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| Author | Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. | ||||
| Title | Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution | Type | A1 Journal article | ||
| Year | 2022 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume  |
233 | Issue | Pages | 113425 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | We report a study of scattering dynamics in crystals employing momentum-resolved scanning transmission electron microscopy under varying illumination conditions. As we perform successive changes of the probe focus, multiple real-space signals are obtained in dependence of the shape of the incident electron wave. With support from extensive simulations, each signal is shown to be characterised by an optimum focus for which the contrast is maximum and which differs among different signals. For instance, a systematic focus mismatch is found between images formed by high-angle scattering, being sensitive to thickness and chemical composition, and the first moment in diffraction space, being sensitive to electric fields. It follows that a single recording at one specific probe focus is usually insufficient to characterise materials comprehensively. Most importantly, we demonstrate in experiment and simulation that the second moment ( |
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000734396800009 | Publication Date | 2021-11-13 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.2 | Times cited | Open Access | OpenAccess | |
| Notes | We thank Dr. Florian Winkler for valuable discussions and experimental work at the early stages of this study. This work was supported by the Initiative and Network Fund of the Helmholtz Association (Germany) under contracts VH-NG-1317 and ZT-I-0025. This project furthermore received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (grant agreement No. 770887). | Approved | Most recent IF: 2.2 | ||
| Call Number | EMAT @ emat @c:irua:184833 | Serial | 6898 | ||
| Permanent link to this record | |||||
| Author | Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. | ||||
| Title | How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? | Type | A1 Journal article | ||
| Year | 2017 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
181 | Issue | 181 | Pages | 134-143 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In this paper, we investigate how precise atoms of a small nanocluster can ultimately be located in three dimensions (3D) from a tilt series of images acquired using annular dark field (ADF) scanning transmission electron microscopy (STEM). Therefore, we derive an expression for the statistical precision with which the 3D atomic position coordinates can be estimated in a quantitative analysis. Evaluating this statistical precision as a function of the microscope settings also allows us to derive the optimal experimental design. In this manner, the optimal angular tilt range, required electron dose, optimal detector angles, and number of projection images can be determined. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000411170800016 | Publication Date | 2016-12-15 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 3 | Open Access | OpenAccess |
| Notes | The authors acknowledge financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative. Reference No. 312483-ESTEEM2. The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0374.13N, G.0369.15N, G.0368.15N, and WO.010.16N) and a post-doctoral grant to A. De Backer, and from the DFG under contract No. RO-2057/4-2. | Approved | Most recent IF: 2.843 | ||
| Call Number | EMAT @ emat @ c:irua:144432 | Serial | 4618 | ||
| Permanent link to this record | |||||
| Author | Lobato, I.; Van Dyck, D. | ||||
| Title | MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA | Type | A1 Journal article | ||
| Year | 2015 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
156 | Issue | 156 | Pages | 9-17 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The main features and the GPU implementation of the MULTEM program are presented and described. This new program performs accurate and fast multislice simulations by including higher order expansion of the multislice solution of the high energy Schrodinger equation, the correct subslicing of the three-dimensional potential and top-bottom surfaces. The program implements different kinds of simulation for CTEM, STEM, ED, PED, CBED, ADF-TEM and ABF-HC with proper treatment of the spatial and temporal incoherences. The multislice approach described here treats the specimen as amorphous material which allows a straightforward implementation of the frozen phonon approximation. The generalized transmission function for each slice is calculated when is needed and then discarded. This allows us to perform large simulations that can include millions of atoms and keep the computer memory requirements to a reasonable level. (C) 2015 Elsevier B.V. All rights reserved. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000361001800003 | Publication Date | 2015-04-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 32 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2015 IF: 2.436 | |||
| Call Number | UA @ lucian @ c:irua:127848 | Serial | 4209 | ||
| Permanent link to this record | |||||
| Author | Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. | ||||
| Title | Modification of the multislice method for calculating coherent STEM images | Type | A1 Journal article | ||
| Year | 1995 | Publication | Physica status solidi: A: applied research | Abbreviated Journal | |
| Volume |
150 | Issue | Pages | 13-22 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Berlin | Editor | ||
| Language | Wos | A1995RQ21500002 | Publication Date | 2007-01-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0031-8965;1521-396X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 5 | Open Access | ||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:13292 | Serial | 2159 | ||
| Permanent link to this record | |||||
| Author | Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. | ||||
| Title | Towards quantitative high resolution electron microscopy? | Type | A1 Journal article | ||
| Year | 1995 | Publication | Institute of physics conference series | Abbreviated Journal | |
| Volume |
147 | Issue | Pages | 67-72 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The basics of the interpretation of high resolution images showing detail of the order of 0.1 nm are shortly explained here. The use of a field emission source, a CCD camera and an adapted reconstruction method for restoring the projected crystal potential (focus variation method) allows a quantitative interpretation of HREM images. Examples of partially disordered alloys and carbonate ordering in high Tc superconductors are presented. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | A1995BE67F00014 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0-7503-0357-3; 0951-3248; 0305-2346 | ISBN | Additional Links | UA library record; WoS full record; | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:13015 | Serial | 3688 | ||
| Permanent link to this record | |||||
| Author | Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. | ||||
| Title | Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals | Type | A1 Journal article | ||
| Year | 1994 | Publication | Physica status solidi: A | Abbreviated Journal | |
| Volume |
143 | Issue | 2 | Pages | 277-287 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The occurrence and origin of diffuse intensity contours in electron micrographs of AgBr crystals are investigated. The observations are interpreted in terms of a model, which attributes diffuse scattering to the presence of predominant atom or vacancy clusters of a particular polyhedral type. It is shown that irrespective of the crystal morphology, interstitial Ag ions order in AgBr material in clusters of finite size along 001 type planes. A different geometry of the diffuse intensity locus observed for triangular and hexagonal tabular grains is explained in terms of the different twin plane morphology of these grains. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Berlin | Editor | ||
| Language | Wos | A1994NW15300010 | Publication Date | 2007-01-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0031-8965;1521-396X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 7 | Open Access | ||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:99870 | Serial | 919 | ||
| Permanent link to this record | |||||
| Author | Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. | ||||
| Title | A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM | Type | A1 Journal article | ||
| Year | 2014 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
141 | Issue | Pages | 22-31 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The conventional approach to object reconstruction through electron tomography is to reduce the three-dimensional problem to a series of independent two-dimensional slice-by-slice reconstructions. However, at atomic resolution the image of a single atom extends over many such slices and incorporating this image as prior knowledge in tomography or depth sectioning therefore requires a fully three-dimensional treatment. Unfortunately, the size of the three-dimensional projection operator scales highly unfavorably with object size and readily exceeds the available computer memory. In this paper, it is shown that for incoherent image formation the memory requirement can be reduced to the fundamental lower limit of the object size, both for tomography and depth sectioning. Furthermore, it is shown through multislice calculations that high angle annular dark field scanning transmission electron microscopy can be sufficiently incoherent for the reconstruction of single element nanocrystals, but that dynamical diffraction effects can cause classification problems if more than one element is present. (C) 2014 Elsevier B.V. All rights reserved. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000335766600004 | Publication Date | 2014-03-22 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 6 | Open Access | |
| Notes | ResearchFoundationFlanders(FWO;G.0393.11; G.0064.10;andG.0374.13); European Union Seventh Frame- workProgramme [FP7/2007-2013]under Grant agreement no. 312483 (ESTEEM2).; esteem2jra2; esteem2jra4 | Approved | Most recent IF: 2.843; 2014 IF: 2.436 | ||
| Call Number | UA @ lucian @ c:irua:117650 | Serial | 1992 | ||
| Permanent link to this record | |||||
| Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. | ||||
| Title | High-resolution electron microscopy and electron tomography: resolution versus precision | Type | A1 Journal article | ||
| Year | 2002 | Publication | Journal of structural biology | Abbreviated Journal | J Struct Biol |
| Volume |
138 | Issue | Pages | 21-33 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York | Editor | ||
| Language | Wos | 000177978800003 | Publication Date | 2002-09-17 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1047-8477; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.767 | Times cited | 33 | Open Access | |
| Notes | Approved | Most recent IF: 2.767; 2002 IF: 4.194 | |||
| Call Number | UA @ lucian @ c:irua:47520 | Serial | 1446 | ||
| Permanent link to this record | |||||
| Author | Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. | ||||
| Title | An alternative approach to determine attainable resolution directly from HREM images | Type | A1 Journal article | ||
| Year | 2013 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
133 | Issue | Pages | 50-61 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The concept of resolution in high-resolution electron microscopy (HREM) is the power to resolve neighboring atoms. Since the resolution is related to the width of the point spread function of the microscope, it could in principle be determined from the image of a point object. However, in electron microscopy there are no ideal point objects. The smallest object is an individual atom. If the width of an atom is much smaller than the resolution of the microscope, this atom can still be considered as a point object. As the resolution of the microscope enters the sub-Å regime, information about the microscope is strongly entangled with the information about the atoms in HREM images. Therefore, we need to find an alternative method to determine the resolution in an object-independent way. In this work we propose to use the image wave of a crystalline object in zone axis orientation. Under this condition, the atoms of a column act as small lenses so that the electron beam channels through the atom column periodically. Because of this focusing, the image wave of the column can be much more peaked than the constituting atoms and can thus be a much more sensitive probe to measure the resolution. Our approach is to use the peakiness of the image wave of the atom column to determine the resolution. We will show that the resolution can be directly linked to the total curvature of the atom column wave. Moreover, we can then directly obtain the resolution of the microscope given that the contribution from the object is known, which is related to the bounding energy of the atom. The method is applied on an experimental CaTiO3 image wave. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000324471800007 | Publication Date | 2013-05-23 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record | |
| Impact Factor | 2.843 | Times cited | Open Access | ||
| Notes | FWO; Hercules; Esteem2; esteem2_jra2 | Approved | Most recent IF: 2.843; 2013 IF: 2.745 | ||
| Call Number | UA @ lucian @ c:irua:109919 | Serial | 90 | ||
| Permanent link to this record | |||||
| Author | Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G. | ||||
| Title | A peculiar diffraction effect in FCC crystals of C60 | Type | A1 Journal article | ||
| Year | 1992 | Publication | Physica status solidi: A: applied research | Abbreviated Journal | |
| Volume |
131 | Issue | Pages | 589-604 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Berlin | Editor | ||
| Language | Wos | A1992JE20400030 | Publication Date | 2007-01-13 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0031-8965;1521-396X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 13 | Open Access | ||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:4371 | Serial | 2568 | ||
| Permanent link to this record | |||||
| Author | Lobato, I.; van Dyck, D. | ||||
| Title | Improved multislice calculations for including higher-order Laue zones effects | Type | A1 Journal article | ||
| Year | 2012 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
119 | Issue | Pages | 63-71 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | A new method for including higher-order Laue zones (HOLZs) effects in an efficient way in electron scattering simulations has been developed and tested by detail calculations. The calculated results by the conventional multislice (CMS) method and the improved conventional multislice (ICMS) method using a large dynamical aperture to avoid numerical errors are compared with accurate results. We have found that the zero-order Laue zones (ZOLZs) reflection cannot be properly described only using the projected potential in the whole unit cell; in general, we need to subslice the electrostatic potential inside the unit cell. It is shown that the ICMS method has higher accuracy than the CMS method for the calculation of the ZOLZ, HOLZ and Pseudo-HOLZ reflections. Hence, ICMS method allows to use a larger slice thickness than the CMS method and reduces the calculation time. (C) 2012 Elsevier B.V. All rights reserved. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000308079200011 | Publication Date | 2012-01-14 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 6 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2012 IF: 2.470 | |||
| Call Number | UA @ lucian @ c:irua:101902 | Serial | 1567 | ||
| Permanent link to this record | |||||
| Author | van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. | ||||
| Title | Correction of non-linear thickness effects in HAADF STEM electron tomography | Type | A1 Journal article | ||
| Year | 2012 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
116 | Issue | Pages | 8-12 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In materials science, high angle annular dark field scanning transmission electron microscopy is often used for tomography at the nanometer scale. In this work, it is shown that a thickness dependent, non-linear damping of the recorded intensities occurs. This results in an underestimated intensity in the interior of reconstructions of homogeneous particles, which is known as the cupping artifact. In this paper, this non-linear effect is demonstrated in experimental images taken under common conditions and is reproduced with a numerical simulation. Furthermore, an analytical derivation shows that these non-linearities can be inverted if the imaging is done quantitatively, thus preventing cupping in the reconstruction. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000304473700002 | Publication Date | 2012-03-09 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 67 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2012 IF: 2.470 | ||
| Call Number | UA @ lucian @ c:irua:96558 | Serial | 518 | ||
| Permanent link to this record | |||||
| Author | Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. | ||||
| Title | Direct structure inversion from exit waves : part 2 : a practical example | Type | A1 Journal article | ||
| Year | 2012 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
116 | Issue | Pages | 77-85 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | This paper is the second part of a two-part paper on direct structure inversion from exit waves. In the first part, a method has been proposed to quantitatively determine structure parameters with atomic resolution such as atom column positions, surface profile and the number of atoms in the atom columns. In this part, the theory will be demonstrated by means of a Au[110] exit wave reconstructed from a set of focal-series images. The procedures to analyze the experimentally reconstructed exit wave in terms of quantitative structure information are described in detail. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000304473700011 | Publication Date | 2012-03-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 8 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2012 IF: 2.470 | ||
| Call Number | UA @ lucian @ c:irua:96660 | Serial | 724 | ||
| Permanent link to this record | |||||
| Author | Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. | ||||
| Title | Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? | Type | A1 Journal article | ||
| Year | 2012 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
114 | Issue | Pages | 20-30 | |
| Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In this paper, we investigate to what extent high resolution transmission electron microscopy images can be used to measure the mass, in terms of thickness, and surface profile, corresponding to the defocus offset, of an object at the atomic scale. Therefore, we derive an expression for the statistical precision with which these object parameters can be estimated in a quantitative analysis. Evaluating this expression as a function of the microscope settings allows us to derive the optimal microscope design. Acquiring three-dimensional structure information in terms of thickness turns out to be much more difficult than obtaining two-dimensional information on the projected atom column positions. The attainable precision is found to be more strongly affected by processes influencing the image contrast, such as phonon scattering, than by the specific choice of microscope settings. For a realistic incident electron dose, it is expected that atom columns can be distinguished with single atom sensitivity up to a thickness of the order of the extinction distance. A comparable thickness limit is determined to measure surface steps of one atom. An increase of the electron dose shifts the limiting thickness upward due to an increase in the signal-to-noise ratio. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000301954300003 | Publication Date | 2012-01-06 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 5 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2012 IF: 2.470 | ||
| Call Number | UA @ lucian @ c:irua:94116 | Serial | 2692 | ||
| Permanent link to this record | |||||
| Author | Xu, Q.; Zandbergen, H.W.; van Dyck, D. | ||||
| Title | Applying an information transmission approach to extract valence electron information from reconstructed exit waves | Type | A1 Journal article | ||
| Year | 2011 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
111 | Issue | 7 | Pages | 912-919 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The knowledge of the valence electron distribution is essential for understanding the properties of materials. However this information is difficult to obtain from HREM images because it is easily obscured by the large scattering contribution of core electrons and by the strong dynamical scattering process. In order to develop a sensitive method to extract the information of valence electrons, we have used an information transmission approach to describe the electron interaction with the object. The scattered electron wave is decomposed in a set of basic functions, which are the eigen functions of the Hamiltonian of the projected electrostatic object potential. Each basic function behaves as a communication channel that transfers the information of the object with its own transmission characteristic. By properly combining the components of the different channels, it is possible to design a scheme to extract the information of valence electron distribution from a series of exit waves. The method is described theoretically and demonstrated by means of computer simulations. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000300461000024 | Publication Date | 2011-02-02 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 1 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2011 IF: 2.471 | ||
| Call Number | UA @ lucian @ c:irua:93623 | Serial | 146 | ||
| Permanent link to this record | |||||
| Author | de Backer, A.; Van Aert, S.; van Dyck, D. | ||||
| Title | High precision measurements of atom column positions using model-based exit wave reconstruction | Type | A1 Journal article | ||
| Year | 2011 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
111 | Issue | 9/10 | Pages | 1475-1482 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In this paper, it has been investigated how to measure atom column positions as accurately and precisely as possible using a focal series of images. In theory, it is expected that the precision would considerably improve using a maximum likelihood estimator based on the full series of focal images. As such, the theoretical lower bound on the variances of the unknown atom column positions can be attained. However, this approach is numerically demanding. Therefore, maximum likelihood estimation has been compared with the results obtained by fitting a model to a reconstructed exit wave rather than to the full series of focal images. Hence, a real space model-based exit wave reconstruction technique based on the channelling theory is introduced. Simulations show that the reconstructed complex exit wave contains the same amount of information concerning the atom column positions as the full series of focal images. Only for thin samples, which act as weak phase objects, this information can be retrieved from the phase of the reconstructed complex exit wave. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000300461200004 | Publication Date | 2011-07-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 8 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2011 IF: 2.471 | ||
| Call Number | UA @ lucian @ c:irua:91879 | Serial | 1438 | ||
| Permanent link to this record | |||||
| Author | Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. | ||||
| Title | A method to determine the local surface profile from reconstructed exit waves | Type | A1 Journal article | ||
| Year | 2011 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
111 | Issue | 8 | Pages | 1352-1359 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Reconstructed exit waves are useful to quantify unknown structure parameters such as the position and composition of the atom columns at atomic scale. Existing techniques provide a complex wave in a flat plane which is close to the plane where the electrons leave the atom columns. However, due to local deviation in the flatness of the exit surface, there will be an offset between the plane of reconstruction and the actual exit of a specific atom column. Using the channelling theory, it has been shown that this defocus offset can in principle be determined atom column-by-atom column. As such, the surface roughness could be quantified at atomic scale. However, the outcome strongly depends on the initial plane of reconstruction especially in a crystalline structure. If this plane is further away from the true exit, the waves of the atom columns become delocalized and interfere mutually which strongly complicates the interpretation of the exit wave in terms of the local structure. In this paper, we will study the delocalization with defocus using the channelling theory in a more systematic way. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000300461100049 | Publication Date | 2011-05-03 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 3 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2011 IF: 2.471 | ||
| Call Number | UA @ lucian @ c:irua:88941 | Serial | 2017 | ||
| Permanent link to this record | |||||
| Author | van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. | ||||
| Title | Throughput maximization of particle radius measurements by balancing size and current of the electron probe | Type | A1 Journal article | ||
| Year | 2011 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
111 | Issue | 7 | Pages | 940-947 |
| Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In thispaperweinvestigatewhichprobesizemaximizesthethroughputwhenmeasuringtheradiusof nanoparticlesinhighangleannulardarkfieldscanningtransmissionelectronmicroscopy(HAADFSTEM). The sizeandthecorrespondingcurrentoftheelectronprobedeterminetheprecisionoftheestimateofa particlesradius.Maximizingthroughputmeansthatamaximumnumberofparticlesshouldbeimaged withinagiventimeframe,sothataprespecifiedprecisionisattained.WeshowthatBayesianstatistical experimentaldesignisaveryusefulapproachtodeterminetheoptimalprobesizeusingacertainamount of priorknowledgeaboutthesample.Thedependenceoftheoptimalprobesizeonthedetectorgeometry and thediameter,variabilityandatomicnumberoftheparticlesisinvestigated.Anexpressionforthe optimalprobesizeintheabsenceofanykindofpriorknowledgeaboutthespecimenisderivedaswell. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000300461000026 | Publication Date | 2010-11-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 7 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2011 IF: 2.471 | |||
| Call Number | UA @ lucian @ c:irua:89657 | Serial | 3659 | ||
| Permanent link to this record | |||||
| Author | Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. | ||||
| Title | Direct structure inversion from exit waves: part 1: theory and simulations | Type | A1 Journal article | ||
| Year | 2010 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
110 | Issue | 5 | Pages | 527-534 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In order to interpret the amplitude and phase of the exit wave in terms of mass and position of the atoms, one has to invert the dynamic scattering of the electrons in the object so as to obtain a starting structure which can then be used as a seed for further quantitative structure refinement. This is especially challenging in case of a zone axis condition when the interaction of the electrons with the atom column is very strong. Based on the channelling theory we will show that the channelling map not only yields a circle on the Argand plot but also a circular defocus curve for every column. The former gives the number of atoms in each column, while the latter provides the defocus value for each column, which reveals the surface roughness at the exit plane with single atom sensitivity. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000279065700019 | Publication Date | 2009-12-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 25 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2010 IF: 2.063 | ||
| Call Number | UA @ lucian @ c:irua:83691 | Serial | 723 | ||
| Permanent link to this record | |||||
| Author | Van Aert, S.; Chen, J.H.; van Dyck, D. | ||||
| Title | Linear versus non-linear structural information limit in high-resolution transmission electron microscopy | Type | A1 Journal article | ||
| Year | 2010 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
110 | Issue | 11 | Pages | 1404-1410 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | A widely used performance criterion in high-resolution transmission electron microscopy (HRTEM) is the information limit. It corresponds to the inverse of the maximum spatial object frequency that is linearly transmitted with sufficient intensity from the exit plane of the object to the image plane and is limited due to partial temporal coherence. In practice, the information limit is often measured from a diffractogram or from Young's fringes assuming a weak phase object scattering beyond the inverse of the information limit. However, for an aberration corrected electron microscope, with an information limit in the sub-angstrom range, weak phase objects are no longer applicable since they do not scatter sufficiently in this range. Therefore, one relies on more strongly scattering objects such as crystals of heavy atoms observed along a low index zone axis. In that case, dynamical scattering becomes important such that the non-linear and linear interaction may be equally important. The non-linear interaction may then set the experimental cut-off frequency observed in a diffractogram. The goal of this paper is to quantify both the linear and the non-linear information transfer in terms of closed form analytical expressions. Whereas the cut-off frequency set by the linear transfer can be directly related with the attainable resolution, information from the non-linear transfer can only be extracted using quantitative, model-based methods. In contrast to the historic definition of the information limit depending on microscope parameters only, the expressions derived in this paper explicitly incorporate their dependence on the structure parameters as well. In order to emphasize this dependence and to distinguish from the usual information limit, the expressions derived for the inverse cut-off frequencies will be referred to as the linear and non-linear structural information limit. The present findings confirm the well-known result that partial temporal coherence has different effects on the transfer of the linear and non-linear terms, such that the non-linear imaging contributions are damped less than the linear imaging contributions at high spatial frequencies. This will be important when coherent aberrations such as spherical aberration and defocus are reduced. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000282562100008 | Publication Date | 2010-07-15 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 6 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2010 IF: 2.063 | ||
| Call Number | UA @ lucian @ c:irua:83689 | Serial | 1821 | ||
| Permanent link to this record | |||||
| Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
| Title | A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy | Type | A1 Journal article | ||
| Year | 2010 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
110 | Issue | 5 | Pages | 548-554 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Depth sectioning in high angular annular dark field scanning transmission electron microscopy is considered a candidate for three-dimensional characterization on the atomic scale. However at present the depth resolution is still far from the atomic level, due to strong limitations in the opening angle of the beam. In this paper we introduce a new, parameter based tomographic reconstruction algorithm that allows to make maximal use of the prior knowledge about the constituent atom types and the microscope settings, so as to retrieve the atomic positions and push the resolution to the atomic level in all three dimensions. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000279065700022 | Publication Date | 2009-09-21 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 16 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 2.843; 2010 IF: 2.063 | ||
| Call Number | UA @ lucian @ c:irua:83690 | Serial | 2104 | ||
| Permanent link to this record | |||||
| Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
| Title | A model based atomic resolution tomographic algorithm | Type | A1 Journal article | ||
| Year | 2009 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
109 | Issue | 12 | Pages | 1485-1490 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Tomography with high angular annular dark field scanning transmission electron microscopy at atomic resolution can be greatly improved if one is able to take advantage of prior knowledge. In this paper we present a reconstruction technique that explicitly takes into account the microscope parameters and the atomic nature of the projected object. This results in a more accurate estimate of the atomic positions and in a good resistance to noise. The reconstruction is a maximum likelihood estimator of the object. Moreover, the limits to the precision have been explored, allowing for a prediction of the amount of expected noise in the reconstruction for a certain experimental setup. We believe that the proposed reconstruction technique can be generalized to other tomographic experiments. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000271840200010 | Publication Date | 2009-08-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 17 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2009 IF: 2.067 | |||
| Call Number | UA @ lucian @ c:irua:78588 | Serial | 2097 | ||
| Permanent link to this record | |||||
| Author | Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. | ||||
| Title | Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy | Type | A1 Journal article | ||
| Year | 2009 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
109 | Issue | 10 | Pages | 1236-1244 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this theory, a model is required describing the image contrast of the HAADF STEM images. Therefore, a simple, effective incoherent model has been assumed which takes the probe intensity profile into account. The scattered intensities can then be estimated by fitting this model to an experimental HAADF STEM image. These estimates are used as a performance measure to distinguish between different atomic column types and to identify the nature of unknown columns with good accuracy and precision using statistical hypothesis testing. The reliability of the method is supported by means of simulated HAADF STEM images as well as a combination of experimental images and electron energy-loss spectra. It is experimentally shown that statistically meaningful information on the composition of individual columns can be obtained even if the difference in averaged atomic number Z is only 3. Using this method, quantitative mapping at atomic resolution using HAADF STEM images only has become possible without the need of simultaneously recorded electron energy loss spectra. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000270015200004 | Publication Date | 2009-05-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 166 | Open Access | |
| Notes | Fwo; Esteem 026019 | Approved | Most recent IF: 2.843; 2009 IF: 2.067 | ||
| Call Number | UA @ lucian @ c:irua:78585UA @ admin @ c:irua:78585 | Serial | 2748 | ||
| Permanent link to this record | |||||
| Author | Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. | ||||
| Title | Measurement of specimen thickness by phase change determination in TEM | Type | A1 Journal article | ||
| Year | 2008 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
108 | Issue | 12 | Pages | 1616-1622 |
| Keywords | A1 Journal article; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | A non-destructive method for measuring the thickness of thin amorphous films composed of light elements has been developed. The method employs the statistics of the phase of the electron exit wave function. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000260808300016 | Publication Date | 2008-06-23 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 2 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2008 IF: 2.629 | |||
| Call Number | UA @ lucian @ c:irua:75643 | Serial | 1961 | ||
| Permanent link to this record | |||||
| Author | Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. | ||||
| Title | Electron channelling based crystallography | Type | A1 Journal article | ||
| Year | 2007 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
107 | Issue | 6/7 | Pages | 551-558 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000245341300015 | Publication Date | 2006-12-13 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 32 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2007 IF: 1.996 | |||
| Call Number | UA @ lucian @ c:irua:64286 | Serial | 913 | ||
| Permanent link to this record | |||||
| Author | Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. | ||||
| Title | Inelastic electron holography as a variant of the Feynman thought experiment | Type | A1 Journal article | ||
| Year | 2007 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
107 | Issue | 8 | Pages | 559-567 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Using a combination of electron holography and energy filtering, interference fringes produced after inelastic interaction of electrons with hydrogen molecules are examined. Surprisingly, the coherence of inelastic scattering increases when moving from the surface of a hydrogen-containing bubble to the vacuum. This phenomenon can be understood in terms of the Feynman two-slit thought experiment with a variable ambiguity of the which-way registration. (C) 2006 Elsevier B.V. All rights reserved. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000246937000001 | Publication Date | 2006-12-16 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 13 | Open Access | |
| Notes | Fwo G.0147.06 | Approved | Most recent IF: 2.843; 2007 IF: 1.996 | ||
| Call Number | UA @ lucian @ c:irua:103588UA @ admin @ c:irua:103588 | Serial | 1605 | ||
| Permanent link to this record | |||||
| Author | Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. | ||||
| Title | An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images | Type | A1 Journal article | ||
| Year | 2006 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
106 | Issue | 10 | Pages | 933-940 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab | ||||
| Abstract | We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000240397200006 | Publication Date | 2006-05-10 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 18 | Open Access | |
| Notes | Fwo; Fwo-V | Approved | Most recent IF: 2.843; 2006 IF: 1.706 | ||
| Call Number | UA @ lucian @ c:irua:87604UA @ admin @ c:irua:87604 | Serial | 876 | ||
| Permanent link to this record | |||||
| Author | Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. | ||||
| Title | Experiments on inelastic electron holography | Type | A1 Journal article | ||
| Year | 2006 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
106 | Issue | 11-12 | Pages | 1012-1018 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Using the combination of an electron biprism and an energy filter, the coherence distribution in an inelastically scattered wave-field is measured. It is found that the degree of coherence decreases rapidly with increasing distance between two superimposed points in the object, and with increasing energy-loss. In a Si sample, coherence of plasmon scattering increases in vacuum with the distance from the edge of the sample. (c) 2006 Published by Elsevier B.V. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000241592900009 | Publication Date | 2006-07-07 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 28 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2006 IF: 1.706 | |||
| Call Number | UA @ lucian @ c:irua:61380UA @ admin @ c:irua:61380 | Serial | 1147 | ||
| Permanent link to this record | |||||
| Author | den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. | ||||
| Title | Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework | Type | A1 Journal article | ||
| Year | 2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
104 | Issue | 2 | Pages | 83-106 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000230526400001 | Publication Date | 2005-04-09 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 70 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | |||
| Call Number | UA @ lucian @ c:irua:57229 | Serial | 1959 | ||
| Permanent link to this record | |||||
| Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. | ||||
| Title | Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example | Type | A1 Journal article | ||
| Year | 2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume |
104 | Issue | 2 | Pages | 107-125 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000230526400002 | Publication Date | 2005-04-08 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 37 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | |||
| Call Number | UA @ lucian @ c:irua:57131 | Serial | 1960 | ||
| Permanent link to this record | |||||