dealloyed nanoporous gold”. Mahr C, Müller-Caspary K, Graf M, Lackmann A, Grieb T, Schowalter M, Krause FF, Mehrtens T, Wittstock A, Weissmueller J, Rosenauer A, Materials research letters 6, 84 (2018). http://doi.org/10.1080/21663831.2017.1396263
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Removal of alachlor, diuron and isoproturon in water in a falling film dielectric barrier discharge (DBD) reactor combined with adsorption on activated carbon textile: Reaction mechanisms and oxidation by-products”. Vanraes P, Wardenier N, Surmont P, Lynen F, Nikiforov A, Van Hulle SWH, Leys C, Bogaerts A, Journal of hazardous materials 354, 180 (2018). http://doi.org/10.1016/j.jhazmat.2018.05.007
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Electrostatic force-driven oxide heteroepitaxy for interface control”. Ren Z, Wu M, Chen X, Li W, Li M, Wang F, Tian H, Chen J, Xie Y, Mai J, Li X, Lu X, Lu Y, Zhang H, Van Tendeloo G, Zhang Z, Han G, Advanced materials 30, 1707017 (2018). http://doi.org/10.1002/ADMA.201707017
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Enhancement of toughness of Al-to-steel Friction Melt Bonded welds via metallic interlayers”. Jimenez-Mena N, Jacques PJ, Ding L, Gauquelin N, Schryvers D, Idrissi H, Delannay F, Simar A, Materials science and engineering: part A: structural materials: properties, microstructure and processing 740-741, 274 (2019). http://doi.org/10.1016/j.msea.2018.10.101
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Nanosecond Pulsed Discharge for CO2Conversion: Kinetic Modeling To Elucidate the Chemistry and Improve the Performance”. Heijkers S, Martini LM, Dilecce G, Tosi P, Bogaerts A, The journal of physical chemistry: C : nanomaterials and interfaces 123, 12104 (2019). http://doi.org/10.1021/acs.jpcc.9b01543
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Theoretical study of scattering in graphene ribbons in the presence of structural and atomistic edge roughness”. Moors K, Contino A, Van de Put ML, Vandenberghe WG, Fischetti M V, Magnus W, Sorée B, Physical review materials 3, 024001 (2019). http://doi.org/10.1103/PHYSREVMATERIALS.3.024001
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Controlling the interfacial conductance in LaAlO3/SrTiO3 in 90 degrees off-axis sputter deposition”. Yin C, Krishnan D, Gauquelin N, Verbeeck J, Aarts J, Physical review materials 3, 034002 (2019). http://doi.org/10.1103/PHYSREVMATERIALS.3.034002
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CO2 activation on TiO2-supported Cu5 and Ni5 nanoclusters : effect of plasma-induced surface charging”. Jafarzadeh A, Bal KM, Bogaerts A, Neyts EC, The journal of physical chemistry: C : nanomaterials and interfaces 123, 6516 (2019). http://doi.org/10.1021/ACS.JPCC.8B11816
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